Substrate carrier

- APPLIED MATERIALS, INC.
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Description

FIG. 1 is a perspective view of a substrate carrier, according to one embodiment of the novel design.

FIG. 2 is a top plan view thereof.

FIG. 3 is a bottom plan view thereof.

FIG. 4 is a front elevation view thereof.

FIG. 5 is a back elevation view thereof.

FIG. 6 is a left side elevation view thereof.

FIG. 7 is a right side elevation view thereof.

FIG. 8 is a perspective view of a substrate carrier, according to another embodiment of the novel design.

FIG. 9 is a top plan view thereof. The broken lines, the areas within them, and the areas surrounded by both broken lines and solid lines depict portions of the substrate carrier that form no part of the claimed design.

FIG. 10 is a bottom plan view thereof. The bottom surface and outer boundaries of the substrate carrier form no part of the claim.

FIG. 11 is a front elevation view thereof.

FIG. 12 is a back elevation view thereof.

FIG. 13 is a left side elevation view thereof; and,

FIG. 14 is a right side elevation view thereof.

Claims

The ornamental design for a substrate carrier, as shown and described.

Referenced Cited
U.S. Patent Documents
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D697778 January 21, 2014 Bozic
D751999 March 22, 2016 Sharma et al.
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D813635 March 27, 2018 Brutscher
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D877101 March 3, 2020 Johanson
20160133782 May 12, 2016 Thirunavukarasu
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Other references
  • Silicon wafers, substrates and specimen supports. Online, published date unknown. Retrieved on Apr. 24, 2020 from URL: https://www.labtech-em.com/em/silicon-wafers-substrates-and-specimen-supports.
  • Search Report for Taiwan Design Application No. 106304361, dated Jul. 29, 2020.
Patent History
Patent number: D904640
Type: Grant
Filed: Jan 21, 2019
Date of Patent: Dec 8, 2020
Assignee: APPLIED MATERIALS, INC. (Santa Clara, CA)
Inventors: Fred Eric Ruhland (Santa Clara, CA), Sumit S. Patankar (Fremont, CA), Vijay D. Parkhe (San Jose, CA), Daniel Lee Diehl (Chiba), Mingwei Zhu (Sunnyvale, CA), Hiroyuki Takahama (Chiba-Ken), Randy D. Schmieding (Saratoga, CA)
Primary Examiner: Susan Bennett Hattan
Assistant Examiner: Omeed Agilee
Application Number: 29/677,482
Classifications