Abstract: An apparatus is provided. A comparison circuit is configured to receive an analog signal. A reference circuit is coupled to the comparison circuit and is configured to provide a plurality of reference signals to the comparison circuit. A conversion circuit is coupled to the comparison circuit and is configured to detect a change in the output of the comparison circuit. A time-to-digital converter (TDC) is coupled to the comparison circuit. A timer is coupled to the comparison circuit. A rate control circuit is coupled to the conversion circuit. An output circuit is coupled to the rate control circuit and the TDC, where the output circuit is configured to output at least one of a synchronous digital representation of the analog signal and an asynchronous digital representation of the analog signal.

Abstract: Measures are provided for performing direct radio-frequency to digital conversion. A radio-frequency input signal is compared with a plurality of reference voltages to generate a plurality of comparison signals, each comparison signal corresponding to one of the plurality of reference voltages. One or more of the plurality of generated comparison signals are first filtered to generate a first filtered signal. One or more of the plurality of generated comparison signals are second filtered to generate a second filtered signal. A digital output signal is generated at least on the basis of the first filtered signal and the second filtered signal.

Abstract: An analog to digital converter in accordance with the inventive concept may include a reference voltage generation circuit outputting first and second reference voltages; a decompression part decompressing amplitude of an analog input signal and the first and second reference voltages; a flash ADC converting the decompressed analog input signal into a first digital signal with reference to the decompressed first and second reference voltages; and a successive approximation ADC converting the analog input signal into a second digital signal according to a successive approximation operation with reference to the first digital signal and the first and second reference voltages.

Abstract: An apparatus for acquiring an i-bit digital code by a first stage AD conversion and a j-bit digital code by a second stage AD conversion includes a comparing unit which compares a reference signal and an analog signal in the first stage AD conversion; and an amplifying unit for outputting an amplified residual signal acquired by amplifying a difference between the analog signal and an analog signal corresponding to the i-bit digital code. The comparing unit compares the amplified residual signal and the reference signal in the second stage AD conversion.

Abstract: An apparatus and method for regulating analogue-to-digital converters. First and second input signals are received at controlled oscillator circuitry which generates respective first and second pulse streams with pulse rates based on the relevant input signal. Difference circuitry determines the difference in number of pulses of the first and second pulse streams and outputs a first digital signal. Circuitry also determines a signal independent value based on the number of pulses of the first and/or second pulse streams. In one embodiment this value is the sum or average of the number of pulses of the first and second pulse streams. This value can be used to calibrate for any variation in transfer characteristic of the oscillator circuitry. In one embodiment this value is compared to a reference value and a regulation signal passed to control circuitry to regulate the operation of the oscillation circuitry.

Abstract: Systems, methods and computer program products for correcting polarity decision associated with a polarity comparator in an analog-to-digital converter are described. The polarity comparator may perform polarity decision to determine whether an analog signal is greater or smaller than zero. If the voltage difference is greater than zero, then the analog signal may be output to other comparators without polarity inversion. If the voltage difference is smaller than zero, then the signal polarity of the analog signal may be inverted before being output to other comparators. One or more redundant comparators also may be used to correct offsets of the polarity comparator to reduced errors associated with the polarity decision.

Abstract: A solid-state imaging device and a camera system are provided. The solid-state imaging device capable of performing an intermittent operation includes a pixel unit and a pixel signal readout unit for reading out a pixel signal from the pixel unit in units of a plurality of pixels for each column. The pixel signal readout circuit includes a plurality of comparators and a plurality of counters whose operations are controlled by outputs of the comparators. Each of the comparators includes an initializing switch for determining an operating point for each column at a start of row operation, and is configured so that an initialization signal to be applied to the initializing switch is controlled independently in parallel only a basic unit of the initialization signal used for a horizontal intermittent operation, and the initializing switch is held in an off-state at a start of non-operating row.

Abstract: An A/D conversion circuit and a solid-state imaging device are able to reduce current consumption, and two input terminals of a NAND element included in a latch circuit receive a corresponding one of a plurality of clock signals and an enable signal. The enable signal is not input to the NAND element before an end timing of A/D conversion, and is input to the NAND element at the end timing of the A/D conversion and at a timing at which latching is performed. The latch circuit latches no clock signal when the enable signal is not input.

Abstract: A folded reference voltage flash analog-to-digital (ADC) converter and a method thereof are provided. The flash ADC of the present invention determines the most significant bit (MSB) of an analog input signal, varies a reference voltage input to a plurality of comparators in accordance with the MSB determination result, and determines the remaining bits. Accordingly, input capacitance can be reduced while maintaining the size and power consumption of the ADC.

