Abstract: Calculating a rotation center point on a plane of rotation of a positioning device by using a manipulator. The positioning device positions a workpiece by rotating the plane of rotation. The calculating includes a first step of obtaining location information of a predetermined position on the plane of rotation, a second step of rotating the plane of rotation of the positioning device 180 degrees, a third step of obtaining location information of the predetermined position on the 180-degree rotated plane of rotation, and a fourth step of calculating a point bisecting a straight line as the rotation center point of the plane of rotation of the positioning device from the location information obtained in the first step and the location information obtained in the third step, the straight line connecting the predetermined position of the first step and the predetermined position of the third step.

Abstract: An average fault ratio is calculated from product characteristics of a product as a target of yield prediction, in order to predict yield accurately in the course of manufacturing the prediction target product. With respect to a reference product, whose wiring pattern is different from the prediction target product but manufactured by the same manufacturing process, a monthly electric fault density is calculated from actually measured data. Respective average fault ratios are obtained from product characteristics of the prediction target product and the reference product. A monthly electric fault density of the prediction target product is obtained by multiplying the monthly electric fault density of the reference product by the ratio of the average fault ratios. The yield is calculated by using the monthly electric fault density of the month in which a yield prediction target lot of the prediction target product was processed.

Abstract: A monitoring system and data archive system for a stent crimping process. The information concerning the crimped stent is used in deciding whether the stent is acceptable for insertion into the body cavity of a human or animal.

Abstract: Methods and systems to detect abnormal operations in a process of a process plant include collecting on-line process data. The collected on-line process data is generated from a plurality of dependent and independent process variables of the process, such as a coker heater. A plurality of multivariate statistical models of the operation of the process are generated using corresponding sets of the process data. Each model is a measure of the operation of the process when the process is on-line at different times, and at least one model is a measure of the operation of the process when the process is on-line and operating normally. The models are executed to generate outputs corresponding to loading value metrics of a corresponding dependent process variable, and the loading value metrics are utilized to detect abnormal operations of the process.

Abstract: The invention relates to a method for controlling a production of items on a production line, wherein a digital image of each of said items is processed so as to obtain at least identified product type data and identified item data, said identified product type data and identified item data being further used for determining a reliable production volume per product type and per associated item.

Abstract: Processing a wafer using a double side grinder having a pair of grinding wheels. Warp data is obtained by a warp measurement device for measuring warp of a wafer as ground by the double side grinder. The warp data is received and a nanotopography of the wafer is predicted based on the received warp data. A grinding parameter is determined based on the predicted nanotopography of the wafer. Operation of the double side grinder is adjusted based on the determined grinding parameter.

Abstract: A method of automating validation in a manufacturing facility is disclosed. The method comprises defining requirements, selecting and integrating automated devices for manufacturing. A hub-box with communication links is used to integrate the automated devices. The hub-box controls and facilitates communication between automated devices. The hub-box further collects and analyzes processing data for validation of the process. By interconnecting the automated devices to a hub-box, processing data may be collected substantially real-time and accessed remotely, facilitating continuous process validation.

Abstract: A quality control method using a plurality of analyzers and a control device connected to the analyzers via a network, the method comprising: (a) measuring quality control samples by the analyzers; (b) collecting a plurality of quality control data obtained by measuring the quality control samples; (c) implementing a quality control by the control device based on the collected quality control data; (d) obtaining uncertainty of measurement of analyzer based on uncertainty of analyzer calibration and the quality control data; (e) outputting a result of the quality control; and (f) outputting the uncertainty of measurement is disclosed. A quality control system and an analyzer are also disclosed.

Abstract: A method of analyzing production steps includes inputting application data associated with a production process having a plurality of process steps into a memory with each of the plurality of process steps including a plurality of tools. The method also includes loading process data associated with one of the plurality of process steps into the memory, performing a tool commonality analysis on each of the tools associated with the at least one of the plurality of process steps, identifying all tool-to-tool differences for the at least one of the plurality of process steps, performing a tool stratification analysis to identify one of the plurality of tools that provides the largest variance contribution to the at least one of the plurality of process steps, and stopping the one of the plurality of tools that provides the largest variance contribution to the at least one of the plurality of process steps.

