Abstract: A method of designing a circuit can include modeling one or more circuits in a hardware design language (HDL) (102) and confirming a basic behavior of such models (104). If a basic behavior has been met, the model can be modified to include an algorithm that is based on an experimental statistical analysis of manufactured circuits representing particular condition (e.g., factor) limits (referred to as “corners”) (106). Once a circuit model has been modified to include an algorithm that can represent performance corners, a simulation can be run that will represent circuit response at such an operational corner (110).

Abstract: A circuit is simulated by using system or network tearing to obtain a real solution. The circuit may be an entire integrated circuit, portion of an integrated circuit, or a circuit block. A circuit simulation technique of the invention generates a system graph, finds a tree, and partitions the tree into two or more subtrees. The technique identifies global links and local links in the graph. Each subtree may be solved individually using distributed, parallel computing. Using the results for the subtrees, the technique obtains a real solution, branch voltages and currents, for the circuit.

Abstract: A method for simulating a tucked transistor device having a diffusion region defined in a semiconductor layer, a gate electrode adjacent a first side of the diffusion region, a floating gate electrode adjacent a second side of the diffusion region, and an isolation structure disposed beneath at least a portion of the floating gate electrode is provided. The method includes receiving a first netlist having an entry for the tucked transistor device in a computing apparatus. The entry defines parameters associated with the gate electrode and the diffusion region. A parasitic capacitance component is added to the entry representing a gate capacitance between the floating gate and the diffusion region in the computing apparatus.

Abstract: A method of testing cache coherency in a computer system design allocates different portions of a single cache line for use by accelerators and processors. The different portions of the cache line can have different sizes, and the processors and accelerators can operate in the simulation at different frequencies. The verification system can control execution of the instructions to invoke different modes of the coherency mechanism such as direct memory access or cache intervention. The invention provides a further opportunity to test any accelerator having an original function and an inverse function by allocating cache lines to generate an original function output, allocating cache lines to generate an inverse function output based on the original function output, and verifying correctness of the original and inverse functions by comparing the inverse function output to the original function input.

Abstract: A system and method is disclosed in an emulation environment that dynamically remaps user designs. In one embodiment, a request is received to load an integrated circuit design to be emulated in a desired partition within the emulator. The emulator automatically determines the availability of the partition requested. If the partition is not available, the design is dynamically remapped to a different partition that is available. In another embodiment, clocks associated with the integrated circuit design are also dynamically remapped. In yet another embodiment, the user can control the size of the partitions (e.g., the number of printed circuit boards in a partition).

Abstract: A method for modeling power management in an integrated circuit (IC) includes: specifying a circuit design and a power architecture for the IC, the power architecture including a plurality of power domains for specifying power levels in different portions of the IC; determining an emulation module for the IC by including one or more hardware elements for modeling the power architecture in the emulation module; and using the emulation module to simulate changing power levels in one or more power domains of the IC including a power shutoff in at least one power domain.

Abstract: A method and device for preserving the wired-OR nature of the clock signal connection between two devices without a direct analog connection between the lines and in an infinitely scalable fashion. The method includes detecting a logic state at a first connector and a second connector and driving an appropriate connector of the device to an active state in response to determining that a connector is driving an active state. The device includes first and second connectors for communicating logic states and driving active states in response to detected logic states.

Abstract: Approaches for simulating an electronic system. In one approach, a software co-simulation platform is configured to produce a first time sequence of values of a plurality of input ports of a design block of the electronic system, consume a second time sequence of values of a plurality of output ports of the design block, and generate access transactions for transferring the first and second sequences of values. The software co-simulation platform generates a plurality of reconfiguration transactions for transferring reconfiguration data for the design block. A PLD is configured to implement a communication block and a control block. The communication block receives the reconfiguration and access transactions from the software co-simulation platform, and the control block reconfigures programmable logic and interconnect resources of the PLD in response to the reconfiguration transactions. The control block also controls the emulation of the design block in response to the access transactions.

Abstract: Techniques, structures, and systems are disclosed for implementing an efficient design of computer hardware using a top-to-bottom approach. In one aspect, a method for designing a processor includes generating an initial architecture for a processor to execute algorithms, simulating execution of the algorithms by the initial architecture to determine a modification to the initial architecture, and creating a processor design based on the modification to the initial architecture. The described method for implementing a hardware design tool provides a push-button transition from high level specification for algorithms to hardware description language.