Abstract: In accordance with an embodiment, a method includes determining an amplitude of an input signal provided by a capacitive signal source, compressing the input signal in an analog domain to form a compressed analog signal based on the determined amplitude, converting the compressed analog signal to a compressed digital signal, and decompressing the digital signal in a digital domain to form a decompressed digital signal. In an embodiment, compressing the analog signal includes adjusting a first gain of an amplifier coupled to the capacitive signal source, and decompressing the digital signal comprises adjusting a second gain of a digital processing block.

Abstract: This document discusses, among other things, apparatus and methods including an analog-to-digital controller (ADC) configured to receive an enable signal and to provide an ADC output signal to control logic, wherein the control logic is configured to provide a control voltage to a control input of a switch. In an example, the control voltage includes the ADC output signal when the ADC output signal is below a first threshold or above a second threshold. In certain examples, the control logic is configured to transition the control voltage from the first threshold to the second threshold when the ADC output signal is between the first and second thresholds.

Abstract: A signal sensing circuit converts a received current input into a voltage output and provides the voltage output to an analog-to-digital converter (ADC) to generate a digital output signal. The voltage output is associated with a circuit having a first reference impedance, and a reference voltage of the ADC is associated with a circuit having a second reference impedance, wherein the circuit having the first reference impedance and the circuit having the second reference impedance are formed by the same material, so that the ratio between the changes in the current input and the changes in the value of the digital output signal is a constant.

Abstract: An AD (analog-to-digital) conversion circuit includes a capacitor array formed of a plurality of capacitors; a sample hold circuit configured to apply an analog input voltage input through an input terminal to the capacitor array so that the analog input voltage is accumulated in the capacitor array until a sampling time set is elapsed; a comparator circuit configured to sequentially retrieve the analog input voltage accumulated in each of the capacitors of the capacitor array, and to compare the analog input voltage with a reference voltage defined in advance to generate a digital signal; and a sampling time adjusting circuit configured to measure a period of time when a voltage on an input side of the sample hold circuit reaches a threshold value defined in advance relative to the reference voltage, and to set a time determined according to the period of time as the sampling time.

Abstract: The invention includes a successive approximation register, a digital-to-analog converter, a comparator and a control stage. The control stage initially sets the successive approximation register to a first digital value. The digital-to-analog converter converts the digital value stored in the successive approximation register to an analog value. The comparator compares the converted digital value with an analog input value. The control stage restricts subsequent analog-to-digital conversion for the analog input value to a search interval above or below the first digital value depending on whether the analog input value is greater or lower than the converted analog value of the first digital value.

Abstract: Examples are provided for converting an analog signal to a digital output signal using serial-ripple analog-to-digital conversion (ADC). An ADC circuit may include conversion stages coupled in series. Each conversion stage may generate a bit for the digital output signal. A data latch may receive bits for the digital output signal from the conversion stages and to provide the digital output signal based on the bits. A conversion stage may include a comparator circuit and a multiplexer circuit. The comparator circuit may compare a sampled input signal with a reference signal and to generate the associated bit of the digital output signal based on a result of the comparison. The multiplexer circuit may provide an associated reference signal to a comparator circuit of a next conversion stage, where the next conversion stage is subsequent to the conversion stage.

Abstract: Increase of power consumption is reduced, and the operational speed is improved. A comparator includes a comparing section which outputs a result of comparison between a first voltage and a second voltage which constitute an input differential signal, a first positive feedback section which operates in synchronism with a first clock signal, amplifies the result from the comparing section, and outputs the amplified result to an output node pair, and a second positive feedback section which operates in synchronism with a second clock signal, and provides positive feedback to the output node pair.

Abstract: A method and system include a converter such as an analog-to-digital converter (“ADC”) and a controller. The converter is configured to receive a sensor signal, indicative of a physical measured quantity, and generate an output signal based on the sensor signal and the voltage reference. The converter is further configured to alternately receive a calibration voltage in lieu of the sensor signal and generate the output signal based on the calibration voltage and the voltage reference. The controller is configured to compare the output signal based on the calibration voltage and the voltage reference with an expected value of the output signal based on the calibration voltage and an assumed value of the voltage reference to detect variation of the voltage reference, and to compensate the output signal based on the sensor signal and the voltage reference as a function of the detected variation of the voltage reference.