Abstract: A method and system of monitoring multivariate process data in a process plant, where the multivariate process data comprises a plurality of process variables each having a plurality of observations, includes defining each process variable as a process variable vector comprising a set of observation components, where the set of observation components comprises time dependent process data corresponding to the observations of the process variable, calculation, a multivariable transformation as a function of a plurality of process variable vector transformation each corresponding to one of the process variables, where each process variable vector transformation is a function of a univariate variable unifying the process variables, and representing the operation of the process based on the multivariable transformation, where the representation of the operation of the process designates a multivariate projection of the process data by the univariate variable for each of the process variables.

Abstract: Methods, computer-readable media, and systems for automatically performing Human Factors Process Failure Modes and Effects Analysis for a process are provided. At least one task involved in a process is identified, where the task includes at least one human activity. The human activity is described using at least one verb. A human error potentially resulting from the human activity is automatically identified, the human error is related to the verb used in describing the task. A likelihood of occurrence, detection, and correction of the human error is identified. The severity of the effect of the human error is identified. The likelihood of occurrence, and the severity of the risk of potential harm is identified. The risk of potential harm is compared with a risk threshold to identify the appropriateness of corrective measures.

Abstract: Systems and method for monitoring semiconductor wafer fabrication processing, for example based upon EBR line inspection, including capturing at least one image of a wafer at an intermediate stage of fabrication. The captured image(s) are compressed to generate a composite representation of at least an edge zone of the wafer. An edge bead removal area is identified in the representation, and at least one feature attribute is extracted from the identified area. The extracted feature attribute is automatically assessed, and information relating to a status of the fabrication processing in generated based upon the assessment. For example, recommended modifications to the fabrication processing, either upstream or downstream of the current stage of fabrication (or both) can be generated and implemented.

Abstract: An inspection-required product selection method and program for minimizing the number of investigation steps at the time of a defect occurrence for a product placed on the market are disclosed. A combination of product lots to be inspected is assumed based on the information on the material lots used for a product lot scheduled for production for a predetermined future period and the number of the product lots inspected during the same period. The number of the material lots not included in the product lots to be inspected is totalized for each product lot, and the statistical values are calculated for all the conceivable combinations of the product lots. The combination of the product lots optimizing the statistical values is selected for inspection.

Abstract: A method is provided for signaling a change from a first service to a second service during a call between a terminal device and a further terminal device over at least one communication network. When a change from the first service to the second service takes place during a call between the terminal device and the further terminal device, a network unit of the communication network, via which the terminal device is currently communicating to at least one further network unit, signals whether the change was initiated by the terminal device or by a network unit of the communication network.

Abstract: A sampling inspection method is provided. The sampling inspection method is adapted for a multi-product production line including a plurality of tools. The sampling inspection method includes the steps of: providing a tool record, which records a sampling data of each of the tools; then checking each sampling data recorded in the tool record, and finding out at least one unsampled tool from the tools; then defining a plurality of product lots as being performed with process operations by at least one of the at least one unsampled tool; and determining at least one of the product lots for performing a sampling inspection.

Abstract: A failure information detection device that detects abnormality of a vehicle-mounted device that is mounted in a vehicle has: an attachment detection portion that detects whether a first component part has been attached to the vehicle; an abnormality detection portion that detects abnormality of a second component part that is disposed on the first component part; and an abnormality information discernment portion that discerns that abnormality information regarding the abnormality is not based on a failure of the vehicle-mounted device if the attachment detection portion detects that the first component part has not been attached to the vehicle.

Abstract: Information handling system manufacture through a burn rake that burns images and tests information handling systems is managed with a cascade first-in-first-out manufacture by allowing a predetermined burn time for each information handling system at each burn location. The predetermined burn time includes a projected burn time, a burn variation buffer and a standard repair time buffer that ensures a complete burn for substantially all information handling systems. Increasing the number of systems having a complete burn supports first-in-first out loading and unloading of information handling systems at burn locations so that the burn manufacture process occurs in a consistent cascade that proceeds down the length of the burn rack from a first end to a second end.