Abstract: A plurality of photomasks used to manufacture the same semiconductor device, each of the photomasks having a plurality of mutually replaceable unit regions set therein, are inspected to detect a defect. It is determined whether or not the detected defect has a redundancy defect positioned in a unit region replaceable with another unit region to remedy the photomask. Then, when inspecting the second or subsequent photomask, a unit region including the coordinate of a redundancy defect detected in another photomask inspected previously is set to be a non-inspection region, and the non-inspection region is not inspected.

Abstract: A method of modeling an integrated circuit chip includes generating a model of a bond pad using a design tool running on a computer device. The method also includes connecting a first inductor, a first resistor, and a first set of parallel-resistor-inductor elements in series between a first node and a second node in the model. The method further includes connecting a second inductor, a second resistor, and a second set of parallel-resistor-inductor elements in series between the second node and a third node in the model. The first node corresponds to a first signal port of the bond pad. The second node corresponds to a second signal port of the bond pad.

Abstract: Disclosed is a method, system, and computer program product for performing predictions for an electronic design. Embodiments of the invention allow the ability to efficiently update the model predictions at a later time once previously incomplete blocks are completed. Predictions can be efficiently updated after block designs are updated (e.g. after correcting problems detected from model predictions).

Abstract: Place-and-route (P&R) includes maintaining a set of local arrival time information and local required time information associated with a circuit layout; determining a candidate fix on a critical path in the circuit layout; statistically determining, using one or more computer processors, a set of one or more adjusted local slacks associated with a region affected by the candidate fix; and in the event that the set of one or more adjusted local slacks indicates that the candidate fix results in a timing improvement, accepting the candidate fix.

Abstract: In an embodiment, a method of establishing directed relationships between states in a simulation is disclosed. The directed relationships may allow the simulation to proceed from an initial state according to two or more divergent behaviors. The simulation may merge if two or more behaviors result in states that are equivalent. The method may further allow a state of the simulation which has not been stored to be interpolated from one or more states that have been stored. In one embodiment, a system may receive a request to revert to a previous state, and the system may identify a saved state that is closest to the requested state. The system may simulate from the identified state to arrive at the requested state. In one embodiment, the simulation may be a hybrid simulation which is advanced in both discrete and continuous increments.

Abstract: For each input variable value set, an indicator value associated with dispersion of actually measured output variable values is calculated from data including, for each input variable value set, the actually measured output variable values. Then, a processing to cause a simulator to compute a calculated output variable value for each combination of a candidate input parameter value sets and one input variable value set, and a processing to calculate, for each candidate input parameter value set, an entire error obtained by taking into consideration, with respect to all input variable value sets, partial errors obtained respectively by evaluating, by the indicator value for a corresponding input variable value set, difference between the calculated and actually measured output variable values for the corresponding input variable value set are repeated to identify the candidate input parameter value set making the entire error minimum.

Abstract: Some embodiments provide a system that performs a simulation within an electronic design automation (EDA) application. During operation, the system obtains a design from a user of the EDA application. Next, the system performs the simulation using the design to create a set of current simulation results associated with the design. The system then automatically saves a current design state of the design which is associated with the current simulation results. Finally, the system enables subsequent access to the current design state and one or more previous design states of the design by the user through a graphical user interface (GUI) associated with the EDA application.

Abstract: A computing device and a method for scattering parameter equivalent circuit reads a scattering parameter file from a storage device. A non-common-pole rational function of the scattering parameters in the scattering parameter file is created by applying a vector fitting algorithm to the scattering parameters. Passivity of the non-common-pole rational function is enforced if the non-common-pole rational function does not satisfy a determined passivity requirement.

Abstract: A method for simulating a response of a circuit to an ESD input stimulus applied to the circuit includes the steps of: receiving a description of the circuit into a circuit simulation program, the circuit including at least one mutual inductance element indicative of magnetic coupling in the circuit; generating a linear approximation of nonlinear elements in the circuit at respective DC bias points of the nonlinear elements; obtaining a frequency domain transfer function of the circuit; obtaining a time domain impulse response of the circuit as a function of the frequency domain transfer function; integrating the time domain impulse response to yield a step response of the circuit, the step response being indicative of a response of the circuit to the ESD input stimulus; and analyzing the step response of the circuit to determine whether the circuit will operate within prescribed parameters corresponding to the circuit.

