Testing System Patents (Class 702/108)
  • Patent number: 7460983
    Abstract: A method and apparatus adapted to calibrate a signal path of a signal analysis system such that loading effects of the system are substantially removed from measurements of a device under test. A signal under test from the device under test is coupled to a test probe in the signal path and used with selectable impedance loads in the test probe to characterize transfer parameters of the device under test. An equalization filter in either the frequency or time domain is computed from the device under test transfer parameters for reducing in signal error attributable to the measurement loading of the device under test.
    Type: Grant
    Filed: August 23, 2006
    Date of Patent: December 2, 2008
    Assignee: Tektronix, Inc.
    Inventors: John J. Pickerd, Kan Tan, William A. Hagerup, Rolf P. Anderson, Sharon M. Mc Masters
  • Publication number: 20080290870
    Abstract: Systems and methods for the selection of and application of RF power to a plurality of transmit and/or transmit/receive coil elements to decrease patient SAR and to limit the potential for artifact problems. Without any change to the hardware or software of an MR scanner, the present local coil system provides system logic and coil design flexibility such that only transmit coil elements that are required for a particular portion of an MR scan will be utilized at that time. The local coil system may include any combination of transmit-only, receive-only and transmit/receive coil elements as part of the coil system (array of coil elements). The logic controller of the local coil system gathers input data from the MR scanner, from the attached coil elements and optionally from one or more sensors attached to the coil system itself.
    Type: Application
    Filed: May 21, 2007
    Publication date: November 27, 2008
    Applicant: MEDRAD, INC.
    Inventor: George Misic
  • Patent number: 7457311
    Abstract: The present inventions relate to portable communication interface devices for communication and testing between a computer and electronic devices The portable communication interface device of one embodiment includes at least one specialized port, a standard port and a controller. Each specialized port is adapted to selectively communicate with an associated electronic device wherein each associated electronic device communicates by a unique device format. The standard port is adapted to selectively communicate with a computer wherein the computer is communicating by a computer format. The controller is coupled between the one or more specialized ports and the standard port. The controller is adapted to provide an interface between each unique device format and the computer format. The controller includes a data processor that is adapted to perform logic conversions.
    Type: Grant
    Filed: August 31, 2004
    Date of Patent: November 25, 2008
    Assignee: Honeywell International Inc.
    Inventor: Erik M. Hall
  • Patent number: 7449856
    Abstract: A universal controller for an automatic door system including a door carried on a frame for movement along a predetermined path of movement between open and closed positions. The universal controller includes a housing for mounting the controller in a stationary position relative to the door frame and an assembly including a processor carried by the housing for processing data operatively received from a plurality of sensors and relating to the operation of the movable door. The processor is configured to generate operational values which are transmitted to and control a drive motor used to move the door between the open and closed positions. The assembly further includes an arrangement for adjusting the operational values generated by the processor and transmitted to the drive motor. A modular harness connects the controller to the drive motor and to the sensors.
    Type: Grant
    Filed: November 14, 2005
    Date of Patent: November 11, 2008
    Assignee: Motion Access, L.L.C.
    Inventors: Michael A. Valencia, Joseph P. Madden, Gilbert F. Valencia, Robert L. Oakley
  • Publication number: 20080270063
    Abstract: A method is provided for improving the quality of cheese produced from a curd and whey mixture. The method comprises the steps of monitoring the curd and whey mixture during syneresis processing to collect color data, comparing the color data to a predetermined standard and terminating syneresis when the color meets the predetermined standard or, alternatively, analyzing the color data obtained to generate kinetic parameters that can be used to predict the end point of syneresis to improve control of curd moisture content.
    Type: Application
    Filed: April 24, 2007
    Publication date: October 30, 2008
    Inventors: Colm D. Everard, Donal J. O'Callaghan, Colm P. O'Donnell, Colleen C. Fagan, Manuel Castillo, Frederick Alan Payne
  • Patent number: 7444253
    Abstract: A probe card assembly, according to some embodiments of the invention, can comprise a tester interface configured to make electrical connections with a test controller, a plurality of electrically conductive probes disposed to contact terminals of an electronic device to be tested, and a plurality of electrically conductive data paths connecting the tester interface and the probes. At least one of the data paths can comprise an air bridge structure trace comprising an electrically conductive trace spaced away from an electrically conductive plate by a plurality of pylons.
    Type: Grant
    Filed: May 9, 2006
    Date of Patent: October 28, 2008
    Assignee: FormFactor, Inc.