Abstract: A system for minimizing variation of a voltage reference includes a voltage reference generator and a power converter. The voltage reference generator is configured to generate a voltage reference from a supply voltage. The power converter, such as a flyback converter, is configured to supply an adjustable supply voltage to the voltage reference generator. The voltage reference generator generates the voltage reference from the adjustable supply voltage.

Abstract: A laser optical touch control module includes a light emitting part with a laser light source and a light receiving part with a position sensor. A laser beam is emitted from the laser light source and reflected by a wide angle optical element. Thus a light fan of the reflected light is larger than 90 degrees to form a wide angle linear light beam. The position of a touch control widget is obtained by a sensor of the light receiving part that detects the linear light beam blocked and reflected by the touch control widget. An analog-to-digital conversion system includes a variable reference level generator that calculates to generate a variable reference level according to different variances. Then the sensor output data is converted into a digital signal based on the reference voltage level by a digital comparator and the digital signal is output to a processor.

Abstract: A time detection circuit may include: a delay unit configured to have a plurality of delay units, each of which delays and outputs an input signal, and start an operation at a first timing relating to an input of a first pulse; a latch unit configured to latch logic states of the plurality of delay units; a count unit configured to perform a count operation based on a clock output from one of the plurality of delay units; a count latch unit configured to latch a state of the count unit; and a latch control unit configured to enable the latch unit at a second timing relating to an input of a second pulse and cause the latch unit and the count latch unit to execute a latch at a third timing at which a predetermined time has elapsed from the second timing.

Abstract: A pipelined ADC includes a first, second, and third pairs of comparators. The first pair of comparators compare an input voltage to a first positive reference voltage and to a first negative reference voltage. The second pair of comparators compare the input voltage to a second positive reference voltage and to a second negative reference voltage. Each comparator of the first and second pairs of comparators outputs a digital signal to an encoder. A third pair of comparators compares the input voltage to a third positive reference voltage and to a third negative reference voltage, and a comparator compares the input voltage to ground. The comparator and each comparator of the third pair of comparators is configured to output respective digital signals to an encoder. A multiplying digital-to-analog converter outputs a voltage based on the input voltage, an output from the encoder, and an output of the random number generator.

Abstract: An AD conversion circuit includes a reference signal generation unit, which generates a reference signal, a comparison unit, which ends a comparison process at a timing at which the reference signal has satisfied a predetermined condition with respect to the analog signal, a first path in which a signal is transferred through each of n delay units, a clock signal generation unit, which outputs a lower-order phase signal, a latch unit, which latches the lower-order phase signal, a higher-order count unit including a first counter circuit, which acquires a higher-order count value by performing a count operation using a signal output from any one of the delay units, a calculation unit, which generates a lower-order count signal, and a lower-order count unit, which acquires a lower-order count value by performing the count operation using the lower-order count signal.

Abstract: The present invention provides an integration and analog to digital conversion circuit sharing common capacitors. The circuit comprises a first capacitor array module, a second capacitor module, an integration circuit, an analog to digital conversion (ADC) logic. The first capacitor array module has a plurality of capacitors. The second capacitor array module has a plurality of capacitors. The integration circuit is configured to integrate an analog signal by said first or said second capacitor array module. The ADC logic is configured to convert the output of said first or said second capacitor array module to a digital signal. The ADC logic performs conversion by said first capacitor array module while said integration circuit performs integration by said second capacitor array module, and said ADC logic performs conversion by said second capacitor array module while said integration circuit performs integration by said first capacitor array module.

Abstract: The present invention provides an analog-to-digital converter, which comprises an integration circuit, a threshold signal generating circuit, a main comparison circuit, a sub comparison circuit, a counter, and a decoder. The integration circuit integrates an input signal and produces an integration signal. The threshold signal generating circuit generates a main threshold signal and a plurality of sub threshold signals. The main comparison circuit produces a plurality of main comparison signals according the integration signal and the main threshold signal. The sub comparison circuit produces a plurality of sub comparison signals according to the integration signal and the plurality of sub threshold signals. The counter counts the plurality of main comparison signals and produces a first counting signal. The decoder decodes the plurality of sub comparison signals and produces a second count signal. The first count signal and the second count signal are used for producing a digital signal.

Abstract: The present invention provides an integration and analog to digital conversion circuit sharing common capacitors. The circuit comprises a capacitor array module, an integration circuit, and an analog to digital conversion (ADC) logic. The capacitor array module has a plurality of capacitors. The integration circuit is configured to integrate an analog signal by the capacitor array module. The ADC logic is configured to convert the output of the capacitor array module to a digital signal.

