Abstract: A computer-implemented method for simulating an electrical circuit. The method includes (a) setting a first temperature distribution in the electrical circuit, (b) performing an electrical simulation across the electrical circuit taking into consideration the first temperature distribution, (c) performing a thermal simulation across the electrical circuit taking into consideration a result of the electrical simulation, to obtain a second temperature distribution, and (d) determining whether a criterion for termination the simulation is met. If the criterion is met, terminate the simulation. If the criterion is not met, assign the second temperature distribution to the first temperature distribution, and repeat steps (b), (c), and (d).

Abstract: A system and method of accelerating sparse matrix operations in full accuracy simulation of a circuit includes determining repetitive blocks of the circuit, determining a set of values of a current block, determining whether the state of the current block is sufficiently close to the state of a stored block solution when the corresponding values are within a predetermined error range, and performing a reduced computation using the stored block solution to provide a solution for the current block when the states are sufficiently close to each other. The reduced computation includes retrieving previously stored solutions and performing substantially simplified matrix and vector operations while maintaining accuracy of the solution. Reduced precision versions of the values may be used to generate a hash index used to store the block solutions. Stored redundant device information may also be used to simplify device solutions in a similar manner.

Abstract: For multicore power performance management, a first core has a first architecture and is designed for a first voltage-frequency domain. A second core has the first architecture and that is designed for a second voltage-frequency domain.

Abstract: Various embodiments include computer-implemented methods, computer program products and systems for generating an integrated circuit (IC) library for use in a scatterometry analysis. In some cases, approaches include: obtaining chip design data about at least one IC chip; obtaining user input data about the at least one IC chip; and running an IC library defining program using the chip design data in its original format and the user input data in its original format, the running of the IC library defining program including: determining a process variation for the at least one IC chip based upon the chip design data and the user input data; converting the process variation into shape variation data; and providing the shape variation data in a text format to a scatterometry modeling program for use in the scatterometry analysis.

Abstract: A method and apparatus for verifying and debugging a circuit design module of a high level programming system is disclosed herein. A circuit design created in a high level programming environment must undergo a number of transformations as it is compiled into a form that can be realized in hardware. At each transformative step, the behavior of the circuit must be verified with a simulation model and debugged if the transformation has changed the behavior of the circuit. The claimed invention presents a novel approach for verifying and debugging between different simulation models and achieves an advance in the art by utilizing the modularized structure of a high-level circuit design to systematically identify simulation mismatches among different simulation models and determine which portions of the circuit design are responsible for the discrepancy.

Abstract: A method for simulating an arc flash event on an electrical power system is disclosed. The virtual system model of the electrical system is modified to introduce a short circuiting feature. The standard to supply equations used in the arc flash event calculations is chosen. The arc flash event is simulated using the modified virtual system model in accordance with the chosen standard. The quantity of arc energy released by the arc flash event is calculated using results from the simulation. The report that forecasts an aspect of the arc flash event is communicated.

Abstract: In a fast simulation technique, the output node of a power supply module of the integrated circuit can be designated as an ideal power node. At this point, the power supply module can be designated a fan-in block and any blocks connected to the power node can be designated fan-out blocks. Then, DC initialization and transient simulation for each time step can be performed for the circuit. During the transient simulation, any inter-relationship of the fan-out blocks can be determined and a sensitivity model can be calculated for each fan-out block. Because the power node is designated as an ideal power node, the results of the sensitivity model for each fan-out block can be added asynchronously to a total loadings of the power node. The total loadings can be loaded into a matrix, which is computed for the fan-in block, and a simulation waveform point can be output.

Abstract: An energy-aware backfill scheduling method combines overestimation of job run-times and processor adjustments, such as dynamic voltage and frequency scaling, to balance overall schedule performance and energy consumption. Accordingly, some scheduled jobs are executed in a manner reducing energy consumption. A computer-implemented method comprises identifying job performance data for a plurality of representative jobs and running a simulation of backfill-based job scheduling of the jobs at various combinations of run-time over-estimation values and processor adjustment values. The simulation generates data including energy consumption and job delay. The method further identifies one of the combinations of values that optimizes the mathematical product of an energy consumption parameter and a job delay parameter using the simulation generated data for the plurality of jobs.

