Abstract: In some aspects of the present disclosure, a memory array includes: a plurality of memory cells; and a plurality of logic gates, each of the plurality of logic gates having a first input, a second input, and an output gating a corresponding one of the plurality of memory cells, wherein the first input of each of the plurality of logic gates of a first subset is coupled to a first bit select line.

Abstract: A semiconductor memory includes memory cells, a word line and bit lines of the memory cells, sense amplifiers connected to the bit lines, respectively, and a controller. Each sense amplifier includes first, second, and third transistors. The third transistor has one end connected to each of the first and second transistors, and the other end connected to a corresponding bit line. During a read operation, at a first time of a first period during which the controller applies a first read voltage to the word line, the controller applies a first voltage higher than ground voltage to the first transistor, and a second voltage to the second transistor. Also, at the first time, a first sense amplifier applies a voltage to a first bit line through its first and third transistors, and a second sense amplifier applies a voltage to a second bit line through the second and third transistors.

Abstract: An integrated circuit includes a memory cell array coupled to a bitline and a first wordline and a negative-type metal-oxide-semiconductors (NMOS) pull-down structure coupled to the bitline and PMOS transistors. The positive-type metal-oxide-semiconductors (PMOS) transistors may be coupled to a second wordline, where a logic value carried on the second wordline is based on a logic value carried on the first wordline, and the PMOS transistors are structured to pre-charge respective drains of the NMOS pull-down structure to a high logic value based on a low logic value carried on the second wordline. The NMOS pull-down structure may be structured to discharge the bitline based on a high logic value carried on the second wordline.

Abstract: A singled ended current sense amplifier circuit including an input stage having a bitline node, a sense node and a feedback circuit comprising a feedback inverter configured to provide an amplified voltage from the bitline node. The feedback inverter may include first and second NMOS transistors serially connected to a feedback node and first and second PMOS transistors serially connected to the feedback node. The feedback circuit may include a third NMOS transistor having a gate terminal connected to the feedback node and a drain terminal connected to the sense node. The input stage may include a third PMOS transistor operating as a current source to generate a sense current which flows in a current sensing path between the sense node and the bitline node. The input stage may act as a regulator to keep the voltage at the bitline node constant.

Abstract: A data storage device includes a memory device including a plurality of wordlines, each including a plurality of cells, and a cell statistics generator (CSG) disposed on the memory device. The CSG includes logic configured to receive a first read sense at a threshold voltage of one or more threshold voltages of each cell of a wordline of the plurality of wordlines, determine that a second read sense is required based on the first read sense, receive the second read sense, determine a deviation parameter and a dispersion parameter for an asymmetric adjustment of the left threshold voltage and the right threshold voltage, and adjust the left threshold voltage and the right threshold voltage based on the deviation parameter and the dispersion parameter. The second read sense includes a plurality of left read senses at a left threshold voltage and a plurality of right senses at a right threshold voltage.

Abstract: A memory device is provided. The memory device includes a first transistor and a second transistor connected in series with the first transistor. The second transistor is programmable between a first state and a second state. A bit line connected to the second transistor. A sense amplifier connected to the bit line. The sense amplifier is operative to sense data from the bit line. A feedback circuit connected to the sense amplifier, wherein the feedback circuit is operative to control a bit line current of the bit-line.

Abstract: Methods, systems, and devices for activity-based data protection in a memory device are described. In one example, a memory device may include a set memory sections each having memory cells configured to be selectively coupled with access lines of the respective memory section. A method of operating the memory device may include determining a quantity of access operations performed on a set of sections of a memory device, selecting at least one of the sections for a voltage adjustment operation based on the determined quantity of access operations, and performing the voltage adjustment operation on the selected section. The voltage adjustment operation may include applying an equal voltage to opposite terminals of the memory cells, which may allow built-up charge, such as leakage charge accumulating from access operations of the selected memory section, to dissipate from the memory cells of the selected section.