Abstract: An analog-to-digital converter (ADC) generates an output digital value equivalent to the difference between two analog signal values. The ADC 30 receives a first analog signal level, a second analog signal level and a ramp signal. A counter 32 is operable to count in a single direction. A control stage is arranged to enable the counter 32 based on a comparison 19 of the ramp signal with the first analog signal and the second analog signal. A digital value accumulated by the counter during a period when it is enabled forms the output. The ADC can perform the conversion during a single cycle of the ramp signal. The counter 32 can be loaded with a starting digital value representing an exposure level accumulated during a previous exposure period. Techniques are described for reducing the conversion time.

Abstract: An analog-to-digital converter including a comparator, a control module, a voltage adjusting module, and an evaluating module is provided. The comparator compares an analog input voltage with a feedback voltage and generates a comparison result. Based on the comparison result, the control module generates a control signal. The voltage adjusting module increases or decreases the feedback voltage toward the analog input voltage according to the control signal. The voltage increase amount and decrease amount provided by the voltage adjusting module are corresponding to a first digital value and a second digital value, respectively. The evaluating module generates the first digital value and the second digital value based on the control signal. According to the first digital value and the second digital value, a digital signal corresponding to the analog input voltage is generated.

Abstract: An electronic apparatus, control method thereof, remote control apparatus that controls the electronic apparatus, and control method thereof. The remote control apparatus includes a communication unit which communicates with the electronic apparatus; a user input unit which receives a user button selection indicating an input button; a sensing unit which senses movement of the remote control apparatus; and a control unit which controls the communication unit to transmit information about the user button selection to perform a function corresponding to the input button if the remote control apparatus is in a button input mode, and to transmit information about the movement of the remote control apparatus to the electronic apparatus to control the electronic apparatus by the movement if the remote control apparatus is in a motion recognition mode. Accordingly, controlling a game or a multimedia content is easier, and the user is provided with a new and interesting experience.

Abstract: An analog-to-digital converter includes a comparator configured to receive a first input signal and a second input signal, in which at least one of the input signals is received between two transistors, each of the transistors being in common-gate configuration. A method for comparing input signals performed by a comparator circuit includes: receiving a first input signal between a drain terminal of a first transistor of the comparator circuit and a source terminal of a second transistor of the comparator circuit; receiving a second input signal; and outputting a value based on a comparison of the first input signal and the second input signal.

Abstract: According to an embodiment, an analog-to-digital converter includes a voltage generating unit, and a plurality of comparators. The voltage generating unit is configured to divide a reference voltage by a plurality of variable resistors to generate a plurality of comparative voltages. Each of the plurality of comparator is configured to compare any one of the plurality of comparative voltages with an analog input voltage and output a digital signal based on a result of a comparison between the comparative voltage and the analog input voltage. Each of the plurality of variable resistors includes a plurality of variable resistive elements that are connected in series, and each of the plurality of variable resistive elements has a resistance value that is variably set according to an external signal.

Abstract: Disclosed is an analog-digital converter which includes a pre-amplifier configured to output a comparison result between a sampled analog input signal and a reference signal and to control a power supply operation in response to a power control signal; a digital signal processor configured to generate a digital signal based on the comparison result; a power controller configured to generate an amplifier operation clock signal for controlling the pre-amplifier; and a counter configured to count the number of falling edges of the amplifier operation clock signal and to detect a power interruption point of time of the pre-amplifier according to the counted falling edge number. The power controller generates the power control signal for interrupting a power to be supplied to the pre-amplifier when the power interruption point of time of the pre-amplifier is detected.

Abstract: The present inventive concept relates to an analog-digital converter. The analog-digital converter includes a clock generating unit generating a clock signal; a clock delay adjusting unit outputting one of a first clock signal to a Kth clock signal according to a control signal; a capacitive digital-analog converting unit outputting a difference between the analog signal and a reference signal; a comparison unit judging whether an output of the capacitive digital-analog converting unit is 0, a positive number, or a negative number, in response to an output of the clock delay adjusting unit; and an SAR logic unit transferring an output of the comparison unit to the capacitive digital-analog converting unit in response to an output of the clock delay adjusting unit and performing a successive approximation operation to output the N-bit digital signal.