Abstract: A machining-related data processing system has a configuration in which a controller for machine tool comprising an NC device and an assisting device is connected to a data processing device via a telecommunication line.

Abstract: An approach for methodology enabling a verification of IC designs that compensates for degraded performance due to a physical placement, particularly a stacked physical placement is disclosed. A set of stacked devices from a plurality of devices in an IC design is determined. One or more instance parameters indicating a physical placement of a device in the set is determined. A compensation metric indicating one or more electrical characteristics of a device in the set is determined based on the one or more instance parameters.

Abstract: Methods for generating waveforms with realistic transitions, controllable timing jitter, and controllable amplitude noise in a computer-based simulation environment are disclosed. A first method includes obtaining signal information for one or more parallel data signals. In one embodiment, signal information for the one or more parallel data signals is mapped from an HDL format to a new time scale, and during this operation, timing jitter is added independently to the parallel data signals. These jittery parallel data signals may then be returned to the original HDL format, or another format, for simulation. In another embodiment, rather than mapping to a single time vector, information from each signal is modified to have a time scale commensurate with noise and jitter to be added. Timing jitter is superimposed onto each transition, rise and fall times are incorporated, and missing voltage and timing information for each data signal is interpolated into vectors representing the signals.

Abstract: Methods and systems perform a simulation on an integrated circuit design by applying a first value to a first variable and a second value to a second variable of the simulation to produce a first matrix corner simulation value. The methods and systems repeat the simulation using different values for the first and said second variables to produce a second matrix corner simulation value, a third matrix corner simulation value, and a fourth matrix corner simulation value. The methods and systems create a matrix, and the matrix has the first matrix corner simulation value, the second matrix corner simulation value, the third matrix corner simulation value, and the fourth matrix corner simulation value. The methods and systems interpolate all remaining values within the matrix based upon existing simulation values within the matrix.

Abstract: Methods, system and computer program products are disclosed for providing a graphical modeling environment in which a graphical model is generated and executed. In the graphical modeling environment, elements are provided to define or describe signals associated with resources that are coupled to the graphical modeling environment. The high-level signal definition or description elements define or describe the signals associated with the resources regardless of the hardware of the resources. With the use of high-level signal definition or description elements, the users have the capability to deal with the signals transmitted to/from the resources without the specific knowledge of the hardware of the resources.

Abstract: Techniques for monitoring and predicting environmental operating conditions in a data center are provided. In one aspect, a method for real-time, three-dimensional analysis of environmental operating conditions in a data center includes the following steps. High spatial resolution three-dimensional measurements of one or more environmental variables in the data center made at a time t1 are obtained. Real-time measurements of the environmental variables in the data center made at a time t2, wherein t2 is later in time than t1, are obtained. The high spatial resolution three-dimensional measurements are combined with the real-time measurements to derive a model for the environmental variables in the data center at the time t2. The model is used to predict three-dimensional distributions of the environmental variables in the data center at the time t2. A base model can be created and used to derive the model for the data center at the time t2.

Abstract: In one embodiment, a plurality of kernels are provided. Each kernel may simulate a partition of a design under test. A plurality of event regions are provided. The regions may be in an ordered priority. Events for the device under test may be determined for event regions in each of the kernels. An event region to execute events in is then determined and all kernels may execute events in the same event region. Kernels then execute events for the determined event region. When finished executing events in an event queue, data synchronization may occur. In this case, information may be synced among kernels, such as status and state values for shared objected are synchronized.

Abstract: In one embodiment, the invention is a method and apparatus for table-lookup-based models for yield analysis acceleration. One embodiment of a method for statistically evaluating a design of an integrated circuit includes simulating the integrated circuit and generating a lookup table for use in the simulating, the lookup table comprising one or more blocks that specify a device element for an associated bias voltage, wherein the generating comprises generating only those of the one or more blocks that specify the device element for a bias voltage that is required during the simulating.

