Abstract: Subject matter disclosed herein relates to accessing memory, and more particularly to operation of a partitioned bitline.

Abstract: A memory is disclosed that includes a plurality of memory cells, a plurality of sense amplifiers for reading data of the memory cells, and a voltage regulator coupled to the plurality of sense amplifiers. The voltage regulator includes a reference sense amplifier, a current injector, and a current injector control circuit. The current injector control circuit controls an amount of current provided by the current injector to an output node of the voltage regulator based on a voltage of the reference sense amplifier.

Abstract: A semiconductor memory device includes; a memory cell array comprising a first sub-memory cell array storing first data having a first characteristic and a second sub-memory cell array storing second data having a second characteristic different from the first characteristic, a first peripheral circuit operatively associated with only the first sub-memory cell array to execute at least one of a read operation and a write operation directed to a target memory cell of the first sub-memory cell array, and a second peripheral circuit operatively associated with only the second sub-memory cell array to execute at least one of a read operation and a write operation directed to a target memory cell of the second sub-memory cell array.

Abstract: A phase change memory device includes: a memory cell arranged at a region where a word line and a bit line cross each other; and a control logic including: a program control logic configured to control a program operation of the memory cell; a read control logic configured to control a read operation of the memory cell; and an operation complete signal transfer unit configured to adjust a transfer time point of an operation complete signal transferred between the program control logic and the read control logic.

Abstract: A semiconductor memory device in which capacitance of a capacitor is lower and integration degree is higher. A plurality of memory blocks is connected to one bit line BL_m. A memory block MB_n_m includes a sub bit line SBL_n_m, a write switch, and a plurality of memory cells. A sub bit line SBL_n+1_m adjacent to the sub bit line SBL_n_m is connected to an amplifier circuit AMP_n/n+1_m including two inverters and two selection switches. A circuit configuration of the amplifier circuit can be changed with the selection switches. The amplifier circuit is connected to the bit line BL_m through a read switch. Because of a sufficiently low capacitance of the sub bit line SBL_n_m, potential change due to electric charges of the capacitor in each memory cell can be amplified by the amplifier circuit AMP_n/n+1_m without an error, and the amplified data can be output to the bit line BL_m.

Abstract: Systems and methods are provided for a random access memory controller. A random access memory controller includes a column multiplexer and sense amplifier pair, where the column multiplexer and sense amplifier pair includes a column multiplexer and a sense amplifier that are configured to utilize common circuitry. The common circuitry is shared between the column multiplexer and the sense amplifier so that the memory controller includes a single instance of the common circuitry for the column multiplexer and sense amplifier pair. The common circuitry includes a common pre-charge circuit, a common equalizer, or a common keeper circuit.

Abstract: A cell sensing circuit for a phase changing memory and methods thereof are provided. A specific one of the proposed methods includes: providing a sensing circuit having a sense amplifier, and two identical stable currents respectively received by a reference cell and a target cell; establishing a cell voltage on a cell side and a reference voltage on a reference side respectively via the two identical stable currents; and using the sense amplifier to determine a logic state of the target cell based on a voltage difference between the reference voltage and the cell voltage.

Abstract: A semiconductor device includes a memory cell array configured to include a plurality of memory cells connected between a plurality of bit lines and a plurality of word lines, a bit line sense amplifier connected to a bit line of the bit lines and configured to amplify data stored in a selected memory cell and transfer the amplified data to a segment I/O line, a control signal generator configured to determine a level of an I/O switch control signal in response to a level of a power source voltage, and a local sense amplifier connected between the segment I/O line and an local I/O line and configured to couple or separate the segment I/O line and the local I/O line in response to the I/O switch control signal, amplify the data transferred to the segment I/O line, and supply the amplified data to the local I/O line.