Abstract: Systems and methods for segmenting an impedance matching model are described. One of the methods includes receiving the impedance matching model. The impedance matching model represents an impedance matching circuit, which is coupled to an RF generator via an RF cable and to a plasma chamber via an RF transmission line. The method further includes segmenting the impedance matching model into two or more modules of a first set. Each module includes a series circuit and a shunt circuit. The shunt circuit is coupled to the series circuit. The series circuit of the first module is coupled to a cable model and the series circuit of the second module is coupled to an RF transmission model. The series circuit and the shunt circuit of the first module are coupled to the series circuit of the second module. The shunt circuit of the second module is coupled to the RF transmission model.

Abstract: The present disclosure describes a method of optimizing a design for manufacture (DFM) simulation. The method includes receiving an integrated circuit (IC) design data having a feature, receiving a process data having a parameter or a plurality of parameters, performing the DFM simulation, and optimizing the DFM simulation. The performing the DFM simulation includes generating a simulation output data using the IC design data and the process data. The optimizing the DFM simulation includes generating a performance index of the parameter or the plurality of parameters by the DFM simulation. The optimizing the DFM simulation includes adjusting the parameter or the plurality of parameters at outer loop, middle loop, and the inner loop. The optimizing the DFM simulation also includes locating a nadir of the performance index of the parameter or the plurality of parameters over a range of the parameter or the plurality of parameters.

Abstract: A method for assembling an electrical circuit includes measuring actual values of components of a given type that are held in a stock, and storing the measured actual values in a computerized stock-record. An actual property of an electrical circuit under assembly is determined. Based on the determined actual property, and on a specified response of the circuit, a required value is calculated for a set of one or more of the components of the given type. Responsively to the calculated required value, the stock-record is searched, and a set of one or more of the components is selected from the stock and assembled into the circuit.

Abstract: A delay analysis device composed of a storage device and a data processing device analyzes a chip fabricating a semiconductor integrated circuit. Delay calculation is performed via an RC simulation with reference to a layout-implemented macro net list, macro layout data, and a cell timing library, thus producing macro delay information. An initial stage of a macro is annotated by the global clock path delay information including the edge information so as to produce a global clock delay-annotated macro net list, which is then converted into a macro delay-annotated net list. Based on the macro delay-annotated net list and timing constraint, the delay analysis device calculates delay times of signal paths and clock paths as well as clock skews with a high precision. It checks whether or not the relationship between the delay times of signal paths and clock paths meets the timing constraint, thus producing delay analysis information.

Abstract: A method for expressing a hierarchy of scalabilities in complex systems, including a discrete event simulation and an analytic model, for analysis and prediction of the performance of multi-chip, multi-core, multi-threaded computer processors is provided. Further provided is a capacity planning tool for migrating data center systems from a source configuration which may include source systems with multithreaded, multicore, multichip central processing units to a destination configuration which may include destination systems with multithreaded, multicore and multichip central processing units, wherein the destination systems may be different than the source systems. Apparatus and methods are taught for the assembling of and utilization of linear and exponential scalability factors in the capacity planning tool when a plurality of active processor threads populate processors with multiple chips, multiple cores per chip and multiple threads per core.

Abstract: An algorithm and architecture are disclosed for performing multi-argument associative operations. The algorithm and architecture can be used to schedule operations on multiple facilities for computations or can be used in the development of a model in a modeling environment. The algorithm and architecture resulting from the algorithm use the latency of the components that are used to process the associative operations. The algorithm minimizes the number of components necessary to produce an output of multi-argument associative operations and also can minimize the number of inputs each component receives.

Abstract: A method and mechanism for implementing a general purpose scripting language that supports parallel execution is described. In one approach, parallel execution is provided in a seamless and high-level approach rather than requiring or expecting a user to have low-level programming expertise with parallel processing languages/functions. Also described is a system and method for performing circuit simulation. The present approach provides methods and systems that create reusable and independent measurements for use with circuit simulators. Also disclosed are parallelizable measurements having looping constructs that can be run without interference between parallel iterations. Reusability is enhanced by having parameterized measurements. Revisions and history of the operating parameters of circuit designs subject to simulation are tracked.

Abstract: The disclosure provides leakage power recovery that considers side transition times of multi-input cells. In one embodiment, a leakage power recovery system is disclosed that includes: (1) a power recovery module that considers side transitions when making a first conditional replacement of a cell in a path of a circuit design with a lower leakage cell and estimates delays and slack of the at least one path of the circuit design, and (2) a speed recovery module that makes a second conditional replacement of a slower lower leakage cell of the path with a higher leakage cell when there is a timing violation with respect to the path, determines if any other cells of the at least one path has a slower input transition and makes a third conditional replacement of a driver thereof to a higher leakage cell when the driver is one of the slower lower leakage cells.