Abstract: First and second resistor series divide a predetermined voltage range to generate first reference voltages and second reference voltages, respectively. First and second switch controlling circuits select respective ones of the first reference voltages and the second reference voltages. A comparing unit generates a logical signal representing a logical value by comparing a combined transistor current based on the selected first and second reference voltages with a transistor current based on an input signal. The first switch controlling circuit specifies two adjacent first reference voltages where the logical value is inverted by sequentially selecting the first reference voltages, and determines to select one of the adjacent reference voltages. Te second switch controlling circuit specifies two adjacent second reference voltages where the logical value is inverted by sequentially selecting the second reference voltages, and determines to select one of the adjacent reference voltages.

Abstract: An analog to digital converter for operating at high speeds can be implemented with a micro-comparator/sampler, an encoder, and a selector. The micro-comparator includes an input from an antenna of a receiver/transceiver system; a transistor pair; reset transistor; cascaded inverters; an inverter circuit; a buffer; and a D flip flop circuit. Depending on the number of micro-comparator/samplers placed in parallel, a number of bits can be generated. For example, 15 bits from 15 different micro-comparator/samplers can be inserted into a 15 to 4 bit encoder to generate 4 bits.

Abstract: Successive approximation Analog-to-digital converters (ADCs) and related methods are disclosed. A successive approximation ADC includes a comparator with a comparator output and inputs coupled to a common model signal and a compare input. Control logic generates one or more control signals responsive to the comparator output. A capacitor array includes first sides of capacitors operably coupled to an array output. The capacitor arrays selectively couples each of second sides of the capacitors to an analog input signal and one or more input reference signals responsive to the one or more control signals. A voltage limiter is operably coupled between the array output and the compare input of the comparator and limits a voltage on the compare input to within a predefined range relative to the array output. The successive approximation ADC may also be configured differentially with a second comparator and a second voltage limiter.

Abstract: A solid-state imaging device having an analog-digital converter, and an analog-digital conversion method are described herein. An example of a solid-state imaging device includes a column processing section that includes a low-level bit latching section. The low-level bit latching section receives a comparator output from a comparator and a count output from a counter, and the low-level bit latching section latches a count value.

Abstract: A folded reference voltage flash analog-to-digital (ADC) converter and a method thereof are provided. The flash ADC of the present invention determines the most significant bit (MSB) of an analog input signal, varies a reference voltage input to a plurality of comparators in accordance with the MSB determination result, and determines the remaining bits. Accordingly, input capacitance can be reduced while maintaining the size and power consumption of the ADC.

Abstract: An approach to converting an analog value based on a partition of an input range produces probabilities that the input is found within each of the regions based, for example, on a noisy version of the input. In some examples, iterative and/or pipelined application of comparison circuitry is used to accumulate a set of analog representations of the output probabilities. The circuitry can be adapted or configured according to the characteristics of the degradation (e.g., according to the variance of an additive noise) and/or prior information about the distribution of the clean input (e.g., a distribution over a discrete set of exemplar values, uniformly distributed etc.).

Abstract: A singled-ended, successive approximation register analog-to-digital converter convert an analog input voltage to a digital representation comprising m upper order bits and a number of lower order bits. The SAR ADC comprises SAR logic, a resistive network, multiple switches, and first and second LSB capacitors. The switches also comprises two sets of switches coupled to the resistive network, each set of switches is configured to couple a selected tap to each of the first and second LSB capacitors. When determining the lower order bits, the SAR logic is configured to control the sets of switches to change the first and second taps from one cycle in which one of the lower order bits is determined to a next cycle in which the next of the lower order bits is determined so that the voltage of both taps changes by a decreasing amount with each succeeding bit being determined.

Abstract: A current providing system, for providing an output current, which comprises: a frequency detecting circuit, for receiving at least one input signal, and for detecting a frequency of the input signal; a frequency-controlled current providing circuit, for providing the output current according to the input signal frequency when the input signal frequency is in a first predetermined range; and a predetermined current providing circuit, for providing the output current with a first predetermined current value, when the input signal frequency is not in the first predetermined range.

Abstract: The configurations and adjusting method of a subrange analog-to-digital converter (ADC) are provided. The provided subrange ADC includes a X.5-bit flash ADC, a Y-bit SAR ADC and a (X+Y)-bit segmented capacitive digital-to-analog converter (DAC).

Abstract: An adaptive delay device that provides a delay to a signal based on circuit conditions such as temperature, supply voltage values and/or fabrication processes. The adaptive delay device may respond to circuit conditions by charging a capacitive device to a threshold voltage. A comparator may incorporate the adaptive delay device to provide adaptive timing for the comparator functions thereby attaining improved noise performance and/or reduce power consumption.