Abstract: Methods and systems for time-based cell decoding for PCM memory. Generally, the higher the PCM element resistance, the longer it takes for a read output to change state. PCM memory output is determined using differentiated timings of read outputs changing state, rather than differentiated values of read outputs. In some single-bit single-ended sensing embodiments, a reference, with resistance between the resistances corresponding to a pair of adjacent logical states, is stored in multiple reference cells; a “vote” unit emits a clock signal when a majority of the reference cell read outputs transition at the vote unit. Timing units produce different binary outputs depending on whether a data read output or the clock signal changes state first at the timing unit. Time-based decoding provides advantages including improved temperature and drift resilience, improved state discrimination, improved reliability of multibit PCM, and fast and reliable sensing.

Abstract: A device may include, but is not limited to, a bit line; a power line supplied with a power voltage; a sense amplifier circuit amplifying a voltage of the bit line by using the power voltage of the power line; and a control circuit configured to respond to an active command and supply, as the power voltage, the power line with a first voltage during a first period and a second voltage lower than the first voltage during a second period. The control circuit is further configured to respond to a refresh command and supply, as the power voltage, the power line with the second voltage during both the first and second periods.

Abstract: A sense amplifier circuit for a nonvolatile memory that includes a first amplifier to perform a switching operation to output a first signal on a sense amplifier based logic (SABL) node depending on the state of a sensing enable signal, a second amplifier to perform a switching operation to output a second signal on the SABL node depending on the state of the sensing enable signal, a current mirror that sinks current on the SABL node depending on the sensing enable signal and a bit line signal, and an inverter arranged to output the signal on the SABL node as a data signal.

Abstract: Handshaking sense amplifier. In accordance with a first embodiment, an electronic circuit includes a sense amplifier configured to differentially sense contents of a memory cell. The circuit also includes a self-timing circuit configured to detect a completion of evaluation by the sense amplifier; and to initiate a subsequent memory operation responsive to the completion. A completion of evaluation may not be aligned with a clock edge.

Abstract: Systems and methods for reducing the power consumption of memory devices. A method of operating a memory device may include monitoring a plurality of sense amplifiers, each sense amplifier configured to evaluate a logic value stored in a memory cell, determining whether each of the plurality of sense amplifiers has completed its evaluation, and stopping a reference current from being provided to the sense amplifiers in response to all of the sense amplifiers having completed their evaluations. An electronic circuit may include memory cells, sense amplifiers coupled to the memory cells, transition detection circuits coupled to the sense amplifiers, and control circuitry coupled to the transition detection circuits, the transition detection circuits configured to stop a reference current from being provided to the sense amplifiers if each transition detection circuit determines that its respective sense amplifier has identified a logic value stored in a respective memory cell.

Abstract: Nonvolatile memory devices including memory cell arrays with first bit line regions and common source tapping regions which are alternately disposed on a substrate along a direction, a page buffer including second bit line regions aligned with the first bit line regions and page buffer tapping regions aligned with the common source tapping regions, and a plurality of bit lines spaced apart from one another and extending to the second bit line regions from the first bit line regions.

Abstract: A semiconductor memory device having an open bitline memory structure from which an edge dummy memory block is removed, the semiconductor memory device includes a memory block, an edge sense amplification block including a first sense amplifier having a first bitline, a first complementary bitline, and a first amplification circuit comprising a first transistor having a first size, a central sense amplification block including a second sense amplifier having a second bitline, a second complementary bitline, and a second amplification circuit comprising a second transistor having a second size different from the first size, a capacitor block electrically connected to the edge sense amplification block.

Abstract: A method of writing to a magneto tunnel junction (MTJ) includes writing data to the MTJ, reading the written data using a first reference MTJ and reading the written data using a second reference MTJ. Based on the reading steps and the result of the comparing step, setting a select bit to select the proper reference for future reads.

Abstract: A precharge circuit includes a precharge unit configured to apply a voltage of a precharge voltage terminal to a data line during a precharge operation, and a sensing unit configured to disable the precharge unit by sensing the voltage of the precharge voltage terminal. The precharge circuit may control a precharge operation by sensing a change in the voltage level of the precharge voltage terminal.