Abstract: A method for providing ordered capture clocks to detect or locate faults within N clock domains and faults crossing any two clock domains in an integrated circuit or circuit assembly in scan-test or self-test mode, where N>1, each clock domain having one capture clock and a plurality of scan cells, each capture clock comprising a plurality of capture clock pulses; said method comprising: (a) generating and shifting-in N test stimuli to all said scan cells within said N clock domains in said integrated circuit or circuit assembly during a shift-in operation; (b) applying an ordered sequence of capture clocks to all said scan cells within said N clock domains, the ordered sequence of capture clocks comprising at least a plurality of capture clock pulses from two or more selected capture clocks placed in a sequential order such that all clock domains are never triggered simultaneously during a capture operation; and (c) analyzing output responses of all said scan cells to locate any faults therein.

Abstract: One or more embodiments provide a load balancing solution for improving the runtime performance of parallel HDL simulators. During compilation each process is analyzed to determine a simulation cost based on complexity of the HDL processes. During simulation, processes to be executed in the same simulation cycle are scheduled using the simulation costs computed at compile-time in order to reduce the delay incurred during simulation.

Abstract: In one embodiment, a method is provided for processing a circuit design having first and second sets of ports configured to couple to respective first and second sets of ports of a device on a hardware platform. In a data-acquisition mode, the circuit design is simulated using a user-selectable plug-in that couples the ports of the circuit design to an interface circuit. During the simulation, the interface circuit communicates data between respective ports of the circuit design and ports of the device. In a deployment mode, the circuit design is implemented in the hardware platform, in which the first and second sets of ports of the circuit design are respectively coupled to the first and second sets of ports of the device.

Abstract: A computer-implemented method that simulates NPskew effects on a combination NFET (Negative Field Effect Transistor)/PFET (Positive Field Effect Transistor) semiconductor device using slew perturbations includes performing a timing test by a computing device, by: (1) evaluating perturb slews in Strong N/Weak P directions on the combination semiconductor device for a timing test result; (2) evaluation perturb slews in Weak N/Strong P directions on the combination semiconductor device for a timing test result; and (3) evaluating unperturbed slews in a balanced condition on the combination semiconductor device for a timing test result. After each test is performed, a determination is made as to which evaluation of the perturbed and unperturbed slews produces a most conservative timing test result for the combination semiconductor device. An NPskew effect adjusted timing test result is finally output based on determining the most conservative timing test result.

Abstract: Systems and methods are provided for extracting parasitics in a design of an integrated circuit with multi-patterning requirements. The method includes determining resistance solutions and capacitance solutions. The method further includes performing parasitic extraction of the resistance solutions and the capacitance solutions to generate mean values for the resistance solutions and the capacitance solutions. The method further includes capturing a multi-patterning source of variation for each of the resistance solutions and the capacitance solutions during the parasitic extraction. The method further includes determining a sensitivity for each captured source of variation to a respective vector of parameters. The method further includes determining statistical parasitics by multiplying each of the resistance solutions and the capacitance solutions by the determined sensitivity for each respective captured source of variation.

Abstract: A coupled analysis simulation apparatus includes a coupled analysis processing unit configured to perform coupled analysis by performing electromagnetic field analysis and circuit analysis in coordination with each other, the electromagnetic field analysis being performed on a space including conductive layers to which an electronic circuit module is connected, the circuit analysis being performed on the electronic circuit module; a first generating unit configured to generate a virtual conductive part in a section or a region including connection parts connecting the electronic circuit module with the conductive layers; and a second generating unit configured to generate virtual connection parts that virtually connect the virtual conductive part with the conductive layers at positions where the connection parts are connected to the conductive layers.

Abstract: Roughly described, a method for synthesizing a circuit design from a logic design includes developing candidate solutions for a particular signal path, a first candidate solution identifying a first library cells followed immediately downstream thereof by a first set of zero or more buffers, and a second candidate solution identifying a second library cell followed immediately downstream thereof by a second set of zero or more buffers, the first library cell and first set of buffers in combination being different from the second library cell and second set of buffers in combination. The computer system selects among the candidate solutions at least in part in dependence upon sensitivity of the solution to load capacitance in the particular path, and stores the selected solution in the storage for subsequent use in further developing and fabricating an integrated circuit device.