    Inventor: Gaetan L. Mathieu
  • Patent number: 7444558
    Abstract: A serial point to point link that communicatively couples an integrated circuit (IC) device to another IC device is initialized by transferring a training sequence of symbols over the link. Registers of the IC device are programmed, to set a symbol data pattern and configure a lane transmitter for the link. A start bit in a register of the IC device is programmed, to request that the link be placed in a measurement mode. In this mode, the IC device instructs the other IC device to enter a loopback mode for the link. The IC device transmits a sequence of test symbols over the link and evaluates a loopback version of the sequence for errors. The sequence of test symbols have a data pattern, and are transmitted, as configured by the registers. Other embodiments are also described and claimed.
    Type: Grant
    Filed: December 31, 2003
    Date of Patent: October 28, 2008
    Assignee: Intel Corporation
    Inventors: Suneel G. Mitbander, Cass A. Blodgett, Andrew W. Martwick, Lyonel Renaud, Theodore Z. Schoenborn
  • Patent number: 7444251
    Abstract: A method and system detects and diagnoses faults in heating, ventilating and air conditioning (HVAC) equipment. Internal state variables of the HVAC equipment are measured under external driving conditions. Expected internal state variables are predicted for the HVAC equipment operating under the external driving conditions using a locally weighted regression model. Features are determined of the HVAC based on differences between the measured and predicted state variables. The features are classified to determine a condition of the HVAC equipment.
    Type: Grant
    Filed: August 1, 2006
    Date of Patent: October 28, 2008
    Assignee: Mitsubishi Electric Research Laboratories, Inc.
    Inventors: Daniel N. Nikovski, Ajay Divakaran, Regunathan Radhakrishnan, Kadir A. Peker
  • Publication number: 20080262776
    Abstract: A setting information management method executed by a backup program stored in a portable storage medium by a processing computer of an analyzer, comprising: determining a type of the analyzer in which the backup program is executed from a plurality of types of analyzers; acquiring setting information of a program introduced to the processing computer based on the determination result; and storing the acquired setting information in the portable storage medium. A setting information management system, a setting information management device, and a computer program product is also disclosed.
    Type: Application
    Filed: March 28, 2008
    Publication date: October 23, 2008
    Inventors: Hirokazu Yamasaki, Takashi Matsuzawa
  • Patent number: 7440863
    Abstract: Methods, tools, systems and computer readable media for compliance testing instrumentation and/or software. Data from one or more analytical instruments and/or software is converted to a technology-neutral format, which is independent of instrument type, instrument model, instrument manufacturer and data type of the analytical instrument or software from which the data was outputted. Calculations are performed on the converted data to produce one or more outputs, and then selection is made from the one or more outputs to populate a final report, wherein the one or more outputs are standardized and are directly comparable to outputs resultant from carrying out the method on another set of one or more other analytical instruments and/or software, irrespective of manufacturer or model of the other analytical instruments and/or software.
    Type: Grant
    Filed: April 29, 2005
    Date of Patent: October 21, 2008
    Assignee: Agilent Technologies, Inc.
    Inventor: Charles Manfredi
  • Patent number: 7440862
    Abstract: Embodiments of the present invention use the results of a plurality of defect detecting tests and adjust the result of each test in a manner that reflects the accuracy of the test that produced it. A manufactured unit can then be evaluated using a mathematical combination of the adjusted results.
    Type: Grant
    Filed: May 10, 2004
    Date of Patent: October 21, 2008
    Assignee: Agilent Technologies, Inc.
    Inventors: Jonathan Qiang Li, Daniel A. Usikov
  • Patent number: 7437271
    Abstract: A method and apparatus for testing semiconductors according to various aspects of the present invention comprises a test system comprising composite data analysis element configured to analyze data from more than one dataset. The test system may be configured to provide the data in an output report. The composite data analysis element suitably performs a spatial analysis to identify patterns and irregularities in the composite data set. The composite data analysis element may also operate in conjunction with a various other analysis systems, such as a cluster detection system and an exclusion system, to refine the composite data analysis. The composite may also be merged into other data.
    Type: Grant
    Filed: October 28, 2005
    Date of Patent: October 14, 2008
    Assignee: Test Advantage, Inc.
    Inventor: Eric Paul Tabor
  • Publication number: 20080250278
    Abstract: A portable telecommunication test set, such as a telephone line butt set, with a web browser incorporated therein. A standard HTML (Hyper Text Mark-up Language) or WAP (Wireless Application Protocol) browser may be incorporated within the portable test set, allowing a network technician to access the Internet as well as other remotely-located sources of information to retrieve data and other useful technical information while in the field for communication network or telephone line maintenance, troubleshooting or repair. The test set may contain memory to locally store certain technical information, e.g., telephone line-specific data or circuit information, that may be retrieved and “read” by the built-in browser module when prompted by the network technician. The web browser may display the content of the requested information on a display provided on the test set.