Abstract: Methods for reducing variability in bias voltages applied to a plurality of memory cells during a sensing operation caused by IR drops along a word line shared by the plurality of memory cells are described. In some embodiments, IR drops along a shared word line may be reduced by reducing sensing currents associated with memory cells whose state has already been determined during a sensing operation. In one example, once a sense amplifier detects that a memory cell being sensed is in a particular state, then the sense amplifier may disable sensing of the memory cell and discharge a corresponding bit line associated with the memory cell. In some cases, a bit line voltage associated with a memory cell whose state has not already been determined during a first phase of a sensing operation may be increased during a second phase of the sensing operation.

Abstract: In embodiments of the invention, a memory circuit includes a static random access memory (SRAM), rows of M sense amplifiers, a global read precharge tracking control circuit controlling a precharge of global read lines, a sense amplifier output tracking circuit generating a reset sense amplifier signal for the sense amplifier control circuits, and a read delay circuit generating a trigger signal for the global read precharge tracking control circuit and the sense amplifier output tracking circuit and performing a fixed delay tracking of a read operation in a read cycle. A dummy global read line is coupled to the global read precharge tracking control circuit and returns from a half way to the top of the SRAM forming a tracking dummy global read line that determines a completion of the precharge of the global read lines before the sense amplifiers start discharging the global read lines in the read cycle.

Abstract: The first input circuit detects an input signal to output a first output signal having the same phase as the input signal. The second input circuit is configured to detect a first strobe signal to output a second output signal. The third input circuit is configured to detect a second strobe signal as a reversed signal of the first strobe signal to output a third output signal. A data latch circuit includes a first latch circuit and a second latch circuit. It is configured to latch the first output signal in either one of the first latch circuit or the second latch circuit according to the first output signal, the second output signal and the third output signal. It also allows the other one of the first latch circuit or the second latch circuit to input the first output signal thereto.

Abstract: Methods and systems for time-based cell decoding for PCM memory. Generally, the higher the PCM element resistance, the longer it takes for a read output to change state. PCM memory output is determined using differentiated timings of read outputs changing state, rather than differentiated values of read outputs. In some single-bit single-ended sensing embodiments, a reference, with resistance between the resistances corresponding to a pair of adjacent logical states, is stored in multiple reference cells; a “vote” unit emits a clock signal when a majority of the reference cell read outputs transition at the vote unit. Timing units produce different binary outputs depending on whether a data read output or the clock signal changes state first at the timing unit. Time-based decoding provides advantages including improved temperature and drift resilience, improved state discrimination, improved reliability of multibit PCM, and fast and reliable sensing.

Abstract: Various embodiments may generally be directed to a variable resistance data storage device and a method of managing the device. A data storage device may have at least a controller configured to re-characterize at least one variable resistance memory cell in response to an identified variance from a predetermined resistance threshold.

Abstract: A semiconductor device avoids the disturb problem and the collision between write and read operations in a DP-SRAM cell or a 2P-SRAM cell. The semiconductor device 1 includes a write word line WLA and a read word line WLB each coupled to memory cells 3. A read operation activates the read word line WLB corresponding to the selected memory cell 3. A write operation activates the write word line WLA corresponding to the selected memory cell 3. The selected write word line WLA is activated after activation of the selected read word line WLB in an operation cycle that performs both read and write operations.

Abstract: A memory device uses a global input/output line or a pair of complementary global input/output lines to couple write data signals and read data signals to and from a memory array. The same input/output line or pairs of complementary global input/output lines may be used for coupling both write data signals and read data signals.

Abstract: A data split between a first data line and a second data line is caused to develop. At least one of the following sets of steps is performed: 1) a first power supply line of a sense amplifier is caused to rise towards a first power supply voltage value, and when the first power supply line reaches a first predetermined voltage value, the first power supply is caused to rise above the first power supply voltage value; and 2) a second power supply line of the sense amplifier is caused to fall towards a second power supply voltage value, and when the second power supply line reaches a second predetermined voltage value, the second power supply line is caused to fall below the second power supply voltage value.