Abstract: A ternary content addressable memory (TCAM) semiconductor device includes a first and second data storage portions each connected to a bit line. The first data storage portion is connected to a first word line, and to a first and third group of in series transistors. The second data storage portion is connected to a second word line, and to a second and fourth group of in series transistors. The first group and second group of in series transistors are each connected to a first match line. The first group is connected to a first search line bar, and the second group is connected to a first search line. A third and fourth group of in series transistors are each connected to a second match line. The third group is connected to a second search line, and the fourth group is connected to a second search line bar.

Abstract: A sensing amplifier, coupled to at least one memory cell, includes an output terminal and a reference terminal, a multiplexer circuit, and a plurality of reference cells having equal value. An output terminal of the multiplexer circuit is coupled to the reference terminal of the sensing amplifier. Each of the reference cell is coupled to each input node of the multiplexer circuit. The multiplexer circuit is controlled by a control signal to select one of the reference cells as a selected reference cell to couple to the reference terminal of the sensing amplifier when each read operation to the at least one memory cell is performed. The plurality of reference cells are selected sequentially and repeatedly, and the one of the reference cells is selected for one read operation to the at least one memory cell.

Abstract: A magnetic memory device for storing and quickly retrieving data from an array of magnetic memory elements. The array includes a plurality of magnetic memory element such as magnetic tunnel junction elements arranged in rows and columns. A plurality of multiplexed bit lines is connected with a first end of each of the magnetic memory elements and plurality of multiplexed source lines are connected with a second end of each of the magnetic memory elements. The multiplexing allows source line current and/or bit line current to be applied to an individual column of memory elements in the array for quick retrieval of data in a Magnetic Random Access Memory (MRAM) system.

Abstract: A memory device includes an open-for-contact region located between the memory blocks, and a row decoder disposed between global lines to which an operating voltage is supplied and the local lines and configured to transfer the operating voltage to one memory block among the memory blocks in response to a row address, wherein a plurality of contacts are formed in the open-for-contact region and configured to transmit a voltage between the bit lines and a peripheral circuit, wherein a dummy region is included in the row decoder and disposed paced apart from the open-for-contact region in the second direction, and wherein a discharge switch is included in the dummy region and configured to discharge the global lines in response to a discharge signal.

Abstract: A drain programmed read-only memory includes a diffusion region that spans a width of a bitcell and forms a drain of a first transistor and a second transistor. A bit line lead in a metal layer adjacent the diffusion region extends across the width of the bitcell. A first via extends from an upper half of the bit line lead and couples to a drain of the first transistor. Similarly, a second via extends from a lower half of the bit line and couples to a drain of the second transistor.

Abstract: The present invention is directed to a nonvolatile memory device including a plurality of memory cells arranged in rows and columns, a plurality of word lines with each connected to a respective row of the memory cells along a row direction, a plurality of bit lines with each connected to a respective column of the memory cells along a column direction; a column decoder connected to the bit lines; a plurality of sense amplifiers connected to the column decoder; and a plurality of sense amplifier control circuits. Each of the sense amplifiers is connected to a unique one of the sense amplifier control circuits. Each of the sense amplifier control circuits includes a current detector circuit for detecting a sensing current, a current booster circuit for boosting the sensing current, and a timer circuit for providing a delayed trigger for a respective one of the sense amplifiers connected thereto.

Abstract: Memory devices might include a capacitor, a first capacitance element, a first transistor, and control logic. The first transistor might be connected between the capacitor and the first capacitance element. The control logic might be connected to a control gate of the first transistor. The control logic might be configured to activate the first transistor to precharge the capacitor and the first capacitance element during a read operation of the memory device. The first capacitance element might be a wire capacitance of a first signal line.