    Type: Application
    Filed: May 30, 2006
    Publication date: October 9, 2008
    Applicant: BellSouth Intellectual Property Corporation
    Inventors: Samuel N. Zellner, Nathan Sargent, Mark J. Enzmann, Robert T. Moton
  • Patent number: 7433793
    Abstract: A modulated voltage signal modulated at a predetermined frequency f0 is supplied to an integrated circuit under test to be tested set at an arbitrary stationary point, and an observation signal containing information on power supply current flowing through the integrated circuit under test at the stationary point. Then, a determination signal from which DC component is removed is extracted from the observation signal and supplied to a determination device. The determination device compares the size of spectral component of the determination signal at the predetermined frequency f0 between each measurement point and determines that an error exists in the integrated circuit under test if a difference is a predetermined value or greater.
    Type: Grant
    Filed: January 19, 2006
    Date of Patent: October 7, 2008
    Assignee: NEC Electronics Corporation
    Inventor: Kenji Mori
  • Patent number: 7432941
    Abstract: A system and method for determining whether a target display subsystem is compliant with a reference display subsystem is provided. A target display subsystem is selected for outputting image data. Drawing instructions are generated and applied to the target display subsystem. Image data generated by the target display subsystem, responsive to the applied drawing instructions, is periodically captured and recorded. The reference subsystem is selected, and the same drawing instructions are applied to the reference display subsystem. Image data generated by the reference display subsystem is periodically captured and recorded from the reference display subsystem. Thereafter, the captured image data from the target display subsystem and the reference display subsystem are compared to determine whether the target display subsystem is compliant with the reference display subsystem.
    Type: Grant
    Filed: August 26, 2005
    Date of Patent: October 7, 2008
    Assignee: Microsoft Corporation
    Inventors: Gershon Parent, Shanon I Drone, Jeffrey Scott Norris, Michael David Anderson
  • Patent number: 7430486
    Abstract: A method for communicating test information from a source to a destination is disclosed. The method includes providing a modular test system, where the modular test system comprises a system controller for controlling at least one site controller, the at least one site controller for controlling at least one test module. The method further includes providing a datalog framework for supporting extension of user-defined datalog formats, providing support classes for supporting user-initiated datalog events, receiving a datalog event requesting for communicating input test information from the source to the destination, configuring output test information based upon the destination, the datalog framework and the support classes, and transferring the output test information to the destination.
    Type: Grant
    Filed: August 13, 2004
    Date of Patent: September 30, 2008
    Assignee: Advantest America R&D Center, Inc.
    Inventors: Mark Elston, Ankan Pramanick
  • Publication number: 20080229165
    Abstract: Methods and systems for simulation of a testable system are provided in which a virtual testable system is used. One method includes inputting a system definition file into a translation utility, where the system definition file includes a plurality of virtual addresses required for execution of the system definition file in a virtual testable system. The method also includes inputting a memory map file into the translation utility, the memory map representing a physical memory space for a testable system. The method further includes generating translation information by translating the virtual addresses into physical addresses using the memory map file.
    Type: Application
    Filed: March 16, 2007
    Publication date: September 18, 2008
    Applicants: ETAS, Inc., Robert Bosch GmbH
    Inventors: Timothy W. Foster, Jamey Joseph Cates
  • Patent number: 7424382
    Abstract: Systems and methods of characterizing eye diagrams are described. In one aspect, at measurement times across a measurement interval spanning at least one unit interval of the input signal, corresponding levels of the input signal are classified into groups based on at least one threshold. An eye diagram characteristic width is derived based on a distribution across the measurement interval of the levels in one of the groups.
    Type: Grant
    Filed: November 23, 2004
    Date of Patent: September 9, 2008
    Assignee: Agilent Technologies, Inc.
    Inventors: Gunter Steinbach, Brian J. Galloway, Ken A. Nishimura
  • Patent number: 7421369
    Abstract: There is provided an activity recognition apparatus for detecting an activity of a subject. The apparatus includes: a sensor unit including a plurality of linear motion sensors configured to detect linear motions and a plurality of rotational motion sensors, the linear motions being orthogonal to each other, the rotational motions being orthogonal to each other; and a computational unit configured to receive and process signals from the sensors included in the sensor unit so as to detect an activity of the subject. The sensor unit is directly or indirectly supported by the subject with an arbitrary orientation with respect to the subject. The computational unit performs a calculation that uses the signals from both linear motion sensors and rotational motion sensors to determine the activity of the subject independent of the orientation of the sensor unit.