Abstract: A memory includes memory cells each storing data according to a change in a resistance state, and reference cells referred to in order to detect data stored in the memory cells. Sense amplifiers compare reference data in the reference cells with data in the memory cells to detect the data in the memory cells. A counter counts a number NH of the memory cells having a resistance higher than a resistance of each reference cell or a number NL of the memory cells having a resistance lower than the resistance of each reference cell based on a result of detecting first logical data stored in the memory cells using each reference cell storing the first logical data. A determining part determines one of the reference cells as an optimum reference cell used in an actual data reading operation based on the number NH or NL for the reference cells.

Abstract: A semiconductor integrated circuit device includes a first signal line and a second signal line, and a sense amplifier that includes a plurality of PMOS transistors and a plurality of NMOS transistors. The sense amplifier is configured to sense amplify a potential difference between the first signal line and the second signal line. The junction regions of the NMOS and PMOS transistors having the same conductivity type, and to which the same signal is applied, are formed in one integrated active region.

Abstract: A nonvolatile memory apparatus includes a memory cell configured to receive a first current and a second current through a bit line which is connected to a sensing node; a sensing node level control unit configured to be driven in response to a control signal, compare a reference voltage and a voltage of the sensing node, and output a driving signal to a driving node; a first current driving unit configured to output the first current to the driving node by using a first driving voltage in response to the driving signal; and a current control unit configured to perform a discharge operation of the bit line or electrically connect the driving node and the sensing node, in response to the control signal.

Abstract: A semiconductor apparatus with an open bit line structure includes a memory bank including a plurality of memory cell blocks and dummy mats, in which a plurality of bit lines are formed, a bit line sense amplifier configured to be arranged between the plurality of memory cell blocks and the dummy mats, compare a voltage difference between a bit line and a complementary bit line, and amplify the difference, and a dummy word line driving unit configured to selectively activate a dummy word line of the dummy mat in response to a test mode.

Abstract: Voltage coupling/decoupling devices are provided within DRAM devices for improving the bias sensing of sense amplifiers and thus the refresh performance. The voltage coupling/decoupling devices couple or decouple bias voltage from corresponding digit lines coupled to the sense amplifiers. By coupling and decoupling voltage from the digit lines, the time interval between refresh operations can be increased.

Abstract: Techniques for reducing disturbance in a semiconductor memory device are disclosed. In one particular exemplary embodiment, the techniques may be realized as a semiconductor memory device having reduced disturbance. The semiconductor memory device may comprise a plurality of memory cells arranged in arrays of rows and columns. The semiconductor memory device may also comprise a plurality of data sense amplifiers, coupled to the plurality of memory cells, configured to perform one or more operations during an operation/access cycle, wherein the operation/access cycle may comprise an operation segment and a disturbance recovery segment.

Abstract: A semiconductor memory includes a circuit block that is configured to receive a test mode command, a first sense amplifier that is coupled to sense and amplify a state of a first memory cell when enabled, and a second sense amplifier that is coupled to sense and amplify a state of a second memory cell when enabled. In an active cycle, the circuit block generates one or more control signals in response to the test mode command that cause the second sense amplifier to be enabled a predetermined amount of time after the first sense amplifier is enabled.

Abstract: A semiconductor memory device includes a memory cell unit including a plurality of memory cells coupled between a plurality of word lines and a plurality of bit lines, and configured to provide a read value in response to an activated word line, a reference value generating unit including a plurality of reference value generating cells coupled between the plurality of word lines and a reference bit line, and configured to provide a single reference value in response to the activated word line, and a sense circuit configured to provide a sense output signal based on the single reference value and the read value.

Abstract: Described are dynamic, random-access memories (DRAM) architectures and methods for subdividing memory activation into fractions of a page. Circuitry in support of sub-page activation is placed in the intersections of local wordline drivers and sense-amplifier stripes to allow independent control of adjacent arrays of memory cells without significant area overhead.

