Abstract: In analyzing the texture of rolled metal sheets and strips by means of X-rays or .gamma.-rays that penetrate them, the total beam emitted by the source of radiation is divided by collimators into several component beams, and each component beam is aimed at a different angle at a component area of the sheet or strip being tested. The diffracted radiation that penetrates the sheet is analyzed in accordance with its energy distribution in detectors and the results are processed in a computer.
Type:
Grant
Filed:
July 27, 1989
Date of Patent:
January 1, 1991
Assignee:
Hoesch Stahl AG
Inventors:
Hermann J. Kopineck, Heiner Otten, Hans-Joachim Bunge
Abstract: Displacement or strain is measured by applying to a body to be monitored at least one grid line (two or more where strain measurements are required) and scanning a radiation beam such as a laser beam across or partly across the grid line(s) to produce a pulsed output from which the mean position(s) of the grid line(s) can be ascertained with reference to a datum point on the beam scanning path. Displacement of each grid line relative to the datum point can be determined. The beam scan may be adjustable to produce a null condition in which the mean position of the grid line(s) coincides with the mid-point of the beam scan. Any deviation from the null condition then indicates displacement of the body or strain thereof.
Abstract: An X-ray mirror having its layer structure in the sequence of: a substrate having the surface roughness (R.sub.max) of 1,000 .ANG. or below; an intermediate layer of high molecular weight material formed on this substrate and having a surface roughness (R.sub.max) of 100 .ANG. or below; and a thin film formed on this intermediate layer, the X-ray mirror being produced by the process steps of: providing a substrate having a surface roughness (R.sub.max) of 1,000 .ANG. or below; forming on this substrate an intermediate layer of a high molecular weight material by spin-coating with a surface roughness (R.sub.max) of 100 .ANG. or below; and finally forming a thin film on this intermediate layer.
Abstract: Using a belt transmission and guide wheels, a linear drive for a detector arm of an X-ray monochromator is simply obtained, the angle between the detector arm and the crystal arm always being accurately equal to the angle between the crystal arm and the entrance slit.
Type:
Grant
Filed:
September 27, 1988
Date of Patent:
December 5, 1989
Assignee:
U.S. Philips Corporation
Inventors:
Maurits W. Van Tol, Johannes H. A. Buter
Abstract: X-rays can be physically reflected from surfaces under certain conditions and quantitative measurements of the reflected X-ray intensity around the critical angle for X-ray reflection may be utilized to provide a method for the chemical analysis of very thin surface layers or thin films including adsorbed organic films. This method of chemical analysis is based on different physical principles than the well-known X-ray diffraction or fluorescence methods. The X-ray reflection method for the chemical analysis of thin surface layers depends on the influence of the X-ray absorptivity of the surface layers upon the concommitant angular or wavelength dependence of the intensity of the reflected X-ray. Because the reflected wave does not significantly penetrate the sample, the sample depth for chemical analysis by the reflected X-ray beam can be very thin, for example about 100 angstroms in thickness.
Abstract: A method and device for measuring peak gamma radiation is provided wherein the method includes the steps of determining a minimum and maximum number of counts within a preselected multiple channel energy spectrum measurement range, determining a channel having approximately one-half the number of maximum counts, determining a channel representing a background energy, computing a peak energy centroid channel, computing a channel to energy conversion factor and recomputing the boundry channels for the preselected multiple channel energy spectrum measurement range.
Abstract: A method is disclosed for eliminating the diffused radiation in a radiology image. The method fundamentally consists in interposing a mask comprising a finite number of areas absorbent to X-rays between the X-ray source and the object which is to be examined, in detecting the corresponding fundamental image in order to deduce from the areas of the same which correspond to the parts eliminated from the beam a distribution of the diffused radiation throughout the image, and in correcting the fundamental image based on this distribution. The method is particularly applicable to medical radiology.
Abstract: A new process for marking currency to permit easy and positive authentication at a later date comprising exposing a small region of the currency to bombardment by high energy neutrons for a short period, treating the exposed small region with a chemical reagent which reacts with the treated area to form tiny holes which can later be used for authentication. Also provide is a method for authentication which comprises exposing the marked currency to monochromatic X-rays, allowing the transmitted beam to impinge upon a fluorescent screen which will show shiny dots where the beam has reached the screen, said dots corresponding to the tiny holes in the marked currency.
Abstract: A fixture is provided for supporting and aligning small samples of material on a goniometer for X-ray diffraction analysis. A sample-containing capillary is accurately positioned for rotation in the X-ray beam by selectively adjusting the fixture to position the capillary relative to the x and y axes thereof to prevent wobble and position the sample along the z axis or the axis of rotation. By employing the subject fixture relatively small samples of materials can be analyzed in an X-ray diffraction apparatus previously limited to the analysis of much larger samples.
Type:
Grant
Filed:
April 23, 1985
Date of Patent:
February 3, 1987
Assignee:
The United States of America as represented by the United States Department of Energy
Abstract: A radiant energy imaging system for selectively enhancing the image of objects having circular cross section to distinguish them from the image of objects having rectangular cross section, such objects being contained in a material having a different density-absorption coefficient product than the objects. In the invention, the gradient image of the spatially resolved transmitted intensity of the radiation is calculated and eroded to preferentially remove the edges of images of objects having rectangular cross section. The invention finds particular use in detecting agricultural contraband contained in baggage or parcels.
Type:
Grant
Filed:
September 29, 1982
Date of Patent:
September 3, 1985
Assignee:
The United States of America as represented by the Secretary of Agriculture
Abstract: A measuring apparatus for X-ray fluorescence analysis in which the specimen s stimulated by glancing incident radiation and is examined spectrometrically by a detector disposed above the specimen. In the path of rays of the stimulating X-radiation there is disposed a reflector which in operation deflects the X-radiation to the surface of the specimen.
Type:
Grant
Filed:
March 24, 1980
Date of Patent:
January 17, 1984
Assignee:
Gesellschaft fur Kernenergieverwertung in Schiffbau und Schiffahrt mbH
Inventors:
Joachim Schwenke, Joachim Knoth, Rainer Marten, Herbert Rosomm
Abstract: The present method and apparatus produces undistorted x-ray images of sources emitting x-rays and especially of certain areas emitting x-rays. Stigmatic monochromatic x-ray images, and x-ray spectra with a spatial resolution along the lines of the spectrum are produced. The device comprises, in combination, an x-ray diffraction crystal capable of simultaneous reflection, and an x-ray point intensity measuring system, the arrangement being such that the reflection plane of the crystal makes an angle with the plane of the intensity measurement system of 90 degrees of angle minus the Bragg angle for a forbidden reflection of the crystal, and where the x-ray radiation incident on the crystal makes a Bragg angle with the plane of the forbidden reflection, the azimuthal arrangement allowing simultaneous reflection.
Type:
Grant
Filed:
February 12, 1981
Date of Patent:
January 17, 1984
Assignee:
Yissum Research Development Co. of the Hebrew University of Jerusalem