    Type: Grant
    Filed: May 18, 2006
    Date of Patent: September 2, 2008
    Assignee: Sony Corporation
    Inventor: Brian Clarkson
  • Patent number: 7421360
    Abstract: In one embodiment, and in response to an ordered sequence of events corresponding to execution of a plurality of tests on at least one device under test (DUT), 1) a plurality of data objects are created, the data objects including A) some data objects that correspond to logical groupings of test results implied by ones of the events, and B) a generic data object that corresponds to a user-defined one of the events; 2) ones of the data objects are related to others of the data objects in a hierarchical tree structure, with the generic data object being related to others of the data objects based on the position of the user-defined event in the ordered sequence of events; and 3) data corresponding to ones of the events is related to ones of the data objects in the hierarchical tree structure. A number of data formatters are provided access to the plurality of data objects and data associated with the hierarchical tree structure. Other embodiments are also disclosed.
    Type: Grant
    Filed: January 31, 2006
    Date of Patent: September 2, 2008
    Assignee: Verigy (Singapore) Pte. Ltd.
    Inventors: Robert Stanley Kolman, Reid Hayhow
  • Patent number: 7421361
    Abstract: A system for performing an automated factory install peripheral test process. The system is configured so that peripherals (e.g., printers) to be tested are coupled to a hub (such as a USB hub) that is then coupled to a download test system. The download test system is coupled to the network to allow for factory install download testing. The peripherals to be tested are all plugged in to a controllable power source (such as a controllable power strip). This power source is coupled to the download test system via, e.g., a USB connection, thus allowing commands to be sent to the power source by the download test system. The peripherals being tested each have their power buttons set to an on position, but the power source is initially set so that none of the peripherals have power applied to them.
    Type: Grant
    Filed: March 27, 2006
    Date of Patent: September 2, 2008
    Assignee: Dell Products L.P.
    Inventors: Rudolf V. Bendixen, Christopher Jameyson
  • Publication number: 20080201098
    Abstract: Methods, tools, systems and computer readable media for compliance testing instrumentation and/or software. Data from one or more analytical instruments and/or software is converted to a technology-neutral format, which is independent of instrument type, instrument model, instrument manufacturer and data type of the analytical instrument or software from which the data was outputted. Calculations are performed on the converted data to produce one or more outputs, and then selection is made from the one or more outputs to populate a final report, wherein the one or more outputs are standardized and are directly comparable to outputs resultant from carrying out the method on another set of one or more other analytical instruments and/or software, irrespective of manufacturer or model of the other analytical instruments and/or software.
    Type: Application
    Filed: April 24, 2008
    Publication date: August 21, 2008
    Inventor: Charles manfredi
  • Patent number: 7415379
    Abstract: A testing device and method for testing a printed circuit board (PCB) for a remote keyless entry fob includes a battery simulator cell to simulate the effects of a remote keyless entry fob battery. The battery simulator cell is located in an upper portion of a testing device housing and is preferably a brass or copper mass of the same size, shape and mass of a typical battery. The lower portion of the housing has a mount for the PCB. At least one circuit board locator is mounted to the upper portion of the housing to apply pressure to the PCB to retain the PCB in the correct position during testing, and to ensure the proper distance between the PCB and the battery simulator cell. A receiving antenna is located proximate the test device for receiving a signal.
    Type: Grant
    Filed: December 21, 2005
    Date of Patent: August 19, 2008
    Assignee: Continental Automotive Systems US Inc.
    Inventors: Mark A. Powell, Charles F. Muma
  • Patent number: 7415376
    Abstract: A valve tester system is disclosed that comprises a valve tester assembly for rotating a valve stem of a valve. The valve tester assembly may include a support, a rotation element mounted on the support for rotating a valve during a rotation event, a control element for controlling aspects of the rotation event of the valve by the rotation element, and an element for detecting a location of the valve tester assembly during the rotation event of the valve. In some embodiments of the invention, the element for detecting the location of the valve tester assembly includes a Global Positioning Satellite (GPS) receiver. In some embodiments, the GPS receiver is integral with the control element.
    Type: Grant
    Filed: May 30, 2006
    Date of Patent: August 19, 2008
    Inventor: Lyndon J. Hurley
  • Patent number: 7411999
    Abstract: Measurements for an eye diagram of signal of interest are placed in a data structure that is examined to locate an eye opening of interest. The eye opening of interest is normalized into figure of merit units related to the operational voltage and timing requirements of the data receiver for that signal. The locations within the normalized eye opening may be taken as center locations for trial symmetric shapes that start out small and are enlarged until they first include locations not part of the normalized eye opening. The center of a largest such shape is mapped back into the units of the original eye diagram as optimum sampling parameters for data analysis equipment that uses the receiver to sample the signal once per unit interval to discover logical value. An alternative is to repeatedly remove the ‘outer layer’ of the normalized eye opening until only one location remains.