Abstract: Providing quality management and intelligent manufacturing with labels and smart tags in event-based product manufacturing. Some of the disclosed embodiments include a system, method, and computer-readable media for storing, during a process, data associated with a material. Also disclosed are a method of collecting, storing, and reporting machine productivity, waste, and delay information on an event basis in a manufacturing system, a method of capturing and storing material history, a method of automating tracking of positions of components used in a process and correlating portions of a component with production problems, an improved inventory management system, and a method of tracking and recording actions of specific operators of a process performed by a machine.

Abstract: Metrology methods and apparatus for semiconductor wafer fabrication in which data for metrology is obtained by detecting a measurable property of a monitored entity, which is either (i) a wafer transporter (e.g. a FOUP) loaded with one or more wafers to be monitored, or (ii) a plurality of wafers. Performing metrology measurements on a loaded wafer transporter enables the step of extracting wafer (s) from the transporter for metrology measurements to be omitted. Moreover, metrology measurement may be obtained while transporting the wafer (s) between treatment locations. By considering a plurality of wafers as a unit, a single measurement representing a combination of individual wafer responses is obtained. All wafers contribute to the metrology measurement without the need to perform individual wafer measurements.

Abstract: By directly using relative biases, contained in the relative bias date matrix, and by appropriately weighting the components thereof, sampling rate limitations in an APC control scheme may be efficiently compensated for. In particular embodiments, an age-based weighting factor is established that scales measurement data uncertainty according to the delay with which the corresponding measurement data for a specific control thread are obtained.

Abstract: A process for monitoring a machine, within the framework of a FMEA process for at least one component of the machine for at least one predetermined fault which can be diagnosed by means of a diagnosis diagram and a diagnosis system with sensors for detecting physical parameters of the machine, a diagnosis priority number being determined which is the product of the following index quantities: severity of the effect of occurrence of the fault with respect to the serviceability of the machine; expected machine-specific consequential costs when a fault occurs, and the possibility of correction of the fault. The diagnosis priority number is used in the evaluation of the diagnosis diagram, the diagnosis system, the current machine state, the necessary maintenance measures and/or the failure risk of the machine.

Abstract: An arrangement for implementing an automatic in-situ process control scheme during execution of a recipe is provided. The arrangement includes control-loop sensors configured at least for collecting a first set of sensor data to facilitate monitoring set points during the recipe execution, wherein the control-loop sensors being part of a process control loop. The arrangement also includes independent sensors configured at least for collecting a second set of sensor data, which is not part of the process control loop. The arrangement yet also includes a hub configured for at least receiving at least one of the first set of sensor data and the second set of sensor data. The arrangement yet further includes an analysis computer communicably coupled with the hub and configured for performing analysis of at least one of the first set of sensor data and the second set of sensor data.

Abstract: A method and a unit for determining the spatial position of a wheel rim with respect to a measuring unit having at least one camera, wherein the wheel rim lies in the viewing field of the camera, including making available of a model, that describes a model body of a localizable wheel rim geometry detail as well as the spatial position of the model body with respect to the measuring unit, through model parameters, capturing of a picture of the wheel rim geometry detail of the wheel rim with the camera, fitting the image of the model body resulting from the model parameters to the picture of the wheel rim geometry detail through changing the model parameters of the model, and tracking the changes of the model parameters upon the fitting, whereby the data related to the position of the model body of the wheel rim geometry detail reflect the spatial position of the wheel rim-geometry detail and, thereby, the wheel rim itself, when the image resulting from the model parameters, of the wheel rim-geometry detail fi

Abstract: A system and a method of planning global logistics for a TFT-LCD manufacturing industry are provided. The system includes an input module and an industry characteristic planning module with a front-end process transformation module and a back-end transportation allocation module. The input module is used for selecting a performance index and inputting related parameters such as manufacturing parameters and shipping parameters. The front-end process transformation module calculates the number of each semi-finished product at each of the front-end TFT-LCD manufacturing factories so as to estimate an glass substrate input quantity for each respective front-end TFT-LCD manufacturing factory.