Abstract: In one embodiment, a comparator of a Flash analog-to-digital converter (ADC) is calibrated in the background by switching the comparator to a feedback loop, determining the comparator's current reference level, and adjusting the comparator's reference level to a target reference level by charging a reference capacitor coupled the comparator.

Abstract: A stage of pipeline analog to digital converter (ADC) includes a multiplying digital to analog converter (MDAC) and a sub-analog to digital converter (sub-ADC). The sub-ADC includes a comparator and a random offset controller. The comparator is coupled to compare a first analog signal received by the stage with a reference signal. The random offset controller is coupled to the comparator to apply a random offset to an input of the comparator to randomly distribute errors by the sub-ADC in a digital output of the pipeline ADC.

Abstract: An apparatus for acquiring an i-bit digital code by a first stage AD conversion and a j-bit digital code by a second stage AD conversion includes a comparing unit which compares a reference signal and an analog signal in the first stage AD conversion; and an amplifying unit for outputting an amplified residual signal acquired by amplifying a difference between the analog signal and an analog signal corresponding to the i-bit digital code. The comparing unit compares the amplified residual signal and the reference signal in the second stage AD conversion.

Abstract: Successive approximation Analog-to-digital converters (ADCs) and related methods are disclosed. A successive approximation ADC includes a comparator with a comparator output and inputs coupled to a common model signal and a compare input. Control logic generates one or more control signals responsive to the comparator output. A capacitor array includes first sides of capacitors operably coupled to an array output. The capacitor arrays selectively couples each of second sides of the capacitors to an analog input signal and one or more input reference signals responsive to the one or more control signals. A voltage limiter is operably coupled between the array output and the compare input of the comparator and limits a voltage on the compare input to within a predefined range relative to the array output. The successive approximation ADC may also be configured differentially with a second comparator and a second voltage limiter.

Abstract: Disclosed is at least one flash analog-to-digital converter embodiment having a linear voltage ladder, a set of comparators each of which is coupled to one or more operational amplifiers by a sampling switch. Each of the sampling switches samples the comparator output, using the parasitic capacitance of the operational amplifier to hold the voltage. The sampling switches may be single transistors. Some embodiments further include, for each comparator, multiple operational amplifiers each of which drives a binary latch via a gating switch. The gating switches operate in sequence to distribute sequential samples to different latches. At least some embodiments of the flash converter further include an automatic gain control (AGC) that has both differential input terminals and differential output terminals. In such embodiments the comparators compare the differential output of the AGC to a differential reference voltage, and may further provide the result as a differential signal.

Abstract: Aspects of the invention provide a continuous ramp generator design and its calibration for CMOS image sensors using single-ramp ADCs. An embodiment of the invention comprises controlling a coarse gain, integer gain, and fine gain of the analog-to-digital converter. Gain of the analog-to-digital converter may be calibrated by tuning the integer gain based on reference voltages converted to equivalent digital values.

Abstract: A quantized voltage feed-forward (QVFF) circuit and integrated circuits using this technique. The QVFF circuit includes a plurality of comparators in combination with a logic control circuit. The comparators are structured and arranged to establish various voltage threshold levels, each providing a digital state signal representative of the sensed input voltage level. The logic control circuit is structured and arranged to use the digital input signals from the comparators to output a voltage feed-forward factor (KVFF) signal that is representative of the V2rms voltage. Output from the logic control circuit is provided to an analog signal multiplier and used to shape an input current reference (IMO) waveform. This allows detection of changes in the rms level of the input voltage on the half-cycle of the AC line voltage, resulting in a rapid response to line voltage changes. Because the KVFF factor signal contains no AC ripple component, it does not contribute to THD of the input current reference, IMO.

Abstract: A pipelined recycling analog-to-digital converter (ADC), which converts a first analog input signal into a first digital output signal, including a first conversion stage and a second conversion stage is disclosed. The first conversion stage includes a first processing unit and a second processing unit. The first and the second processing units execute a number of conversion operations. For each conversion operation, an analog value and a digital code are generated by the first or the second processing unit. The first and the second processing units share an operational amplifier, and for each conversion operation. The second conversion stage includes a comparing unit which determines a specific analog value among the analog values generated by the first and the second processing units. When the specific analog value is not located within a predetermined range, the comparing unit generates a reset pulse to reset the operational amplifier.