    Type: Grant
    Filed: February 24, 2005
    Date of Patent: August 12, 2008
    Assignee: Agilent Technologies, Inc.
    Inventor: Richard A Nygaard, Jr.
  • Patent number: 7406392
    Abstract: Systems and methods are provided for prioritizing the processing of standardized tests. One aspect of the present subject matter relates to a method for processing completed standardized tests. In one embodiment, test-processing priority information is received, and is associated with machine-readable identifiers for standardized tests. Completed standardized tests are received, and are identified by reading machine-readable identifiers. The identified standardized tests are processed according to the associated test-processing priority information such that higher priority tests are automatically processed before lower priority tests. Other aspects are provided herein.
    Type: Grant
    Filed: April 13, 2006
    Date of Patent: July 29, 2008
    Assignee: Data Recognition Corporation
    Inventors: Mark Gedlinske, Doyle Kirkeby, Michelle Edenborg
  • Patent number: 7400586
    Abstract: The invention is a diagnostic tool for collaboratively testing a T1 line from remote terminals. A Diagnostic Interface Unit (DIU) containing test and monitoring equipment is connected into a T1 line close to a demarcation point. Testing from that common point, to either end of the T1 line is then performed by one or more operators at remote terminals. The operator terminals are connected via the Internet, to a common server in communication with the DIU. The operators each see the same page of a Diagnostic Web Service (DWS). Using the DWS, one of the operators causes the DIU to be switched into the T1 line and the T1 line configured and tested. All operators see the test setup and results on their own screens in real-time, making this remote testing equivalent to the operators meeting at the demarcation point and jointly testing from that point out.
    Type: Grant
    Filed: February 25, 2003
    Date of Patent: July 15, 2008
    Assignee: Avaya Technology Corp.
    Inventors: Anthony E. Izundu, Jay M. Stiles
  • Patent number: 7397865
    Abstract: A system analyzer may generate an estimated frequency response of a device, system, communication medium, or combination thereof by utilizing a stimulus signal that is robust against IQ modulator impairments. A stimulus generator may be used to generate a plurality of discrete tones according to a frequency spacing and a frequency offset. The frequency spacing and the frequency offset cause spectrally inverted spurs (generated by impairments of the IQ modulator) to occur at frequencies other than frequencies of said modulated signal that are associated with said plurality of discrete tones. Additionally, by implementing a Discrete Fourier Transform (DFT) to possess a frequency resolution equal to the frequency offset, there is no leakage of power associated with the spectrally inverted spurs into frequency bins of the DFT associated with the desired frequency components. Likewise, leakage between the desired frequency components and leakage associated with the local oscillator may be avoided.
    Type: Grant
    Filed: April 2, 2003
    Date of Patent: July 8, 2008
    Assignee: Agilent Technologies, Inc.
    Inventors: George S. Moore, Raymond A. Birgenheier
  • Publication number: 20080162068
    Abstract: A method, computer program product, and system for evaluating access control or filter conditions are provided. The method, computer program product, and system provide for developing a test model involving a plurality of access control or filter conditions, assigning a binary value to each of a plurality of scenarios of the test model, wherein the binary value includes a binary digit for each of the plurality of access control or filter conditions, and calculating an expected result for each of the plurality of scenarios through a logical AND operation of the binary digits in the binary value assigned to the scenario.
    Type: Application
    Filed: October 30, 2006
    Publication date: July 3, 2008
    Applicant: International Business Machines
    Inventor: David B. VICTOR
  • Publication number: 20080162070
    Abstract: The invention provides a number of related methods which improve the test and analysis of integrated circuit devices. A first method of the invention provides a method for pausing on a SCAN based test. A second method of the invention provides a method for using stimulations and responses of a slown good device to increase fault coverage of patterns in a test flow. A third method of the invention provides a method to curve trace device buffers on an ATE.
    Type: Application
    Filed: December 27, 2007
    Publication date: July 3, 2008
    Applicant: LSI LOGIC CORPORATION
    Inventor: Roger Yacobucci
  • Publication number: 20080162069
    Abstract: A method and a device for the dynamic treatment of objects in a test design are described and presented. According to this method, the test design comprises at least two bidirectionally exchanging systems and at least one additional system to be tested. Objects of a first type belong to an environment model, which is executed on a first system, and these objects can be processed by a test model. The inventive method prevents the drawbacks known from the prior art, in that objects of a second type that are similar or identical to the objects of the first type are generated; and the objects of a first and a second type are made available to at least one of the systems by means of a management device.
