Abstract: Various methods, designs, defect review tools, and systems for determining locations on a wafer to be reviewed during defect review are provided. One computer-implemented method includes acquiring coordinates of defects detected by two or more inspection systems. The defects do not include defects detected on the wafer. The method also includes determining coordinates of the locations on the wafer to be reviewed during the defect review by translating the coordinates of the defects into the coordinates on the wafer such that results of the defect review performed at the locations can be used to determine if the defects cause systematic defects on the wafer.

Abstract: A mechanism uses in-situ bidirectional cable wrapping for determining different cable lengths. A calibration mechanism calibrates the high speed transmitter/receiver pair characteristics, and, thus, optimizes the transmission performance between subsystems. The calibration mechanism mitigates the need for frequent error correction and does not incur the performance degradation associated with error correction techniques.

Abstract: Provided are a method, a test system and a microcontroller (40), for use in a test system for testing vehicles and automotive components. Control signals that are generated by active components within a vehicle during a test drive are sampled and played back to a specimen vehicle within a laboratory test environment, and the control signals are played back synchronously with data representing conditions and events such as loads, acceleration and displacements that are experienced during the test drive. A microcontroller (40) is provided to buffer control signal data and to synchronize playback of the control signals via a CAN (60) bus within the specimen test vehicle in response to trigger signals.

Abstract: There is provided a system for testing an electronic device in a test arrangement. The test arrangement includes a data interface and a user interface that is configured to output user outputs comprising image and/or audio information. The exemplary system comprises an automation unit configured to be connected via a data connection to the data interface. The user outputs are provided as output via the data interface and can be transmitted via the data connection to the automation unit. The automation unit is configured to carry out an evaluation of the user outputs.

Abstract: The invention provides a system and method for testing samples and, in one embodiment, a system for directing and coordinating the operations of hardware components and performance of tasks of laboratory personnel. The system includes a user interface for receiving requests from one or more users. Each request comprises a list of one or more samples to be tested and specifies one or more tests to be conducted on each sample. The system also includes a sample preparation station for maintaining a library of all received samples and creating a sublibrary of samples based on the test(s) to be conducted. The system directs hardware components and laboratory personnel (collectively, laboratory resources) to conduct the requested tests and reports test results to the user(s) who have requested the test(s).

Abstract: A housing or housing part (2) for a sanitary product dispenser that can be fastened to a wall, comprising: A) a front (3) comprising a monitor (4), wherein B) the housing part (2) can be detachably fastened to a sanitary product dispenser, C) a microprocessor (10) is attached to the housing part (2), D) the housing part (2) comprises a probe (15), which emits electromagnetic or acoustic waves in a direction outside the housing part (2) and/or receives such waves from the outside and based on the emitted and/or received electromagnetic or acoustic waves transmits signals to the microprocessor (10), and wherein E) the microprocessor (10) is programmed in order to determine the presence of a user in the vicinity of the housing part (2) from the signals transmitted by the probe (15) to the microprocessor (10) and as a result switch on the monitor (4).

Abstract: A method and apparatus for remotely verifying the calibration status of a diagnostic instrument, for example, following remote installation of a software upgrade on the instrument. In one example, a method of verifying the calibration status of the instrument, includes retrieving stored raw calibration test data generated during a previously-performed calibration of the instrument, processing the raw calibration test data to generate a diagnostic reading, comparing the diagnostic reading to a known nominal reading, and based on the comparison, generating an output indicative of the calibration status of the instrument. In one example, the method is performed without contemporaneously measuring a calibration object with the instrument and therefore, without activating the measurement head or measurement optics of the instrument.

Abstract: Apparatus for testing a conducted energy weapon includes analyzer means to produce characteristic signals representative of characteristics of electrical current pulses delivered by the weapon into a resistive load when the weapon is discharged. Risk estimation means responsive to the characteristic signals produces a risk estimate representative of a risk of injury to a targeted subject due to electrical stimulation, or alternatively representative of a risk of failure to incapacitate the targeted subject. Indicator means responsive to the risk estimate indicates the risk of injury, or alternatively the risk of failure to incapacitate, and warns the user of the apparatus when the risk exceeds a predetermined threshold.

