In Spaced Noncontact Relationship To Specimen Patents (Class 374/120)
- By microwave arrangement (Class 374/122)
- Transparent material measurement or compensation (e.g., spectral line, gas, particulate suspension (Class 374/123)
- With scanning or temperature distribution display (Class 374/124)
- With fluid flow purging device (Class 374/125)
- Having emissivity compensating or specified radiating surface (Class 374/126)
- Having significant frequency limitation or relationship (e.g., peak, ratio) (Class 374/127)
- Having significant signal handling circuitry (e.g., linearizing, emissivity compensation) (Class 374/128)
- Comparison with radiation reference standard (Class 374/129)
- Optical system structure (e.g., lens) (Class 374/130)
- Sensor or mounting temperature control (Class 374/132)
- Ambient temperature compensated (e.g., dummy sensor) (Class 374/133)