Abstract: An apparatus for reading a bit of a memory array includes a bit cell column, voltage enhancement circuitry, and control circuitry. The voltage enhancement circuitry is configured to couple a bitline to a reference node. The control circuitry is configured to, in response to a read request for a bitcell element of a plurality of bitcell elements, couple a current source to the bitcell column such that a read current from the current source flows from the source line, through the bitcell column and the voltage enhancement circuitry, to the reference node and determine a state for the bitcell element based on a voltage between the source line and the reference node. The voltage enhancement circuitry is configured to generate, when the read current flows through the voltage enhancement circuitry, a voltage at the bitline that is greater than a voltage at the reference node.

Abstract: A memory device of the non-volatile type including a memory array having a plurality of memory cells organized as sectors, each sector having a main word line associated with a plurality of local word lines, each local word line coupled to the main word line by a respective local word line driver circuit, each of the local word line driver circuits consisting of a first MOS transistor coupled between the respective main word line and a respective local word line and a second MOS transistor coupled between the respective local word line and a first biasing terminal.

Abstract: A hardware memory includes at least one memory cell, peripheral circuitry and randomization circuitry. The memory cell(s) store data, which may be written to, read from and held in the hardware memory. The peripheral circuitry reads and writes data to the memory cell(s) and may perform other functions necessary for facilitating the data read, write and hold. The randomization circuitry randomizes operations performed by the peripheral circuitry to reduce a correlation between the data and the current consumed by the hardware memory.

Abstract: There are provided a volatile memory device, and an operating method. The volatile memory device includes: a plurality of memory cells arranged in rows and columns and structured to store data; word lines; bit lines; a row decoder; a column decoder; and a control logic coupled to communicate with the row and column decoders and configured to, in an active period, provide the row decoder with a first command, and provide the column decoder with a second command, wherein the row decoder is further configured to: apply a first word line voltage higher than a ground voltage to a selected word line, from when the first command is provided; and for a duration over which the row decoder is activated, apply either a second word line voltage lower than the first word line voltage to the selected word line or no voltage to the selected word line.

Abstract: Methods and devices for reading a memory cell using a sense amplifier with split capacitors is described. The sense amplifier may include a first capacitor and a second capacitor that may be configured to provide a larger capacitance during certain portions of a read operation and a lower capacitance during other portions of the read operation. In some cases, the first capacitor and the second capacitor are configured to be coupled in parallel between a signal node and a voltage source during a first portion of the read operation to provide a higher capacitance. The first capacitor may be decoupled from the second capacitor during a second portion of the read operation to provide a lower capacitance during the second portion.

Abstract: The present disclosure provides a sense amplification circuit and a method of reading out data, including: a first PMOS transistor; a first NMOS transistor; a second PMOS transistor; a second NMOS transistor; a first control MOS transistor configured to provide a bias voltage to the first PMOS transistor according to a control signal; a second control MOS transistor configured to provide the bias voltage to the second PMOS transistor according to the control signal; a first offset cancellation MOS transistor configured to electrically connect an initial bit line to a first complementary readout bit line according to an offset cancellation signal; and a second offset cancellation MOS transistor configured to electrically connect an initial complementary bit line to a first readout bit line according to the offset cancellation signal.

Abstract: A charge pump device includes first to third current source circuits, a first switch, and a second switch. The first current source circuit is implemented with a first type transistor, and provides a first current to an output node. The first switch is selectively turned on according to a first control signal. When the first switch is turned on, the second current source circuit drains a second current from the output node. The second switch is selectively turned on according to a second control signal. Each of the first switch and the second switch is implemented with a second type transistor, and a withstand voltage of the first type transistor is higher than a withstand voltage of the second type transistor. When the second switch is turned on, the third current source circuit drains a third current from the output node.

Abstract: A memory device that includes a first memory cell, a second memory cell and a sense amplifier. The sense amplifier includes a first branch and a second branch and are configured to output a first voltage and a second voltage to the first memory and the second memory, respectively in a trimming operation. A first clamp device of the sense amplifier includes a first clamp transistor and a plurality of first trimming transistors that are coupled to the first clamp transistor in parallel. The gate terminals of the first clamp transistor and the plurality of first trimming transistors are biased by a fixed clamp voltage. Each of the plurality of first trimming transistors is selectively conducted to compensate a mismatch between the first voltage and the second voltage.