Abstract: The invention relates to an operating device for testing torque wrenches with a data storage. A carrier is provided for fixing a torque wrench to be tested. A transducer is arranged at the carrier and coupled to the head portion of the torque wrench to be tested. A grip holder arranged on the carrier fixes the grip of the torque wrench to be tested. A deflecting mechanism generates a torque on the head portion of the torque wrench to be tested. A communication unit is coupled to the data storage of the torque wrench for data exchange.

Abstract: A probe substrate for use in testing semiconductor devices can include a base substrate that can have first electrical terminals at a first pitch. One or more redistribution layers on the base substrate can include droplets of a conductive material that form redistribution traces extending from the first terminals to second electrical terminals at a second pitch different from the first pitch.

Abstract: A system and method for wireharness testing includes at least one probe attachable to a connector of a wireharness, the at least one probe in wireless communication with a controller to identify a potential lack of continuity in the wireharness therebetween.

Abstract: Systems and methods are provided for prioritizing the processing of standardized tests. One aspect of the present subject matter relates to a method for processing completed standardized tests. In one embodiment, test-processing priority information is received, and is associated with machine-readable identifiers for standardized tests. Completed standardized tests are received, and are identified by reading machine-readable identifiers. The identified standardized tests are processed according to the associated test-processing priority information such that higher priority tests are automatically processed before lower priority tests. Other aspects are provided herein.

Abstract: An apparatus (130) including an integrated circuit (200 200a) and at least one coupler (302a 302b) for electromagnetically coupling the integrated circuit (200 200a) to a conductor (323a 323b), which may be man-made or naturally occurring, such as in a human or non-human animal. The coupling is electromagnetic, i.e. indirect, and not a result of a mechanical attachment, but instead via an electromagnetic field (or only an electric or magnetic component). The conductor (323a 323b) may be suitable for conveying electronic or spintronic or optical signals, and the coupling is more specifically a coupling to the fields associated with such signals. The integrated circuit/chip (200 200a) can be electrical, optical, optoelectronic, or quantum, and can be of ordinary scale or nanoscale, and can make use of spintronic devices. A connector (100 100a) including such an apparatus (130) is also provided.

Abstract: According to an aspect of the invention, a diagnostic apparatus which diagnoses a state of the fuel cell includes an operation device which is used for operating the fuel cell; an operational state detecting portion which detects a change in an operational state of the fuel cell; a device control portion which controls the operation device such that the fuel cell is operated according to at least one predetermined operation pattern; and a diagnostic portion which diagnoses the state of the fuel cell based on the change in the operational state of the fuel cell that is detected by the change in the operational state detecting portion when the fuel cell is operated by the device control portion according to the at least one predetermined operation pattern, and the at least one predetermined operation pattern.

Abstract: A system is used to test whether a device works normally in a preset frequency range. The system presets a frequency range, and controls a frequency generator to send a test frequency signal to the device according to each of a predetermined number of frequencies of the frequency range, and tests whether the device and electronic parts of the device can work normally to obtain test results.

Abstract: A system and method for verifying system-on-chip interconnect includes a first linear feedback shift register coupled to an output interface of a first system-on-chip component, a second linear feedback shift register instantiated in a second system-on-chip component, and a comparator coupled to the second linear feedback shift register and the input interface of the second system-on-chip. Another method for verifying includes generating a pseudo-random number sequence with the first linear feedback shift register and the second linear feedback shift register using an identical first initial state, and comparing an output of the first linear feedback shift register with an output of the second linear feedback shift register and reporting a miss-compare.

Abstract: A diagnostic test sequence optimizer includes a diagnostic test selector that determines a group of diagnostic test procedures related to a specific symptom and vehicle type from a pool of diagnostic procedures. A failure mode analyzer then selects one or more factors that can affect resolution of a vehicle operational problem and performs a failure mode analysis to quantify a comparative utility of the individual tests, and a factor weighter assigns a weight to each of the factors. A vehicle receiver receives information regarding the history of the test subject vehicle, and a sequence optimizer places the diagnostic test procedures in an optimized sequence in accordance with the comparative utilities of the individual diagnostic procedures, user preferences and a Failure Mode and Effects Analysis compiled by the manufacturer of the vehicle.