    Type: Application
    Filed: December 21, 2007
    Publication date: July 3, 2008
    Inventors: Nicola Bruski, Ralf Grosse Boerger, Holger Krisp, Robert Leinfellner, Eduard Miller, Jobst Richert, Thomas Woelfer
  • Patent number: 7395165
    Abstract: An apparatus and method is provided for protecting data in a non-volatile memory by using an encryption and decryption that encrypts and decrypts the address and the data stored in the non-volatile memory using a code read only memory that stores encryption and decryption keys that are addressed by a related central processing unit at the same time data is being written or read from the non-volatile memory by the central processing unit.
    Type: Grant
    Filed: November 14, 2003
    Date of Patent: July 1, 2008
    Assignee: NXP B.V.
    Inventor: Wolfgang Buhr
  • Patent number: 7395166
    Abstract: A connector including an integrated circuit, for connecting two conductors directly or indirectly. The integrated circuit derives power either from one of the connectors being connected by the connector or from one or more other conductors terminating in the connector, and not from a battery or photovoltaic cell or other such voltage source. A coupler connected to the integrated circuit is used in case of an indirect connection of the two conductors and/or of the one or both of the conductors to the integrated circuit, to avoid having to make a physical attachment.
    Type: Grant
    Filed: May 31, 2006
    Date of Patent: July 1, 2008
    Inventor: Paul J. Plishner
  • Publication number: 20080154531
    Abstract: A testing tool for electric bicycle devices includes a tester circuit and a connector. The tester circuit is configured and arranged to test and diagnose operability of at least one electric bicycle device. The connector extends from the tester circuit and is configured and arranged to connect to the electric bicycle device and provide electronic communications between the tester circuit and the electric bicycle device.
    Type: Application
    Filed: October 31, 2006
    Publication date: June 26, 2008
    Applicant: Shimano Inc.
    Inventors: Etsuyoshi Watarai, Kazuhiro Takeda, Haruyuki Takebayashi
  • Patent number: 7392438
    Abstract: An automatic safety test system, which comprises a control interface of a control unit for controlling the switching of a switch in a server unit and automatically switching to a specified testing point of an electronic product, and connects a bus interface of the control unit to a plurality of testing instruments for sending the values measured by the testing instrument at the specified testing point to a communication interface record of the control unit through the bus interface. Therefore, the automatic safety test system of the invention can automatically test every specific safety testing item at each testing point of the electronic product, and thus further achieves the objectives of saving time, manpower and resources.
    Type: Grant
    Filed: November 24, 2004
    Date of Patent: June 24, 2008
    Assignee: FSP Technology Inc.
    Inventor: Jen-Yao Hu
  • Publication number: 20080147347
    Abstract: A method of non-destructive testing includes non-destructively testing an object over a range of test levels, directing coherent light onto the object, directly receiving the coherent light substantially as reflected straight from the object, and capturing the reflected coherent light over the range of test levels as a plurality of digital images of the object. The method also includes calculating differences between pixel values of a plurality of pairs of digital images of the plurality of digital images, and adding the pixel value differences of the plurality of pairs of digital images to yield at least one cumulative differential image.
    Type: Application
    Filed: November 30, 2007
    Publication date: June 19, 2008
    Inventors: Eugene L. Shaw, Forrest S. Wright, David D Malkan
  • Patent number: 7386041
    Abstract: Measurements for an eye diagram of a signal of interest are placed in a data structure that is examined to locate an eye opening of interest. The eye opening of interest is normalized into figure of merit units related to the operational voltage and timing requirements of the data receiver for that signal. The locations within the normalized eye opening may be taken as center locations for trial symmetric shapes that start out small and are enlarged until they first include locations not part of the normalized eye opening. The center of a largest such shape is mapped back into the units of the original eye diagram as optimum sampling parameters for data analysis equipment that uses the receiver to sample the signal once per unit interval to discover logical value. An alternative is to repeatedly remove the ‘outer layer’ of the normalized eye opening until only one location remains.
    Type: Grant
    Filed: February 24, 2005
    Date of Patent: June 10, 2008
    Assignee: Agilent Technologies, Inc.
    Inventor: Richard A Nygaard, Jr.
  • Patent number: 7386411
    Abstract: An exemplary automatic hi-pot test apparatus (20) includes a high voltage supply (21), a transmission device configured for transmitting an electronic device (26) to be tested, a connecting device electrically connected to the high voltage supply and configured for moving and electrically connecting with or electrically disconnecting from the electronic device, a controller (28) for controlling the connecting device and the transmission device, and a detector (27) for detecting the presence of the electronic device. When the detector detects the presence of the electronic device, the detector sends a corresponding detecting signal to the controller, such that the controller stops the electronic device and drives the connecting device to electrically connect with the electronic device whereby a hi-pot test can be performed.