Abstract: Disclosed herein is an apparatus that includes a plurality of column planes each including a plurality of bit lines, an access control circuit configured to select one of the plurality of bit lines in each of the plurality of column planes based on a column address to read a plurality of data-bits, a data generating circuit configured to generate an expected-bit based at least in part on the data-bits, and an analyzing circuit configured to generate a fail-bit data indicating which one of the data-bits does not match the expected-bit when one of the data-bits does not match the expected-bit.

Abstract: A read-out circuit and a read-out method for a three-dimensional memory, comprises a read reference circuit and a sensitive amplifier, the read reference circuit produces read reference current capable of quickly distinguishing reading low-resistance state unit current and reading high-resistance state unit current. The read reference circuit comprises a reference unit, a bit line matching module, a word line matching module and a transmission gate parasitic parameter matching module. With respect to the parasitic effect and electric leakage of the three-dimensional memory in the plane and vertical directions, the present invention introduces the matching of bit line parasite parameters, leakage current and transmission gate parasitic parameters into the read reference current, and introduces the matching of parasitic parameters of current mirror into the read current, thereby eliminating the phenomenon of pseudo reading and reducing the read-out time.

Abstract: A semiconductor storage device includes a bit line, a memory cell transistor electrically connected to the bit line, and a sense amplifier that reads data from the memory cell transistor via the bit line. During an operation of determining first data and second data, while continuously applying a first voltage to a gate of the memory cell transistor, the sense amplifier first determines the first data based upon a second voltage, and then determines the second data based upon a third voltage lower than the second voltage.

Abstract: Memory devices might include an array of memory cells including a plurality of strings of series-connected memory cells, a plurality of access lines, a common source, a plurality of data lines, a plurality of shield lines, and control logic. Each access line might be connected to a control gate of a respective memory cell of each string of series-connected memory cells. Each string of series-connected memory cells might be selectively connected between the common source and a respective data line. The plurality of shield lines might be interleaved with the plurality of data lines. The control logic might be configured to implement a program verify operation of respective memory cells coupled to a selected access line including sensing a voltage level on each data line to determine whether each respective memory cell coupled to the selected access line has been programmed to a target level for the respective memory cell.

Abstract: An in-memory computing system for computing vector-matrix multiplications includes an array of resistive memory devices arranged in columns and rows, such that resistive memory devices in each row of the array are interconnected by a respective word line and resistive memory devices in each column of the array are interconnected by a respective bitline. The in-memory computing system also includes an interface circuit electrically coupled to each bitline of the array of resistive memory devices and computes the vector-matrix multiplication between an input vector applied to a given set of word lines and data values stored in the array. For each bitline, the interface circuit receives an output in response to the input being applied to the given wordline, compares the output to a threshold, and increments a count maintained for each bitline when the output exceeds the threshold. The count for a given bitline represents a dot-product.

Abstract: A device is disclosed. The device includes a first tracking control line, a first tracking circuit, a first sense circuit, and a precharge circuit. The first tracking control line is configured to transmit a first tracking control signal. The first tracking circuit is configured to generate, in response to the first tracking control signal, a first tracking signal associated with first tracking cells in a memory array. The first sense circuit is configured to receive the first tracking signal, and is configured to generate a first sense tracking signal in response to the first tracking signal. The precharge circuit is configured to generate, in response to a rising edge of the first sense tracking signal and a falling edge of a read enable delayed signal, a precharge signal for precharging data lines associated with memory cell in the memory array. A method is also disclosed herein.

Abstract: A semiconductor storage device includes a first boosting circuit, a second boosting circuit, a first driver circuit that is activated when a first output voltage generated by the first boosting circuit is supplied thereto, and a first driver transistor that is controlled by the first driver circuit and coupled between a power supply line and the second boosting circuit.