Abstract: A method of testing and installing a remote control unit (RCU) for controlling elements (ACT1, ACT2, ACT3) of a home automation network, intended for managing the security or heat or light comfort in a building, comprising the use of software (ALS) emulating the remote control unit in a computer (PCU) to define a virtual remote control unit (VRCU), and the configuring of the virtual remote control unit to enable the elements of the network to be controlled, wherein sending rights are assigned to the virtual remote control unit at the time of that configuration and wherein the cancellation of these sending rights results at least from a step for copying the configuration (CFG) of the virtual remote control unit in the remote control unit.

Abstract: A memory daughter card (MDC) is described, having a very high-speed serial interface and an on-card MDC test engine that allows one MDC to be directly connected to another MDC for testing purposes. In some embodiments, a control interface allows the test engine to be programmed and controlled by a test controller on a test fixture that allows simultaneous testing of a single MDC or one or more pairs of MDCs, one MDC in a pair (e.g., the “golden” MDC) testing the other MDC of that pair. Other methods are also described, wherein one MDC executes a series of reads and writes and other commands to another MDC to test at least some of the other card's functions, or wherein one port executes a series of test commands to another port on the same MDC to test at least some of the card's functions.

Abstract: An aspect of the present invention enables a tester (person) to specify multiple test cases of interest to test a display controller, and executes the test cases in a batch mode to cause the display controller to generate corresponding video output. The tester is provided the ability to specify whether the displayed video output corresponding to each executed test case is of desired quality or not. Due to such a combination of features, testing of the display controller may be simplified, efficient and reliable as well.

Abstract: Provided is a method and system for testing a DUT. The system includes a plurality of testing devices for interacting with the DUT and conducting a plurality of different tests on the DUT, and a computer-readable memory for storing computer-executable instructions defining the plurality of tests to be conducted by the testing device on the DUT. A scheduler component designates at least a first test and a second test from the plurality of tests to be conducted on the DUT in parallel, wherein said designating is based at least in part on content of the computer-executable instructions defining the first test and the second test. And a controller initiates the first test and the second test to be conducted in parallel and initiating at least a third test sequentially relative to at least one of the first and second tests.

Abstract: An internal precision oscillator (IPO) is trimmed within a microcontroller integrated circuit. The microcontroller integrated circuit receives a test program into flash memory on the microcontroller integrated circuit from a tester. The microcontroller integrated circuit also receives a reference signal from the tester. The IPO generates a clock signal having a frequency that depends upon a trim value. A general purpose timer on the microcontroller integrated circuit counts the number of cycles of the clock signal during a time period defined by the reference signal and outputs a digital value. A processor on the microcontroller integrated circuit executes the test program, reads the digital output, and adjusts the trim value such that the frequency of the clock signal is calibrated with respect to the reference signal. Test-time on the tester is reduced because the decision making during the frequency trimming process is made by the processor instead of the tester.

Abstract: An integrated circuit for controlling a DC motor is disclosed. The integrated circuit includes at least one digital position and speed circuit (DPS) for providing measurements of speed, position, and direction of the motor, the DPS being in signal communication with the motor for receiving a pair of signals having a quadrature relationship; and at least one programmable gain amplifier (PGA) electrically coupled to the motor, the PGA being configured to receive a feedback signal indicative of current flowing through the motor and to apply a second signal to the motor for adjusting the speed of the motor; and at least two analog-to-digital converters (A/D), one A/D being used to quantize the output of the PGA for an off-chip processor; and another A/D to provide motor reference position from an analog sensor, such as a potentiometer; and at least two digital-to-analog converters (D/A), one D/A used to set the motor voltage; and another D/A used to set the motor current limit.

Abstract: Stability of a control system for a materials testing system using specified filter parameters is confirmed by inputting to the control system a test signal having a predetermined waveform, automatically monitoring the output of the materials testing system, and automatically comparing the output to a threshold. If the output exceeds the threshold, a first action is taken. If the output does not exceed the threshold, input of a command signal to the control system is permitted.