Abstract: The invention can provide a method of processing a wafer using Site-Dependent (S-D) processing sequences that can include S-D creation procedures, S-D evaluation procedures, and S-D transfer sequences. The S-D creation procedures can be performed using S-D processing elements, the S-D evaluation procedures can be performed using S-D evaluation elements, and S-D transfer sequences can be performed using site-dependent transfer subsystems. Site-dependent data can be stored in site-dependent libraries and/or databases.

Abstract: A production information reporting/recording system is disclosed herein including a number of features to ensure efficient, flexible and reliable recording of production data in a manufacturing system. Such features include validating the content of event messages to ensure compliance of event report information with a standard. The system also supports caching IDs associated with particular aspects of an event message (e.g., a production request, a process segment) as well as a unique ID corresponding to the ID assigned by the production event database to reduce the need to access the database when assigning unique database IDs to received events. The production event messaging system also supports both asynchronous and synchronous transactional messaging between the sources of events and the production database service.

Abstract: By taking into consideration the measurement uncertainties in the form of standard errors, the performance of APC controllers may be efficiently enhanced by using the standard errors as a control input. For example, the filter parameter of an EWMA filter may be efficiently scaled on the basis of a standard error of measurement data.

Abstract: A reticle manipulating device comprising a housing capable of having a controlled environment wherein at least one processing module is connected to the housing and capable of processing a reticle. A transport apparatus is, connected to the housing for transporting the reticle between the at least one module to another portion of the housing. At least one module is removably connectable to the housing and at least one module has an interface adapted for removably coupling the module to the housing. One module being selectable for connection to the housing from a number of different interchangeable module each having a different predetermined characteristic and being capable of connection to the housing.

Abstract: A method for obtaining shoes includes a step for obtaining shoe information; a step for communication with manufacturers; a step for manufacturing the shoes; a step for delivery and/or try-on; a step for amendment, and a step for finish manufacture. The method allows the customers to design their shoes by themselves and communicate with the shoe manufactures so as to obtain desired shoes.

Abstract: A process control system includes a client computer which prepares a correlation between a reference monitored value of apparatus information and a feature quantity, a manufacturing execution system which prepares a processing recipe describing, as a first setting value in an actual manufacturing process, a value of the control parameter, an apparatus information collection section which collects an objective monitored value of the apparatus information in operation of the actual manufacturing process with the first setting value, a feature quantity calculation section which calculates a value of a feature quantity corresponding to the objective monitored value based on the correlation, a parameter calculation section which calculates a second setting value in the actual manufacturing process on the basis of the value of the feature quantity, and an apparatus control unit which changes the processing recipe with the second setting value being as a setting value of the second step.

Abstract: A system and method is disclosed for providing automatic qualification intervention in a manufacturing process that is performed by a plurality of components. At least one qualification process is associated with each of the components. The qualification processes are stored in a component/qualification matrix in a computerized database management system. The automatic qualification intervention system requires that all qualification processes for a component must be performed in conformity with the qualification processes for the component that have been stored in the component/qualification matrix. The automatic qualification intervention system significantly reduces the delays that are inherent in prior art methods.

Abstract: A method that involves matching the trend of process outcome with the trend of process variables to identify the variables that have an impact on the process outcome is disclosed. The method for process trend matching comprises processing of raw data of process outcome and of process variables using an outlier filtering method, smoothing these data using common smoothing algorithm like Kernel, dividing smoothed raw data equally into time intervals, computing the gradients of the points at both ends of the time intervals, and translating the gradients into a scale based on the magnitude of the gradients. The following steps comprise comparing the process outcome and each process variable independently for same time frame, and assigning a score for both outcome and variable. The sum of the scores is then computed which is used to determine the quality of fit. A real-time monitoring system is then set up to monitor these variables for any drifts.

Abstract: A system includes a computing cloud having at least one data storage unit and at least one processing unit. The computing cloud is configured to provide at least one service. The system also includes a plurality of clients each configured to communicate with the computing cloud and at least one industrial automation unit and to transmit information associated with the at least one industrial automation unit to the computing cloud. The at least one processing unit in the computing cloud is configured to determine a status of the at least one industrial automation unit using the information provided the clients.