Abstract: An analysis apparatus for a printed circuit board. The analysis apparatus includes a processor that executes a process of rewriting physical property data of a wiring layer of a printed circuit board to a value. The value is based on physical property data of an electronic part having a heat-generating attribute. The electronic part is mounted on the portion of the wiring layer. The analysis apparatus converts the physical property data of the portion of the wiring layer that has the electronic part to physical property data of an insulating layer of the printed circuit board.

Abstract: A web simulator includes a sensor database, an account database that stores access authorization table, an authentication processing unit that specifies access authorization of an access by reference to the access authorization table, a sensor registration and update unit that registers/updates sensor information in the sensor database in accordance with an instruction of access, and a simulation execution unit that executes simulation of a connection circuit in which a sensor indicated by the registered/updated sensor information and a semiconductor device having an analog front-end circuit are connected.

Abstract: A system, method and SPICE model evaluation module executable on a many-core processor. In one embodiment, the module includes: (1) a setup module operable to generate topology matrices T1 and T2, (2) a device evaluation/update module associated with the setup module and operable to generate and update source elements SA for a matrix A and Sb for a right-hand-side vector b and (3) a generation module associated with the device evaluation/update module and operable to generate A using T1 and SA and further generate b using T2 and Sb.

Abstract: Aspects of the invention relate to techniques for modeling content-addressable memory for emulation. An emulation device according to various embodiments of the invention comprises one or more memory modeling blocks reconfigurable to emulate a content-addressable memory or a random-access memory. The emulation device may be processor-based or FPGA-based. Each of the one or more memory modeling blocks comprises memory circuitry and a dedicated comparison unit configured to compare a search word or a portion of a search word received by the each of the one or more memory modeling blocks with data stored in the memory circuitry. The comparison unit may comprise a comparator and a register coupled to the comparator and configured to store matching data. The matching data may be unencoded matching data. A plurality of the memory modeling blocks may be programmable to emulate a single content-addressable memory.

Abstract: A system, method, and computer program product are provided for creating a hardware design. In use, one or more parameters are received, where at least one of the parameters corresponds to an interface protocol. Additionally, a data flow is constructed based on the one or more parameters. Further, an indication of one or more control constructs is received, where a hardware design is capable of being created, utilizing the constructed data flow and the one or more control constructs.

Abstract: An apparatus and method for detecting memory access violations in simulations is disclosed herein. A detection tool is designed to automatically perform a violation check for each memory read or write operation simulated in a modeled system. The detection tool is capable of handling a modeled system including one or more memories and/or one or more processors.

Abstract: Methods determine temperature and voltage relationships for integrated circuit library elements to produce a continuous temperature-voltage function. Some of the library elements can be used or combined to form an integrated circuit design. Further, the performance characteristics for integrated circuit chips produced according to the integrated circuit design can be defined, such performance characteristics include an operating temperature range, etc. The continuous temperature-voltage function is applied to the performance characteristics to determine a plurality of temperature/voltage combinations for the integrated circuit chips. Each of the temperature/voltage combinations comprises an operating voltage for each operating temperature within the operating temperature range of the integrated circuit chips. Next, the integrated circuit chips are produced according to the integrated circuit design. The temperature/voltage combinations are recorded in memory of the integrated circuit chips.

Abstract: A system and method for designing integrated circuits and predicting current mismatch in a metal oxide semiconductor (MOS) array. A first subset of cells in the MOS array is selected and current measured for each of these cells. Standard deviation of current for each cell in the first subset of cells is determined with respect to current of a reference cell. Standard deviation of local variation can be determined using the determined standard deviation of current for one or more cells in the first subset. Standard deviations of variation induced by, for example, poly density gradient effects, in the x and/or y direction of the array can then be determined and current mismatch for any cell in the array determined therefrom.