Abstract: A GPS module test system for automatically calibrating a test signal includes a GPS test fixture, a satellite signal simulator, and a computer. The GPS test fixture carries a GPS module under test and is electrically connected to the same through contact, so as to receive a digital signal generated by the GPS module after the test. The computer receives device information of the GPS module under test through the GPS test fixture, and controls the satellite signal simulator through a GPS signal sample database, so as to generate a GPS analog signal to test the GPS module under test. Thereafter, on receiving the digital signal generated by the GPS module under test and determining the received digital signal is attenuated, the computer automatically gains a transmitted test parameter, so as to transmit the GPS analog signal in a preferable state.

Abstract: In Internal Analysis Space analysis, assuming that no structural body and the like are placed outside of a conversion surface, an electromagnetic field distribution u0 inside of a conversion surface, on a conversion surface, and close to the outside of the conversion surface is found. In External Analysis Space analysis, on the assumption that there exists a structural body and the like outside of the conversion surface, an entire electromagnetic field distribution u is found. At this time, for the inside of the closed surface, an electric field distribution, where a differential electromagnetic field distribution e between electromagnetic field distribution u0 and electromagnetic field distribution u on the closed surface is a wave source, is found. Also at this time, for the outside of the closed surface, an electromagnetic field distribution, obtained by synthesizing electromagnetic field distribution u0 and electromagnetic field distribution e on the closed surface is found.

Abstract: Some of the embodiments of the present disclosure provide a method for analyzing a substance, where the method includes subjecting the substance to a dynamic excitation to produce an observable response, and determining a characteristic quantity of the substance based on a correlation between the excitation and the response. The correlation between the excitation and the response is expressed by a parametric model for which a specific model structure with a finite number of unspecified parameters is preset. The determining a characteristic quantity of the substance includes calculating the parameters of the model from values of the excitation and the response in a time domain, determining from the calculated parameters a transfer function in a frequency range, and calculating the characteristic quantity directly from the transfer function. Other embodiments are also described and claimed.

Abstract: In a method to control the image acquisition and/or image evaluation at an image acquisition device, a measurement program of a measurement program package has at least one protocol step for measurement data acquisition according to a measurement protocol is used to operate the image acquisition device. At least one action element associated with the measurement program or at least one step is provided that causes an external, auxiliary program to be executed automatically upon occurrence of a trigger event in the measurement program or in the associated step.

Abstract: According to one embodiment, a benchmarking system comprises a processor and a multi-threaded load generator. The multi-threaded load generator uses events for managing processing by the threads. The load generator utilizes a thread for spinning and using a CPU cycle counter to determine time for issuing loads to a system under test in accordance with a defined workload.

Abstract: A method and an apparatus for evaluating SDDC of a test pattern set are disclosed. In one embodiment, the method includes: (1) selecting a transition fault of an IC detected by a test pattern set, the transition fault occurring at a fault site of the IC, (2) identifying path delays of a longest testable path and a longest tested path of the IC, wherein both the longest testable path and the longest tested path include the fault site, (3) determining a SDD detection probability for both the longest testable path and the longest tested path based on a probability that a SDD will be detected if present at the fault site and (4) calculating SDDC for the transition fault by dividing the SDD detection probability of the longest tested path by the SDD detection probability of the longest testable path.

Abstract: Systems and methods for development testing of vehicles and components are disclosed. In one embodiment, a system includes a position reference system and a command and control architecture. The position reference system is configured to repetitively measure one or more position and motion characteristics of one or more vehicles operating within a control volume. The command and control architecture is configured to receive the repetitively measured characteristics from the position reference system, and to determine corresponding control signals based thereon. The control signals are then transmitted to the one or more vehicles to control at least one of position, movement, and stabilization of the one or more vehicles in a closed-loop feedback manner. The system may further include a health monitoring component configured to monitor health conditions of the one or more vehicles, the control signals being determined at least in part on the health conditions.

Abstract: A sensor includes an electronic module that comprises several electronic subassemblies and a processor that can be electrically coupled to the electronic subassemblies. The subassemblies respectively feature a programmable storage device with subassembly-specific data of the respective subassembly. The content of the respective programmable storage devices can be read out and evaluated by the processor.

Abstract: The present invention is directed to a sensor for use in automation technology for detecting a measurand, particularly for detecting objects or articles, and a method for configuring a sensor.