Abstract: Memory devices and methods of operating memory devices in which maintenance operations can be scheduled on an as-needed basis for those memory portions where activity (e.g., operations in excess of a predetermined threshold) warrants a maintenance operation are disclosed. In one embodiment, an apparatus comprises a memory including a memory location, and circuitry configured to determine a count corresponding to a number of operations at the memory location, to schedule a maintenance operation for the memory location in response to the count exceeding a first predetermined threshold, and to decrease the count by an amount corresponding to the first predetermined threshold in response to executing the scheduled maintenance operation. The circuitry may be further configured to disallow, in response to determining that the count has reached a maximum permitted value, further operations at the memory location until after the count has been decreased.

Abstract: According to an embodiment of the present disclosure, a semiconductor memory device includes a bit line sense amplifier coupled between a pull-up voltage line and a pull-down voltage line, and suitable for sensing a voltage difference between first and second bit lines by sequentially performing a precharge operation, an offset cancellation operation, a charge sharing operation, and an amplification operation, wherein the bit line sense amplifier pre-biases a voltage level of the second bit line depending on a voltage level of the first bit line during the charge sharing operation; and a driving circuit suitable for supplying operating voltages to the pull-up voltage line and the pull-down voltage line during the offset cancellation operation, the charge sharing operation, and the amplification operation.

Abstract: A memory device that is operable at a first voltage domain and a second voltage domain includes a memory array, a power saving mode pin and a word line level shifter circuit. The memory array operates at the first voltage domain. The power saving mode pin is configured to receive a power saving mode enable signal that is at the second voltage domain. The power saving mode enable signal is configured to enable a power saving mode of the memory device. The word line level shifter circuit is coupled to the memory array and the power saving mode pin, and is configured to clamp a word line of the memory array to a predetermined voltage level that corresponds to a first logic state during the power saving mode of the memory device.

Abstract: A semiconductor device that can reduce power consumption while improving the accuracy of learning and inference is provided. The semiconductor device is connected to data lines PBL, NBL, and comprises a product operation memory cell 1 for storing data of ternary value and performing a product-sum operation between a stored data and an input data INP and a data in the data lines PBL, NBL.

Abstract: A display apparatus includes a display panel, a first gate driver, a second gate driver, a third gate driver, and a data driver. The display apparatus is operable in a low frequency driving mode, and the low frequency driving mode includes a writing frame and a holding frame. At least one of gate power voltages used to generate a first gate signal, a second gate signal, and an emission signal has a first voltage level in the writing frame of the low frequency driving mode and a second voltage level in the holding frame of the low frequency driving mode. The data voltage is applied to the pixel in the writing frame of the low frequency driving mode. The data voltage applied to the pixel in the writing frame of the low frequency driving mode is maintained in the holding frame of the low frequency driving mode.

Abstract: A memory is provided that is configured to practice both a conventional normal read operation and also a burst mode read operation. During the normal read operation, the memory pre-charges the bit lines in a group of multiplexed columns. Each column has a sense amplifier that latches a bit decision for the column during the normal read operation. If a subsequent read operation addresses the same group of multiplexed columns, the memory invokes the burst-mode read operation during which the bit lines are not pre-charged.

Abstract: A semiconductor storage device includes a memory cell array, a peripheral circuit configured to perform writing of data to the memory cell array and reading of data from the memory cell array, and a sampling circuit configured to execute a sampling process by which sampling data is collected from a predetermined node of the peripheral circuit, during a period in which the peripheral circuit performs the writing of data to the memory cell array or the reading of data from the memory cell array.

Abstract: The present application provides a semiconductor die with decoupling capacitors and a manufacturing method of the semiconductor die. The semiconductor die includes first bonding pads, second bonding pads, bond metals and decoupling capacitors. The first bonding pads are coupled to a power supply voltage. The second bonding pads are coupled to a reference voltage. The bond metals are disposed on central portions of the first and second bonding pads. The decoupling capacitors are disposed under the first and second bonding pads, and overlapped with peripheral portions of the first and second bonding pads. The decoupling capacitors are in parallel connection with one another. First terminals of the decoupling capacitors are electrically connected to the first bonding pads, and second terminals of the decoupling capacitors are electrically connected to the second bonding pads.