Abstract: In estimating a curved surface model by approximating the shape of the board surface of a circuit board, auxiliary measurement spots are set other than measurement spots on the board surface, eligibility as a sampling displacement magnitude in estimating a curved surface model is determined according to a difference in a displacement magnitude from a work reference surface. When the sampling displacement magnitude is determined to be ineligible, a new measurement spot is reset. By this operation, a local increase and decrease in the displacement magnitude due to a discontinuity of the board surface exerts no influence on the estimation of the curved surface model, and the curved surface model approximated more closely to the shape of the actual board surface is estimated, leading to an improvement in the work quality with the working height adjusted to the proper height.

Abstract: An advanced process control (APC) system. The APC system comprises a database for receiving process data from a measurement tool for a plurality of process runs and for storing the process data. A lambda tuner determines a tuned-lambda value corresponding to a process-capability-index value based on upper and lower process control limits and statistics derived from the process data. A process-run controller updates a recipe value based on the received process data and the tuned-lambda value.

Abstract: A system for correcting quality problems includes a server (1), a database (2), and a plurality of client terminals (4) connected to the server through a network (3). The database stores data used or generated in utilizing the system. Each client terminal provides an interactive user interface for quality control operators to perform corrective actions. The server comprises: a data receiving module (12) for receiving confirmations and responses from the client terminals through the network; a data transmitting module (13) for transmitting initial corrective action reports generated by the server to corresponding client terminals, for operators located at the client terminals to reply to the initial corrective action reports; and a CAR (corrective action report) generating module (14) for integrating all data received by the data receiving module and automatically generating formal corrective action reports. A related method for correcting quality problems is also disclosed.

Abstract: Factories (102-104) have host computers (107) for monitoring industrial equipment (106). Each host computer (107) is connected to a management host computer (108) on a vendor (101) side through the internet (105). The host computer (107) on the factory side detects occurrence of a trouble of the industrial equipment (106) and notifies the vendor side of status information representing a trouble state. In response to this, the host computer (108) on the vendor side notifies the factory side of response information representing a countermeasure against the trouble state.

Abstract: A method for analyzing technical processes is disclosed, which is characterized in that measuring data of the technical process is generated by at least one decentralized measuring unit, image data associated with a mechanical course of the technical process is produced by at least one decentralized image detection unit, the measuring data stored in the at least one decentralized measuring unit and the image data stored in the at least one image detection unit is provided with a time stamp available to all systems, the measuring and image data are transmitted to a central detection unit where said data is displayed and/or processed in a time-synchronous manner using the time stamp function. Since time stamping is carried out directly in situ, i.e.

Abstract: Some embodiments of the present invention provide a system that generates a simulated vibration pattern in a computer subsystem. During operation, a vibration pattern is monitored at a location in the computer subsystem, wherein the vibration pattern is monitored while the computer subsystem is incorporated into the computer system and the computer system is operating. Then, the vibrations of the computer subsystem are mimicked by generating the simulated vibration pattern at the same location in the computer subsystem based on the monitored vibration pattern.

Abstract: A method for synchronizing a first machine of a manufacturing process section arranged to carry out a production cycle including a working part and a non-working part. The first machine is operated in conjunction with at least one second machine. The first machine carries out a process during the working part of the cycle on a workpiece that is loaded into and/or unloaded out of the first machine by the at least one second machine during the non-working part of each process cycle. Also, a system for carrying out the method and a computer program.

Abstract: According to typical inventive practice, a baseline describing a statistical distribution is established for a set of historical occurrences of an event. Comparison is made between the baseline and at least one current occurrence of the same event. Any current occurrence that is anomalous vis-à-vis the baseline is considered a possible leading indicator. According to some inventive embodiments of graphical presentation of such comparison, at least one graphical baseline comparative display component is rendered that includes a “bar” (describing a historical statistical distribution with respect to a criterion pertaining to occurrence of an event) and a “slider” (describing one or more current occurrences of the event). The bar includes at least one band representing a statistical mean range, and at least one band representing a statistical outlier range. Situation of the slider along the bar indicates whether and to what extent the current occurrence(s) is/are anomalous vis-à-vis the baseline.