Abstract: A system and method for enhanced diagnostic fault detection and isolation is provided, wherein COTS/MOTS subsystems of a system under test are evaluated in a hierarchical manner providing improved test coverage and a reduction in ambiguity group size. The enhanced diagnostic fault detection and isolation method may proceed from automatic built-in-test to initiated built-in-test and finally to manual tests. At each stage of the testing, results may be evaluated to determine which, if any, components need replacing. The diagnostic system may report the results of testing in a fault log and/or a look-up table structure. The systems and methods of the present invention are suited to testing systems that incorporate COTS or MOTS subsystem components, and for use with an interactive electronic technical manual (IETM). Further, the diagnostic system is adaptable to a variety of subsystem interface protocols.

Abstract: A test apparatus that tests a device under test is provided, including a driver section that supplies a test signal to a corresponding pin of the device under test, a judgment section that makes a judgment concerning pass/fail of the device under test based on the response signal output by the device under test in response to the test signal, a voltage measuring section that detects a DC voltage of the signal output by the driver section, and an output side adjusting section that adjusts a duty ratio of the signal output by the driver section according to the DC voltage detected by the voltage measuring section.

Abstract: A system and method are provided for graphically actuating a trigger in a test and measurement device. The method includes displaying a visual representation of signal properties for one or more time-varying signals. A graphical user input is received, in which a portion of the visual representation is designated. The method further includes configuring a trigger of the test and measurement device in response to the graphical user input, by setting a value for a trigger parameter of the trigger. The set value for the trigger parameters varies with and is dependent upon the particular portion of the visual representation that is designated by the graphical user input. The trigger is then employed in connection with subsequent monitoring of signals within the test and measurement device.

Abstract: The test apparatus includes a first comparator and a second comparator that measure a measured signal output from the device under test at a given sampling clock timing, a deciding section that decides a quality of the device under test on the basis of a measurement result in the first comparator and the second comparator, a control section that causes the first comparator and the second comparator to input an adjustment signal having a previously injected jitter and respectively sample the input signal, a skew computing section that computes a skew between the first comparator and the second comparator on the basis of sampling results, and a phase adjusting section that adjusts a phase of at least any one of the measured signal and the sampling clock in at least any one of the first comparator and the second comparator on the basis of the skew.

Abstract: A system that incorporates teachings of the present disclosure may include, for example, an apparatus for testing having a controller to perform test case conflict resolution by comparing an execution descriptor to one or more platform descriptors. The execution descriptor can have one or more platforms to be tested, each platform comprising at least one among one or more bases, one or more modules, and combinations thereof. Each of the one or more platform descriptors can have one or more test cases and a description of one or more platform limitations for executing the one or more test cases. Additional embodiments are disclosed.

Abstract: Two robotic arms roam in separate, non-overlapping areas of a test station, avoiding collisions. A traveling buffer moves along x-tracks between a front position and a back position. In the front position, a first robotic arm loads IC chips from an input tray or stacker into buffer cavities in the traveling buffer. The traveling buffer then moves along the x-tracks to the back position, where a second robotic arm moves chips from the traveling buffer to test boards for testing. After testing, the second robotic arm moves chips to a second traveling buffer, which then moves along tracks to a front position for unloading by the first robotic arm. Two traveling buffers may move on the same tracks in a loop. The buffer cavities in the traveling buffer move on internal tracks to expand and contract spacing and pitch between the front and back positions to match test-board pitch.

Abstract: Embodiments of the present invention provide a method for generating write and read commands used to test hardware device models. The method is able to generate multiple write commands to a location without having to generate intervening read commands to validate the data. In addition, the method enables read commands to be generated in a different sequence from the sequence of generated write commands, having different sizes than the sizes of the write commands, and that maximize the amount of data read (verified) and minimize the amount of unnecessary reads (re-verification).

Abstract: A system that utilizes wireless devices as guard tour checkpoint data collection and checkpoint data communication devices is disclosed. The wireless devices have the capability of reading various types of checkpoints and communicating the collected checkpoint data with a computer via a cellular telephone communication system and either a land-based telephone network or the Internet or a cellular data communication device. Alternatively, a Wi-Fi network or the Wi-Fi network and the Internet can be used to communicate collected checkpoint data with the computer. The computer stores and processes the data according to guard tour expected performance parameters, such as rules, schedules, and exceptions, and then generates the necessary commands to produce exception notifications and reports at various types of peripheral equipment.