Abstract: A system on chip (SoC) includes one or more core logic blocks that are configured to operate on a lower supply voltage and a memory array configured to operate on a higher supply voltage. Each bitcell in the memory has two ferroelectric capacitors connected in series between a first plate line and a second plate line to form a node Q. A data bit voltage is transferred to the node Q by activating a write driver to provide the data bit voltage responsive to the lower supply voltage. The data bit voltage is boosted on the node Q by activating a sense amp coupled to node Q of the selected bit cell, such that the sense amp senses the data bit voltage on the node Q and in response increases the data bit voltage on the node Q to the higher supply voltage.

Abstract: Embodiments of the invention provide a sense amplifier, a SRAM chip comprising the sense amplifier and a method of performing read operation on the SRAM chip. The sense amplifier according to embodiments of the invention comprises an additional driving assist portion, which further takes a global data bus as input, the driving assist portion is configured to enable the sense amplifier to provide assisted driving for other sense amplifiers. With the solution according to embodiments of the invention, driving capability of a sense amplifier on global data bus can be enhanced.

Abstract: A sensing amplifier using capacitive coupling and a dynamic reference voltage, where the sensing amplifier circuit includes a bit line, configured to receive charging and discharging signals; a sensing amplifier, connected to the bit line and configured to receive the bit line and a reference voltage for comparison and configured to enlarge the voltage difference between a high point and a low point; and a reference voltage generator, connected to the sensing amplifier to generate the reference voltage required for the sensing amplifier to compare. The sensing amplifier effectively enhances sensing margin of the sensing amplifier circuit; and in addition, to accelerate the access speed, the sensing amplifier can easily determine the correct stored data and further quickly solve the problems of high-speed storing the data by the storage units.

Abstract: The disclosure relates to a device for storing a frequency, wherein the device comprises (i) a comparator having an input, an output, a supply voltage input, and a supply voltage output, and (ii) a memristor connected between the input and the comparator and the output of the comparator.

Abstract: A sense amplifier includes a first inverter including a first input node and a first output node, the first input node coupled to a first bitline through a first capacitor, the first output node coupled to a second bitline through a second capacitor, a second inverter including a second input node and a second output node, the second input node coupled to the second bitline through the second capacitor, the second output node to the first bitline through the first capacitor, a first transmission gate switch coupled between the first input node and the second input node, a second transmission gate switch coupled between a first common node of the first and second inverters and a second common node of the first and second inverters. The sense amplifier is maintained at a maximum gain point in a read cycle.

Abstract: A cross-point variable resistance nonvolatile memory device comprises: a memory cell array; a column decoder and pre-charge circuit which pre-charges a selected word line to a first voltage in a period P1 among the period P1, a period P2, and a period S that are included in this order in a read operation of a memory cell; a low decoder driver which pre-charges a selected word line to the first voltage in the periods P1 and P2 and sets the selected word line to a third voltage different from the first voltage in the period S; a feedback controlled bit line voltage clamp circuit which sets the selected bit line to a second voltage in the periods P2 and S; and a sense amplifier which determines the resistance state in a memory cell at a cross-point of the selected word line and the selected bit line in the period S.

Abstract: Embodiments of a memory are disclosed that may allow for the detection of weak data storage cells or may allow operation of data storage cells under conditions that may represent the effects of transistor ageing. The memory may include data storage cells, a column multiplexer, a sense amplifier, and a current injector. The current injector may be configured to generate multiple current levels and may be operable to controllably select one of the current levels to either source current to or sink current from the input of the sense amplifier.

Abstract: Embodiments include systems, methods, and apparatuses for reading a data signal from a memory, such as a dynamic random access memory (DRAM). In one embodiment, a memory receiver may include a differential amplifier to receive a data signal from the memory and pass a differential output signal based on a voltage difference between the data signal and a reference voltage. The data signal may have a first direct current (DC) average voltage level, and the differential amplifier may shift the differential output signal to a second DC average voltage level that is substantially constant over a range of values of the first DC average voltage level. In another embodiment, a voltage offset compensation (VOC) circuit may apply a compensation voltage to the output signal that is based on an activated rank or an identity of the memory module. Other embodiments may be described and claimed.