Abstract: Surgical sponges and other articles are provided with machine-readable information which provides a serial number or other unique identification of the sponge. In addition, the machine-readable information will provide the type of article and/or a characteristic visual motif associated with the article. That way, by scanning in the machine-readable information from the sponges or other articles prior to a procedure, the computer or other digital processor can determine which articles may be missing after the procedure and alert the surgical team as to the type and/or characteristic visual motif of the missing article.

Abstract: A defect probability calculating method includes assuming a plurality of process conditions containing process variations caused in a process of forming a pattern on a substrate based on a design pattern, acquiring appearance probabilities of the respective process conditions, performing process simulation to predict a pattern to be formed on a substrate based on the design pattern for each of the process conditions, determining whether the pattern predicted by performing the process simulation satisfies preset criteria for each of the process conditions, and acquiring first probability by adding together appearance probabilities of the process conditions used for process simulation of patterns which are determined not to satisfy the preset criteria.

Abstract: A semiconductor substrate processing apparatus and a method for processing semiconductor substrates are provided. The method may include providing a semiconductor substrate having a surface and a plurality of features on the surface, each feature being positioned on the surface at a first respective point in a first coordinate system, plotting the position of each feature at a second respective point in a second coordinate system; and generating a translation between the first and the second coordinate systems. The generating of the translation may include calculating an offset between the first and the second coordinate systems. The calculating of the offset may include calculating an offset distance between a reference point of the first coordinate system and a reference point of the second coordinate system and calculating an offset angle between an axis of the first coordinate system and an axis of the second coordinate system.

Abstract: In order to provide functions in an industrial automation system having control units which are coupled via a communication network, functions of the automation system are made available by services. Components of a service are subdivided into service-specific components and into components which can be reused by a plurality of different services. Service-specific components and reusable components have a standard configuration interface. Service components are linked to a service by a service configuration unit via the standard configuration interface. Functions for monitoring and/or controlling a defined quality of service are assigned to the reusable components.

Abstract: A rotary atomizer arrangement and methods for operating the same are disclosed. An exemplary atomizer may be used for the coating of work pieces, and may include a bell plate driven by an electric motor. The exemplary atomizer may further be configured for the detection of errors in the spraying process and/or the drive system of the bell plate, such as by analyzing corresponding parameters of typical values of the drive motor.

Abstract: There is provided a manufacturing system for manufacturing an electronic device through a plurality of manufacturing stages. The manufacturing system includes a plurality of manufacturing apparatuses performing processes corresponding to the plurality of manufacturing stages.

Abstract: To select a scan distance to be used in scanning a wafer with an implant beam, a dose distribution along a first direction is calculated based on size or intensity of the implant beam and a scan distance. The scan distance is the distance measured in the first direction between a first path and a final path of the implant beam scanning the wafer along a second direction in multiple paths. A relative velocity profile along the second direction is determined based on the dose distribution. Dose uniformity on the wafer is calculated based on the wafer being scanned using the relative velocity profile and the determined dose distribution. The scan distance is adjusted and the preceding steps are repeated until the calculated dose uniformity meets one or more uniformity criteria.

Abstract: First feedforward calculation is executed when a preprocessing surface profile is measured and a processing chamber with its processing parameter value having been obtained through the first feedforward calculation judged to be within an allowable range is determined. Wafer transfer is executed only in conjunction with a processing chamber having a processing parameter value judged to be within the allowable range, and the wafer is carried to the entry point of the processing chamber. Then, second feedforward calculation is executed by reflecting the results of feedback calculation executed based upon the most recent processing having been executed in the particular processing chamber and wafer processing is executed in the processing chamber based upon the processing parameter value calculated in the second feedforward calculation.

Abstract: A quality control method includes: extracting, from a time series distribution of troubles that have occurred in electronic equipments, a first characteristics of states of occurrence of the troubles; specifying one or more parts included in the electronic equipments, the parts being involved with the troubles; extracting, from another time series distribution of a rate of use corresponding to each of suppliers which supply the specified parts, a second characteristics of the parts; and specifying one or more of the suppliers supplying the parts correlated to the troubles based on a correlation between the extracted first characteristics and the extracted second characteristics.