Abstract: Systems and methods are disclosed for a self-testing power management unit (PMU) in an electronic device. Self-testing may enable the testing of PMU power supply outputs while reducing the need for test points to conserve circuit board real estate. In one embodiment, a PMU is placed in self-test mode, and a test controller may perform capacitance tests on each power supply output. Once the capacitance test has been performed on each power supply output, the PMU may be placed in normal operating mode, and voltage tests may be performed on each power rail. Once voltage tests have been performed on all power rails in the PMU, the self-test may be complete. In some embodiments, the test controller may communicate with a test multiplexer to select the power supply output for testing. Further, the measurements resulting from the capacitance and voltage tests may be converted to a digital signal through an analog-to-digital converter on the PMU.

Abstract: There is implemented an instrument check system for storing check data of an instrument for a long period of time in an instrument body in a stylized format. The instrument check system comprises an instrument provided with an AD converter for converting a voltage value applied to an input terminal into a digital value, a checking PC connected to the instrument so as to communicate with the instrument, a voltage generation unit for applying a checking voltage value to the input terminal, a check data storage unit formed in the instrument, wherein the checking PC comprises an input check means for acquiring data that is converted from the voltage value into the digital value by the AD converter upon giving an instruction to the voltage generation unit, and storing the data in the check data storage unit.

Abstract: The present invention discloses an inquiry system having a database, a testing module, and a memory unit built in a power bank. The testing module and the database conduct an information exchange with a computer through the memory unit, such that consumers can obtain specification and teaching content related data of the power bank by using the computer, and further perform a battery function test to the connected power bank.

Abstract: A simulated battery test device and method that is capable of testing a battery charging circuit and logic circuit to determine proper operation. An operational amplifier is used that can both source and sink current to simulate the operation of the battery. A battery low signal can be generated using the simulated battery test device to test a battery charging circuit and logic circuit in a battery low condition. In addition, a battery open signal can be generated to test the battery charging and logic circuit in a battery open condition. Charging currents are detected to determine if currents fall within an acceptable range.

Abstract: The invention is an apparatus and method including hardware and software, which allows collecting and analyzing data to obtain information about mechanical properties of soft materials in a much faster way. The apparatus can be used as a stand-alone device or an add-on to the existing AFM device. The apparatus allows collecting dynamical measurements using a set of multiple frequencies of interest at once, in one measurement instead of sequential, one frequency in a time, measurements.

Abstract: The invention refers to a computer implemented method, a computer system a test machine and a computer program product for executing conditioned and qualified test. An ordering instance may order a set of tests, comprising an initial test and a set of follow-up tests, wherein the execution of each of the follow-up tests is dependent of the result of the respective predecessor test, like the initial test. The conditions for executing the follow-up tests are dynamically definable and are analyzed automatically.

Abstract: A system and method is disclosed for assessing a probability of failure of operation of a semiconductor wafer. The method includes inputting risk factor data into a memory and inputting a plurality of wafers into a semiconductor fabrication manufacturing process. A subset of wafers is select to obtain a sample population and at least one region of each wafer of the sample population is inspected. Circuit design data associated with each wafer of the sample population is obtained and one or more defects that present an increased risk to the operation of a particular wafer are identified. The identification is a function of the risk factor data, the inspecting step and the circuit design data. A probability of semiconductor wafer failure is calculated.

Abstract: A setting information management method executed by a backup program stored in a portable storage medium by a processing computer of an analyzer, comprising: determining a type of the analyzer in which the backup program is executed from a plurality of types of analyzers; acquiring setting information of a program introduced to the processing computer based on the determination result; and storing the acquired setting information in the portable storage medium. A setting information management system, a setting information management device, and a computer program product is also disclosed.

Abstract: Some demonstrative embodiments of the invention may include, for example, devices, systems and methods of performing functional verification of a hardware design. In some demonstrative embodiments, a test generator may include a transaction generator to automatically generate a plurality of manipulated transactions by manipulating one or more test case transactions resulting from a constraint-satisfaction-problem.