Abstract: A first memory cell is coupled to first and third interconnects. A second memory cell is coupled to second and fourth interconnects. A first sense amplifier has a first terminal coupled to the first interconnect and a node of a first potential and a second terminal located close to a node of a second potential and coupled to the third interconnect and has a potential difference between the first and second terminals. A second sense amplifier has a third terminal coupled to the fourth interconnect and a node of a third potential and a fourth terminal located close to a node of a fourth potential and coupled to the second interconnect and has a potential difference between the third and fourth terminals.

Abstract: An input circuit includes: a buffer circuit coupled to a pad, the buffer circuit being driven by a first power voltage; a level shifter circuit coupled to an output terminal of the buffer circuit, the level shifter circuit being driven by a second power voltage; and a voltage stabilization circuit coupled to an input node of the level shifter circuit, the voltage stabilization circuit being driven by the first power voltage and the second power voltage. The voltage stabilization circuit maintains a voltage of the input node of the level shifter circuit equal to or less than a given level sufficient to keep an output signal of the level shifter circuit at a specific logic value, when a voltage level of the second power voltage is rising and a voltage level of the first power voltage is kept at a low level.

Abstract: A method for programming three page user data in a memory array of a non-volatile memory system, comprising converting each three-bit value data pattern of the user data into a representative pair of two-bit data values, simultaneously programming two single-state memory cells with a first of the pair of representative two-bit data values, wherein the two single-state memory cells are located along a first common word line of two memory cell strings, and simultaneously programming two single-state memory cells with a second of the pair of representative two-bit data values, wherein the two single-state memory cells are located along a second common word line of the two memory cell strings.

Abstract: Methods, systems, and devices for word line capacitance balancing are described. A memory device may include a set of memory tiles, where one or more memory tiles may be located at a boundary of the set. Each boundary memory tile may have a word line coupled with a driver and a subarray of memory cells, and may also include a load balancing component (e.g., a capacitive component) coupled with the driver. In some examples, the load balancing component may be coupled with an output line of the driver (such as a word line) or an input of the driver (such as a line providing a source signal). The load balancing component may adapt a load output from the driver to the subarray of memory cells such that the load of the memory tile at the boundary may be similar to the load of other memory tiles not at the boundary.

Abstract: An input/output circuit including: an input circuit configured to load differential input data to setup nodes based on a data strobe clock; an output circuit configured to compare and amplify the data loaded to the setup nodes, and output differential output data; and a voltage retention circuit configured to retain the setup nodes at voltage levels corresponding to the differential output data, based on the data strobe clock and the differential output data.

Abstract: In some examples, a subword driver block of a memory device includes a plurality of active regions of a first type and a plurality of active regions of a second type adjacent to the plurality of active regions of the first type. The subword driver block further includes a plurality of first gate electrodes overlapping with the plurality of active regions of the first type to form a plurality of first transistors, and a plurality of second gate electrodes overlapping with the plurality of active regions of the first type to form a plurality of second transistors. Each of the second transistors is shared by a first subword driver and a second subword driver. Each of the second transistors may include a drain and a source respectively coupled to a first and second word line, which are driven by the first subword driver and the second subword driver, respectively.

Abstract: The present disclosure provides a sense amplifier, a memory, and a method for controlling a sense amplifier, relating to the technical field of semiconductor memories. The sense amplifier comprises: an amplification module; and a control module, electrically connected to the amplification module; wherein, in an offset compensation stage of the sense amplifier, the control module is used to configure the amplification module to comprise a diode structure, a current mirror structure, and an inverter with an input and an output connected together; and in a first amplification stage of the sense amplifier, the control module is used to configure the amplification module as an inverter. The present disclosure can realize the offset compensation of the sense amplifier, thereby improving the performance of semiconductor memories.