Abstract: A non-transitory, computer-readable recording medium stores therein a verification support program that causes a computer to execute identifying from a finite state machine model related to a circuit-under-test, an input count of transitions to a transition-end state and an output count of transitions from the transition-end state; determining the transition-end state to be a record/restore subject, if the identified output transition>the identified input transition count; embedding record-instruction information causing the record/restore subject to be recorded to a database, if a first element causing transition to the record/restore subject is included in a first test scenario that is in a test scenario group related to the circuit-under-test; and embedding restore-instruction information causing the record-restore subject to be restored from the database, if a second element causing transition to the record-restore subject is included in a series of elements making up a second test scenario that is in

Abstract: Systems and methods for process aware metrology are provided. One method includes selecting nominal values and one or more different values of process parameters for one or more process steps used to form the structure on the wafer, simulating one or more characteristics of the structure that would be formed on the wafer using the nominal values, and determining parameterization of the optical model based on how the one or more characteristics of the structure vary between at least two of the nominal values and the one or more different values.

Abstract: An executable circuit design is used to generate waveforms, from which behaviors of the circuit are captured. The behaviors and various combinations thereof can then be saved in a database, along with descriptions and other metadata about them, thereby generating a behavioral index of the circuit design code. Behavioral indexing of circuit designs allows a user to maintain an indexed behavior database, track changes in behaviors as the circuit design's executable description evolves, and figure out how the executable description can be reused in different projects. When applied to digital design development, it facilities the current design and verification effort, as well as design reuse down the line.

Abstract: A computer-implemented method for verifying a model in a product lifecycle management (PLM) system includes defining a model and an envelope of allowable model states and, based on one or more requirements, deriving at least one counterexample objective. The method also includes optimizing a set of parameters related to the allowable model states and the allowable model context, redefining at least one of the model and the allowable model states when the at least one counterexample objective is outside of a specified tolerance, and, after a predefined number of iterations, defining the model as verified.

Abstract: One particular implementation takes the form of an apparatus or method for parallelizing a sequential power simulation of an integrated circuit device. The implementation may temporally divide the simulation so that separate time segments of the simulation can be run at the same time, thereby reducing he required time necessary to perform the power simulation. More particularly, a logic simulation may be performed on the integrated circuit and snapshots of the logic devices of the integrated circuit may be taken at a specified period. The separate time segments of the simulation may then be simulated in a parallel manner to simulate power consumption of the integrated circuit. Performing the power simulation on the separate time segments may reduce the required time of a typical power consumption simulation of an integrated circuit.

Abstract: Disclosed herein are methods and devices used for the physical design validation of integrated circuits. One method used for the physical design validation of integrated circuits includes comparing the original circuit netlist of an integrated circuit and the layout data of the integrated circuit and assigning labels to the input and output terminals of the components in the integrated circuit based on the results of the comparison.

Abstract: Systems and techniques are described for optimizing a circuit design by using a numerical solver. The gates sizes are optimized by modeling a set of gate optimization problems and solving the set of gate optimization problems by using a numerical solver. The optimization can be performed iteratively, wherein in each iteration a gate optimization problem can be modeled for the portion of the circuit design based on circuit information for the portion of the circuit design. An objective function can be created, wherein the objective function includes at least one penalty function that imposes a lower and/or upper bound on at least one variable that is being optimized. In some embodiments, gradients of the objective function, which includes the penalty function, can be computed to enable the use of a conjugate-gradient-based numerical solver.

Abstract: Some embodiments include a method for identifying high-temperature regions in a microchip. In some embodiments, the method includes selecting grids on the microchip, wherein each grid includes devices and interconnects connecting the devices. The method can also include determining, for each grid, a temperature factor value based on geometric area of the grid, geometric area occupied by the devices, switching factor of the of the interconnects, and length of the interconnects connecting the devices. The method can also include determining, for each grid, thermal sensitivity for the grid by generating a plot based on a Guassian equation.

Abstract: One embodiment of the present invention provides systems and techniques to execute a hardware simulation and verification solution on a multiprocessor system. The hardware simulation and verification solution can be partitioned into different modules which can include a simulation kernel to simulate changes in signal values, a value change dump module to store the changes in the signal values on a computer-readable storage medium, a functional coverage module to check functionality, a toggle coverage module to check signal toggling, an assertion engine to check complex behaviors, and a testbench module to generate test scenarios. Embodiments of the present invention can execute different modules on different processors, thereby improving performance.