Abstract: In a static random access memory (SRAM) device having a hierarchical bit line architecture, a local sense amplifier (SA) circuit includes P-channel transistors which precharge local bit lines connected to memory cells, P-channel transistors each having a gate connected to a corresponding one of the local bit lines and a drain connected to a corresponding one of global bit lines, and N-channel transistors each having a gate connected to a corresponding one of the global bit lines and a drain connected to a corresponding one of the local bit lines. As a result, restore operation to a non-selected memory cell during write operation can be achieved without the need of a fine timing control, the speed of read operation by a feedback function can be increased, and the area can be reduced.

Abstract: A Static Random Access Memory (SRAM) cell includes a first long boundary and a second long boundary parallel to a first direction, and a first short boundary and a second short boundary parallel to a second direction perpendicular to the first direction. The first and the second long boundaries are longer than, and form a rectangle with, the first and the second short boundaries. A CVss line carrying a VSS power supply voltage crosses the first long boundary and the second long boundary. The CVss line is parallel to the second direction. A bit-line and a bit-line bar are on opposite sides of the CVss line. The bit-line and the bit-line bar are configured to carry complementary bit-line signals.

Abstract: Disclosed herein is a device that includes: first and second memory mats each including a plurality of bit lines; a sense area arranged between the first and second memory mats; a column selection line provided on the first memory mat; and a compensation capacitance provided on the second memory mat. The sense area includes a plurality of sense amplifiers. Each of the sense amplifiers is connected to an associated one or ones of the bit lines. At least one of the sense amplifiers is selected based on a column selection signal supplied via the column selection line. At least a part of the compensation capacitance is formed in a same wiring layer as the column selection line.

Abstract: According to one embodiment, a semiconductor storage device includes cells, and a sense amplifier. Each of the cells is connected to a bit line. The sense amplifier reads out data. The sense amplifier includes a first transistor to third transistor, and a switch. The first transistor has one end of a current path, the other end, and a gate. The second transistor has one end, and the other end. The second transistor has one of a first and a second supply ability. The third transistor has one end, and the other end. The third transistor has one of a third and a fourth supply ability. The switch grounds the second and the third transistors. The sense amplifier turns off the first transistor after transferring the data to an outside, and supplies the second signal to the switch to set gates of the second transistor and third transistor to ground.

Abstract: A signal driving device includes a constant current circuit configured to provide a constant current, a first mirror circuit configured to generate a mirror current from the constant current and provide a voltage according to the mirror current of the constant current, a circuit comprising a switch device and configured to provide a driver current, a second mirror circuit configured to generate a mirror current of the driver current and output a voltage that includes a voltage drop caused when the mirror current of the driver current flows through a replica switch device, and a differential amplifier configured to receive the voltage from the first mirror circuit and the voltage from the second mirror circuit to provide a biased voltage for the bias circuit and thereby induce the driver current.

Abstract: A data sensing circuit includes: a current source configured to supply a reference current to an output line; a switching precharging unit configured to couple an input line with the output line during a precharge operation of the input line; and a current sinking unit configured to sink a current from the output line in response to a voltage level of the input line.

Abstract: A static RAM includes: a plurality of word lines; a plurality of pairs of local bit lines; a plurality of memory cells arranged in correspondence with intersections of the plurality of pairs of local bit lines and the plurality of word lines; a capacitance shared circuit arranged for each of the plurality of pairs of local bit lines; a common connection line connecting the plurality of capacitance shared circuits; and a pair of global bit lines connected to the plurality of pairs of local bit lines, wherein the capacitance shared circuit includes two N-channel transistors connected between the pair of local bit lines and the common connection line corresponding to each other.

Abstract: Embodiments relate to memory devices and methods for firmly programming at least a portion of a plurality of electronically programmable and erasable nonvolatile memory cells in a processing of the nonvolatile memory devices.