    Type: Grant
    Filed: June 26, 2006
    Date of Patent: June 10, 2008
    Assignees: Innocom Technology (Shenzhen) Co., Ltd., Innolux Display Corp.
    Inventors: Yan-Kai Zhang, Jun-Hua Yang, Yi Wang
  • Publication number: 20080133389
    Abstract: Objects such as manufactured goods or articles, works of art, media such as identity documents, legal documents, financial instruments, transaction cards, other documents, and/or biological tissue are sampled via sequential illumination in various bands of the electromagnetic spectrum, a test response to the illumination is analyzed with respect to reference responses of reference objects. The sequence may be varied. The sequence may define an activation order, a drive level and/or temperature for operating one or more sources. Illumination may be in visible, infrared, ultraviolet, or other portions of the electromagnetic spectrum. Elements of the evaluation system may be remote from one another, for example coupled by a network.
    Type: Application
    Filed: July 31, 2007
    Publication date: June 5, 2008
    Inventors: Brian T. Schowengerdt, Thomas A. Furness, Nicholas E. Walker
  • Patent number: 7382366
    Abstract: Overclocking parameters in a graphics system are automatically set. In one embodiment, in response to a user request, overclocking parameters for different sets of overclocking parameters are tested using a graphical stress test to select optimum overclocking parameters.
    Type: Grant
    Filed: October 21, 2003
    Date of Patent: June 3, 2008
    Assignee: NVIDIA Corporation
    Inventors: Michael M. Klock, Jeffrey M. Smith, Satish D. Salian, Kevin J. Kranzusch
  • Publication number: 20080120064
    Abstract: One embodiment of the present invention provides a system that facilitates high-sensitivity detection of an anomaly in telemetry data from an electronic system using a telemetric impulsional response fingerprint of the telemetry data. During operation, the system applies a sudden impulse step change to one or more operational parameters of the electronic system during operation. Next, the system generates a three-dimensional (3D) telemetric impulsional response fingerprint (TIRF) surface from a dynamic response in the telemetry data to the sudden impulse step change. The system then determines from the 3D TIRF surface whether the telemetry data contains an anomaly.
    Type: Application
    Filed: October 26, 2006
    Publication date: May 22, 2008
    Inventors: Aleksey M. Urmanov, Anton A. Bougaev, Kenny C. Gross
  • Patent number: 7376528
    Abstract: When used as a test data generator, CDR internal structures may be applied to generate drift conditions in the test data. For example, a finite state machine phase shifts a clock signal, over time, driving the test data generator thereby producing a drift condition on the test data. Once the test is completed, one of the other CDRs may be used as a tester to similarly generate test data for the first CDR. CDRs may be configured in pairs for this purpose so that one may be used to test the other.
    Type: Grant
    Filed: April 13, 2004
    Date of Patent: May 20, 2008
    Assignee: Kawasaki LSI U.S.A., Inc.
    Inventor: Jerome J. Ribo
  • Patent number: 7376760
    Abstract: A controller in a computer communicates with multiple data acquisition nodes over a network connection. The controller plugs into a personal computer device that processes received data and generates commands over a network cable extending from the controller to a first data acquisition node. The first data acquisition node couples, via a network cable, to a second data acquisition node. The second data acquisition node optionally couples to yet other data acquisition nodes, and so on in a daisy-chain fashion. Each data acquisition node includes one or more interfaces to corresponding input/output devices associated with the data acquisition node. Based on the interconnection of the controller and the data acquisition nodes, the controller accesses data collected by the data acquisition nodes from corresponding input devices and additionally controls output devices coupled to the data acquisition nodes.
    Type: Grant
    Filed: February 27, 2004
    Date of Patent: May 20, 2008
    Assignee: United Electronic Industries
    Inventors: Olexiy Ivchenko, Denys L. Kraplin
  • Patent number: 7376499
    Abstract: A system and related method for monitoring the state of health of sensors in an integrated vehicle stability control system. In one embodiment, the system determines whether a yaw rate sensor, a lateral acceleration sensor or a hand-wheel angle sensor has failed. The system uses a plurality of models to generate estimates of the outputs of the sensors based on the actual sensor measurements. Residuals are generated as the difference between the measured value and each of the estimates for the particular sensor. The residuals are compared to a threshold to determine whether a fault flag will be set for each residual. The threshold for the hand-wheel angle sensor is an adaptive threshold because it does not have physical redundancy. If the fault flags for the residuals for each sensor have a particular pattern, then a fault is output for that sensor.