Abstract: A simulation apparatus performs a simulation of a program for executing a plurality of instructions included in an instruction set of a processor. A bus model unit accepts an access request to a memory storing the program, performs arbitration for a bus, and calculates a cycle count of the processor until use of the bus is granted, for each instruction of the program. A cycle count accumulation unit computes a cycle count required for executing the program based on the cycle count for each instruction calculated by the bus model unit.

Abstract: A circuit is simulated by using system or network tearing to obtain a real solution. The circuit may be an entire integrated circuit, portion of an integrated circuit, or a circuit block. A circuit simulation technique of the invention generates a system graph, finds a tree, and partitions the tree into two or more subtrees. The technique identifies global links and local links in the graph. Each subtree may be solved individually using distributed, parallel computing. Using the results for the subtrees, the technique obtains a real solution, branch voltages and currents, for the circuit.

Abstract: A method for simulating a tucked transistor device having a diffusion region defined in a semiconductor layer, a gate electrode adjacent a first side of the diffusion region, a floating gate electrode adjacent a second side of the diffusion region, and an isolation structure disposed beneath at least a portion of the floating gate electrode is provided. The method includes receiving a first netlist having an entry for the tucked transistor device in a computing apparatus. The entry defines parameters associated with the gate electrode and the diffusion region. A parasitic capacitance component is added to the entry representing a gate capacitance between the floating gate and the diffusion region in the computing apparatus.

Abstract: A method of designing a circuit can include modeling one or more circuits in a hardware design language (HDL) (102) and confirming a basic behavior of such models (104). If a basic behavior has been met, the model can be modified to include an algorithm that is based on an experimental statistical analysis of manufactured circuits representing particular condition (e.g., factor) limits (referred to as “corners”) (106). Once a circuit model has been modified to include an algorithm that can represent performance corners, a simulation can be run that will represent circuit response at such an operational corner (110).

Abstract: A system and method is disclosed in an emulation environment that dynamically remaps user designs. In one embodiment, a request is received to load an integrated circuit design to be emulated in a desired partition within the emulator. The emulator automatically determines the availability of the partition requested. If the partition is not available, the design is dynamically remapped to a different partition that is available. In another embodiment, clocks associated with the integrated circuit design are also dynamically remapped. In yet another embodiment, the user can control the size of the partitions (e.g., the number of printed circuit boards in a partition).

Abstract: A method of testing cache coherency in a computer system design allocates different portions of a single cache line for use by accelerators and processors. The different portions of the cache line can have different sizes, and the processors and accelerators can operate in the simulation at different frequencies. The verification system can control execution of the instructions to invoke different modes of the coherency mechanism such as direct memory access or cache intervention. The invention provides a further opportunity to test any accelerator having an original function and an inverse function by allocating cache lines to generate an original function output, allocating cache lines to generate an inverse function output based on the original function output, and verifying correctness of the original and inverse functions by comparing the inverse function output to the original function input.

Abstract: A plurality of photomasks used to manufacture the same semiconductor device, each of the photomasks having a plurality of mutually replaceable unit regions set therein, are inspected to detect a defect. It is determined whether or not the detected defect has a redundancy defect positioned in a unit region replaceable with another unit region to remedy the photomask. Then, when inspecting the second or subsequent photomask, a unit region including the coordinate of a redundancy defect detected in another photomask inspected previously is set to be a non-inspection region, and the non-inspection region is not inspected.

Abstract: A method and device for preserving the wired-OR nature of the clock signal connection between two devices without a direct analog connection between the lines and in an infinitely scalable fashion. The method includes detecting a logic state at a first connector and a second connector and driving an appropriate connector of the device to an active state in response to determining that a connector is driving an active state. The device includes first and second connectors for communicating logic states and driving active states in response to detected logic states.