Abstract: The present invention provides a sensitivity amplifier, its control method, a memory read-write circuit and a memory device. The sensitivity amplifier includes: a first PMOS transistor and a second PMOS transistor, a first NMOS transistor and a second NMOS transistor, a first input/output terminal, and a second input/output terminal; four switch unit, the first PMOS and the first NMOS transistors are respectively connected to the first input/output terminal through one switch unit, the second PMOS and the second NMOS transistors are respectively connected to the second input/output terminal through another switch unit. The switch units configure each PMOS transistor and each NMOS transistor in an amplifier mode or in a diode mode. The first NMOS transistor's gate connects to the bit line, and the second NMOS transistor's gate connects to the reference bit line. The disclosed sensitivity amplifier has improved performance.

Abstract: A semiconductor device is provided. The device includes a memory that stores data in a non-volatile and volatile manner and a memory controller configured to control the memory. The memory includes a word line pair including a first and second word line, a first bit line pair orthogonal to the first and the second word line and including a first bit line and a first complementary bit line, and a memory cell pair including first and second memory cells adjacent to the first memory cell in a word line direction. A left node of the first memory cell, and a right node of the first memory cell and a left node of the second memory cell, are all connected to the first word line, and a value of the data stored in the memory cell pair in the non-volatile manner is determined according to the selected first word line.

Abstract: A bitline precharge system is provided for a semiconductor memory device. The bitline precharge system comprises a voltage comparator circuit to output a reference voltage signal based on an input wordline voltage supply level (VDDWL), and a periphery power supply voltage (VDDP) level. A voltage control circuit is electrically coupled to a periphery power supply and the voltage comparator circuit to output a precharge voltage (VDDM) level based on the reference voltage signal and the periphery power supply voltage (VDDP) level. A bitline precharge circuit is electrically coupled to the voltage control circuit and a plurality of bitlines of the memory device to precharge the plurality of bitlines based on the precharge voltage (VDDM) level in response to a precharge enable signal during one of a read operation to read data from the memory device and a write operation to write data from the memory device.

Abstract: A twelve-transistor (12T) memory cell for a memory device that includes a transmission gate, a cross-coupled inverter circuit operably connected to the transmission gate, and a tri-state inverter operably connected to the cross-coupled inverter circuit. The cross-coupled inverter includes another tri-state inverter cross-coupled to an inverter circuit. Various operations for the 12T memory cell, as well as circuitry to perform the operations, are disclosed.

Abstract: A memory device for sensing memory cell in a memory array includes at least one first memory cell, a first sensing amplifier, a first multiplexer circuit, a plurality of first reference cells, and a controller. The first sensing amplifier is coupled to the at least one first memory cell. An output terminal of the first multiplexer circuit is coupled to the reference terminal of the first sensing amplifier. Each of the first reference cells is coupled to each input node of the first multiplexer circuit. The controller is coupled to a control terminal of the first multiplexer circuit. The first sensing amplifier comprises an output terminal and a reference terminal. The controller controls the first multiplexer circuit to select one of the first reference cells as a selected reference cell to couple to the reference terminal of the first sensing amplifier when each read operation to the at least one first memory cell is performed.

Abstract: A resistance measuring device includes an amplifying unit including an amplifier, a first and a second current supply unit, a voltage detection unit, and a controller. The controller controls the voltage detection unit to detect a first output voltage of an output terminal of the amplifier in a state where the current of the first current source flows in a forward direction to a measurement target resistor by controlling the first current supply unit, controls the voltage detection unit to detect a second output voltage of the output terminal of the amplifier in a state where the current of the second current source flows in a reverse direction to the measurement target resistor by controlling the second current supply unit, and calculates a resistance value of the measurement target resistor based on the detected first output voltage and the detected second output voltage.