    Type: Grant
    Filed: September 16, 2005
    Date of Patent: May 20, 2008
    Assignee: GM Global Technology Operations, Inc.
    Inventors: Mutasim A. Salman, Mark N. Howell
  • Patent number: 7373360
    Abstract: In a method for assigning test numbers, current testflow context information is maintained during the execution of a testflow. If one or more test number factors have been specified for one or more levels of the current testflow context, the test number factors are used to determine a base number for a current test number range. Otherwise, the base number is set to a default base number. Upon execution of a subtest in the testflow, a result of the subtest is assigned a next test number in the current test number range. The following items are then associated in a test number database: 1) an identifier of the subtest, 2) the current testflow context information, 3) the test number, and 4) the base number. When stored in the database, the base number serves as a specification number for its corresponding test number. Also disclosed are other methods and apparatus that use contextual test number factors to assign test numbers.
    Type: Grant
    Filed: May 5, 2004
    Date of Patent: May 13, 2008
    Assignee: Verigy (Singapore) Pte. Ltd.
    Inventors: Robert S. Kolman, Reid Hayhow
  • Patent number: 7373282
    Abstract: A fault severity check and source identification method for a frequency domain instrument accesses acquired reflection data for a transmission line under test. From the acquired data reflection surfaces are isolated as a function of distance. Each reflection surface is examined to produce a frequency response profile and a worst-case reflection response to determine fault severity. The frequency response profile may also be correlated in a pattern recognition algorithm with known reference source profiles to determine the source identification for the fault.
    Type: Grant
    Filed: July 31, 2002
    Date of Patent: May 13, 2008
    Assignee: Tektronix, Inc.
    Inventor: Xiaofen Chen
  • Patent number: 7373279
    Abstract: A network including a bus through which data is transmitted and a plurality of network devices connected to the bus to form the network. In the network, at least one of the network devices performs measurement at timings in a predetermined cycle T and outputs data concerning the measurement result on the bus. Another network device detects the cycle T in which the data concerning the measurement result is output, performs measurement at the timings in the predetermined cycle T, and outputs the measurement result on the bus.
    Type: Grant
    Filed: July 4, 2005
    Date of Patent: May 13, 2008
    Assignee: Murata Manufacturing Co., Ltd.
    Inventors: Toru Ishii, Motoi Nakanishi
  • Patent number: 7373263
    Abstract: A logic analyzer that performs analog-type measurements on digital data includes circuitry in its acquisition system that is programmable to search through acquired data to detect analog-type signal characteristics. In a first embodiment, the logic analyzer includes a graphical user interface employing a drag-and-drop operation to apply one or more selected analog-type measurements to selected portions of the digital data record. In a second embodiment, a user may designate a particular waveform or data listing by means of a mouse-click. Each of the choices of analog-type measurements can be represented by an icon, or text, or both icon and text.
    Type: Grant
    Filed: May 16, 2006
    Date of Patent: May 13, 2008
    Assignee: Tektronix, Inx.
    Inventors: Robert C. Cohn, Susan C. Adam, Mark A. Briscoe, Andrew Loofburrow, Eric E. Thums
  • Patent number: 7370257
    Abstract: A system and method for collecting and analyzing integrated circuit test vehicle test data by identifying various blocks of circuitry through at least two different intersecting test paths. In one embodiment, the process test circuits may be arranged in a matrix format and connected so that they may be tested along rows or columns. When a failure along a specific row and a specific column is identified, the process test circuit at the intersection may be identified as the failure point.
    Type: Grant
    Filed: April 8, 2005
    Date of Patent: May 6, 2008
    Assignee: LSI Logic Corporation
    Inventors: Richard Schultz, Gerald Shipley, Derryl Allman
  • Patent number: 7370317
    Abstract: Mechanisms for automatically generating code that tests capabilities of a test computing system to simulate a message exchange pattern. The code generation computing system uses a message exchange pattern definition to generate the simulation code. For each state in which the message exchange pattern definition allows valid messages to be transmitted, code is generated for that state that at least simulates the transmission of a valid transmission message. For each state in which the message exchange pattern definition allows valid messages to be received, code is generated for that state that simulates the receipt of a valid receipt message. If the transmission or receipt of the message causes a state transition to occur, code is generated that causes the appropriate state transition in the message exchange pattern.
    Type: Grant
    Filed: January 23, 2004
    Date of Patent: May 6, 2008
    Assignee: Microsoft Corporation
    Inventors: Luis Felipe Cabrera, George P. Copeland, Jason Allen