Abstract: In one embodiment of the invention, a method of simulating a circuit is disclosed including simulating an analog component of the circuit over a first simulation time period with a first envelope simulation; adaptively switching from simulating the analog component with the first envelope simulation to simulating the analog component with a transient simulation over a second simulation time period; and adaptively switching from simulating the analog component with the transient simulation to simulating the analog component with a second envelope simulation over a third simulation time period. The adaptive switching from the first envelope simulation to the transient simulation may be in response to the envelope simulation accuracy falling below a predetermined level of accuracy in comparison with a transient simulation or in response to the second simulation time period including expected digital transitions where one or more digital events may occur to change the analog input signals to the analog component.

Abstract: A system and method for performing circuit simulation is described. The present approach provides methods and systems that create reusable and independent measurements for use with circuit simulators. Also disclosed are parallelizable measurements having looping constructs that can be run without interference between parallel iterations. Reusability is enhanced by having parameterized measurements. Revisions and history of the operating parameters of circuit designs subject to simulation are tracked. Mechanisms are provided that allow for viewing, measurement or other manipulation of signals at specific locations in a circuit design for simulation, such as parameters that include observation points which are implemented using probes. One approach to executing a measurement is via a controllable and flexible control statement, which in one embodiment is the “run” statement. Improved interfaces for viewing, controlling, and manipulating simulations and simulation results are also provided.

Abstract: An image processing method includes the following steps. An input data including a number of original data are received. The original data are converted into a number of converted emulation voltage signals. At least a simulation circuit model including at least a spatial data node, at least a diffusion node and at least a connection device is established, wherein, the at least a connection device is coupled to a part or all of the at least a spatial data node and the at least a diffusion node. A part or all of the converted emulation voltage signals are supplied to the diffusion node to achieve voltage diffusion among the spatial data nodes and the diffusion nodes via the connection device, so that at least a diffused emulation voltage signal is obtained on the diffusion nodes. Then, processed image data are generated according to the diffused emulation voltage signals.

Abstract: When a wait statement is encountered in an HDL simulation, the simulation kernel executes functions corresponding to other processes while waiting for the wait to mature. However, the preservation of variables and states of each process and procedure in the call chain can be complex and inefficient. An embodiment of the present invention provides a method to suspend procedures in simulation of an HDL circuit design such that processes that call procedures containing wait statements are executed on a secondary runtime stack and can be suspended by saving the state of simulation and switching simulation execution to the primary runtime stack.

Abstract: A method for design simulation includes partitioning a verification task of a design into a first plurality of atomic Processing Elements (PEs) having execution dependencies, each execution dependency specifying that a respective first PE is to be executed before a respective second PE. The method further includes computing an order for executing the PEs on a multiprocessor device, which includes a second plurality of processors operating in parallel and schedules the PEs for execution by the processors according to a built-in scheduling policy. The order induces concurrent execution of the PEs by different ones of the processors without violating the execution dependencies irrespective of the scheduling policy. The PEs are executed on the processors in accordance with the computed order and the scheduling policy, to produce a simulation result. A performance of the design is verified responsively to the simulation result.

Abstract: According to one embodiment, a simulation apparatus includes a hardware model execution unit that executes a hardware model, a software model execution unit that executes a software model, a simulation time management unit that sets a first simulation time indicating a total elapsed time of a simulation time of the hardware model, ahead by the simulation time of which the HW model notified, and sets the second simulation time indicating a total elapsed time of a simulation time of the software model, ahead by the simulation time of which the SW model notified, and a scheduler that compares the first simulation time with the second simulation time, causes the SW model or the HW model to be executed based on the comparison result, and causes only the hardware model to be executed instead of execution of an idle loop when the SW model awaits an interrupt from the HW model.

Abstract: The disclosure relates to the analysis of compensated layout shapes. A method in accordance with an embodiment includes: analyzing a semiconductor layout using a bucket structure, the layout including a semiconductor device; and applying a pattern template to a content of the bucket structure to identify a shape adjacent to the semiconductor device; wherein the pattern template is derived from layout groundrules.

Abstract: A method includes creating a technology file including data for an integrated circuit including at least one die including at least one metal layer to be formed using at least one of a single patterning process or a multi-patterning process, creating a netlist including data approximating at least one of capacitive or inductive couplings between conductors in the metal layer of at least one die based on the technology file, simulating a performance of the integrated circuit based on the netlist, adjusting the routing between the at least one die and the interposer based on the simulation to reduce the at least one of the capacitive or the inductive couplings, and repeating the simulating and adjusting to optimize the at least one of the capacitive or inductive couplings.