Abstract: Approaches for simulating an electronic system. In one approach, a software co-simulation platform is configured to produce a first time sequence of values of a plurality of input ports of a design block of the electronic system, consume a second time sequence of values of a plurality of output ports of the design block, and generate access transactions for transferring the first and second sequences of values. The software co-simulation platform generates a plurality of reconfiguration transactions for transferring reconfiguration data for the design block. A PLD is configured to implement a communication block and a control block. The communication block receives the reconfiguration and access transactions from the software co-simulation platform, and the control block reconfigures programmable logic and interconnect resources of the PLD in response to the reconfiguration transactions. The control block also controls the emulation of the design block in response to the access transactions.

Abstract: Techniques, structures, and systems are disclosed for implementing an efficient design of computer hardware using a top-to-bottom approach. In one aspect, a method for designing a processor includes generating an initial architecture for a processor to execute algorithms, simulating execution of the algorithms by the initial architecture to determine a modification to the initial architecture, and creating a processor design based on the modification to the initial architecture. The described method for implementing a hardware design tool provides a push-button transition from high level specification for algorithms to hardware description language.

Abstract: A method for modeling power management in an integrated circuit (IC) includes: specifying a circuit design and a power architecture for the IC, the power architecture including a plurality of power domains for specifying power levels in different portions of the IC; determining an emulation module for the IC by including one or more hardware elements for modeling the power architecture in the emulation module; and using the emulation module to simulate changing power levels in one or more power domains of the IC including a power shutoff in at least one power domain.

Abstract: In an embodiment, a method of establishing directed relationships between states in a simulation is disclosed. The directed relationships may allow the simulation to proceed from an initial state according to two or more divergent behaviors. The simulation may merge if two or more behaviors result in states that are equivalent. The method may further allow a state of the simulation which has not been stored to be interpolated from one or more states that have been stored. In one embodiment, a system may receive a request to revert to a previous state, and the system may identify a saved state that is closest to the requested state. The system may simulate from the identified state to arrive at the requested state. In one embodiment, the simulation may be a hybrid simulation which is advanced in both discrete and continuous increments.

Abstract: Disclosed is a method, system, and computer program product for performing predictions for an electronic design. Embodiments of the invention allow the ability to efficiently update the model predictions at a later time once previously incomplete blocks are completed. Predictions can be efficiently updated after block designs are updated (e.g. after correcting problems detected from model predictions).

Abstract: A method of modeling an integrated circuit chip includes generating a model of a bond pad using a design tool running on a computer device. The method also includes connecting a first inductor, a first resistor, and a first set of parallel-resistor-inductor elements in series between a first node and a second node in the model. The method further includes connecting a second inductor, a second resistor, and a second set of parallel-resistor-inductor elements in series between the second node and a third node in the model. The first node corresponds to a first signal port of the bond pad. The second node corresponds to a second signal port of the bond pad.

Abstract: Place-and-route (P&R) includes maintaining a set of local arrival time information and local required time information associated with a circuit layout; determining a candidate fix on a critical path in the circuit layout; statistically determining, using one or more computer processors, a set of one or more adjusted local slacks associated with a region affected by the candidate fix; and in the event that the set of one or more adjusted local slacks indicates that the candidate fix results in a timing improvement, accepting the candidate fix.

Abstract: For each input variable value set, an indicator value associated with dispersion of actually measured output variable values is calculated from data including, for each input variable value set, the actually measured output variable values. Then, a processing to cause a simulator to compute a calculated output variable value for each combination of a candidate input parameter value sets and one input variable value set, and a processing to calculate, for each candidate input parameter value set, an entire error obtained by taking into consideration, with respect to all input variable value sets, partial errors obtained respectively by evaluating, by the indicator value for a corresponding input variable value set, difference between the calculated and actually measured output variable values for the corresponding input variable value set are repeated to identify the candidate input parameter value set making the entire error minimum.

Abstract: Some embodiments provide a system that performs a simulation within an electronic design automation (EDA) application. During operation, the system obtains a design from a user of the EDA application. Next, the system performs the simulation using the design to create a set of current simulation results associated with the design. The system then automatically saves a current design state of the design which is associated with the current simulation results. Finally, the system enables subsequent access to the current design state and one or more previous design states of the design by the user through a graphical user interface (GUI) associated with the EDA application.