Abstract: Certain embodiments of the invention may include systems and methods for providing electrical fault restoration. According to an example embodiment of the invention, a method can include sectioning a de-energized region into two or more de-energized areas; simulating opening or closing of one or more circuit switches associated with the two or more de-energized areas; compiling a listing of simulated energized areas and simulated de-energized areas, based on the simulated opening or closing of the one or more circuit switches; evaluating the listing of simulated energized areas and simulated de-energized areas, based at least in part on one or more configurable strategy modules; and generating a restoration plan based at least in part on the evaluation.

Abstract: Provided is a method of configuring a large signal model of an active device. The method may include configuring a large signal model of a first active device, preparing a first measured value on a first characteristic of a second active device, the second active device being larger than the first active device, processing the large signal model of the first active device using a circuit simulator to configure a large signal model of the second active device, simulating the large signal model of the second active device to obtain a calculated value on the first characteristic, comparing the measured and calculated values on the first characteristic to each other, and establishing the large signal model of the second active device, if a difference between the measured and calculated values on the first characteristic may be smaller than a predetermined error margin.

Abstract: A method for extracting an accurate IBIS simulation model of a semiconductor device including a plurality of semiconductor chips comprises: extracting an AC characteristics model of a first output buffer in an IBIS simulation model by treating first and second output buffers of first and second semiconductor chips connected to a single external connection terminal as a transistor model and executing a transistor-level circuit simulation; calculating an output capacitance model of the first output buffer as an IBIS simulation model by adding output capacitances of the first and second output buffers as a transistor-level circuit simulation model; and synthesizing an IBIS simulation model of the first output buffer viewed from the external connection terminal by using the AC characteristics model and the output capacitance model.

Abstract: A method of simulating a design described in HDL is provided. In this method, modules of the design can be partitioned into first modules for simulation by a serial simulation engine and second modules for simulation by a concurrent simulation engine. The first and second modules can be prioritized for simulation based on classes of events consistent with an execution model of the HDL. Simulations of the serial and concurrent simulation engines can be synchronized for each class of events. Synchronizing can include transferring updated interface variable values, which are shared by the second modules and at least a subset of the first modules, between the serial simulation engine and the concurrent simulation engine. This transferring can include translating representations of the updated interface variable values.

Abstract: Embodiments that design integrated circuits using a 1×N compiler in a closed-loop 1×N methodology are disclosed. Some embodiments create a physical design representation based on a behavioral representation of a design for an integrated circuit. The behavioral representation may comprise RTL HDL with one or more 1×N building blocks. The embodiments may alter elements of the 1×N building block by using logic design tools, synthesis tools, physical design tools, and timing analysis tools. Further embodiments comprise an apparatus having a first generator to generate a behavioral representation of a design for an integrated circuit, a second generator to generate a logical representation of the design, and a third generator to generate a physical design representation of the design, wherein the representation generators may create updated versions of the representations which reflect alterations made to 1×N building block elements.

Abstract: Any primitive cells or blocks can be represented physically by a Barycenter compact model, and any black box model can also be physically represented by a Barycenter compact model physically. A hierarchical boundary condition between blocks is formulated by the Barycenter model or Barycenter compact model. Hierarchical boundary condition problems between blocks can be limited within two levels only if using the Barycenter model or Barycenter compact model.

Abstract: A method and mechanism for implementing a general purpose scripting language that supports parallel execution is described. In one approach, parallel execution is provided in a seamless and high-level approach rather than requiring or expecting a user to have low-level programming expertise with parallel processing languages/functions. Also described is a system and method for performing circuit simulation. The present approach provides methods and systems that create reusable and independent measurements for use with circuit simulators. Also disclosed are parallelizable measurements having looping constructs that can be run without interference between parallel iterations. Reusability is enhanced by having parameterized measurements. Revisions and history of the operating parameters of circuit designs subject to simulation are tracked.

Abstract: Described are apparatus and method for simulating spintronic integrated circuit (SPINIC), the method comprising: generating a spin netlist indicating connections of spin nodes of spin circuits and nodes of general circuits; and modifying a modified nodal analysis (MNA) matrix for general circuits to generate a spin MNA matrix for solving spin circuits and general circuits of the spin netlist.

Abstract: A computer-based method for marking signal transmission lines of a printed circuit board (PCB) layout includes: reading names of to-be-checked signal transmission lines in a name file; determining the to-be-checked signal transmission lines in a displayed PCB layout according to the read names; and marking the determined to-be-checked signal transmission lines in the displayed PCB layout. A related computing device is also provided.