Testing System Patents (Class 702/108)
  • Publication number: 20130054176
    Abstract: An anomaly detection and cataloging system is described that includes a handheld probe having a probe tip, a user interface, and a communications interface. The system further includes a system controller and a probe locating device. The probe is operable, via the user interface, for transmitting, via the communications interface, a user selected anomaly type to the system controller, the anomaly type being associated with a manufactured part or airplane on the ground (AOG). The probe locating device is operable to provide to the system controller a location associated with the probe tip, and the system is programmed to associate the user selected anomaly type with the location associated with the probe tip.
    Type: Application
    Filed: August 23, 2011
    Publication date: February 28, 2013
    Inventors: Samuel Francis Pedigo, Brice A. Johnson, Craig Farris Battles, Donald L. Kaiser, Kimberly Jyl Kaiser, Richard Neil Blair, Winfeng Li, James M. Cobb, Matthew W. Smith
  • Patent number: 8386205
    Abstract: A rotational vibration test system and method of a storage system set storage devices of the storage system, fan speeds of an electric fan of the storage system, and access patterns of the storage system. The electric fan is controlled to run at the fan speeds. The storage system is accessed according to the access patterns. Accordingly, the storage devices are input/output performance tested. Test results of the storage devices are output to an output device.
    Type: Grant
    Filed: April 21, 2010
    Date of Patent: February 26, 2013
    Assignee: Hon Hai Precision Industry Co., Ltd.
    Inventor: Sheng-Han Lin
  • Patent number: 8381043
    Abstract: According to an aspect of the invention, an information processing apparatus includes a main body having a top face, a display connected to the main body by a hinge and pivotally moves between a first state where the top face is covered with the display and a second state where the top face is exposed, a counter which stores a number of times the state has changed between the first state and the second state, a monitor which detects a malfunction in the hinge when the number of times reaches a given number, and a data transmitter which sends data corresponding with the detected malfunction.
    Type: Grant
    Filed: November 11, 2009
    Date of Patent: February 19, 2013
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Shigeharu Imamura, Tooru Mamata
  • Patent number: 8380452
    Abstract: A two-dimensional map for calculating an SOC of a secondary battery is corrected. A battery ECU obtains a voltage index of a secondary battery. The voltage index is, for example, a no-load voltage of the secondary battery. When an amount of change of the calculated no-load voltage from an initial state falls outside a predefined range, the battery ECU corrects the two-dimensional map of initial state which is stored in advance in a storage unit using data obtained by statistically processing a plurality of two-dimensional maps obtained from a plurality of vehicles.
    Type: Grant
    Filed: March 26, 2010
    Date of Patent: February 19, 2013
    Assignee: Panasonic EV Energy Co., Ltd.
    Inventors: Katsunori Maegawa, Toshiaki Nakanishi, Motoyoshi Okumura
  • Patent number: 8380477
    Abstract: The present invention certifies control modules of engineered safety feature instruments for a power plant automatically. The control modules can be tested before storing or operating. The test is done with enhanced testing speed and saved cost. Thus, safety of the control modules is confirmed.
    Type: Grant
    Filed: January 8, 2010
    Date of Patent: February 19, 2013
    Assignee: Atomic Energy Council—Institute of Nuclear Energy Research
    Inventors: Ben-Ching Liao, Yuan-Chang Yu, Huei-Wen Hwang, Tsung-Chieh Cheng, Minh-Huei Chen
  • Publication number: 20130041612
    Abstract: An internal control signal regulation circuit includes a programming test unit configured to detect an internal control signal in response to an external control signal and generate a selection signal, test codes and a programming enable signal; and a code processing unit configured to receive the test codes or programming codes in response to the selection signal and regulate the internal control signal.
    Type: Application
    Filed: December 30, 2011
    Publication date: February 14, 2013
    Applicant: HYNIX SEMICONDUCTOR INC.
    Inventors: Yong Ju Kim, Dae Han Kwon, Hae Rang Choi, Jae Min Jang
  • Patent number: 8368511
    Abstract: There is provided a method for monitoring a package for storage and/or transport of at least one item. An exemplary method comprises receiving at a transmission unit measured data about properties of the item and/or about influences on the item via at least two sensors. The exemplary method also comprises executing via the transmission unit a decision of a logical node of a logistics system about a selection of data transmitted to a receiving unit. The exemplary method additionally comprises sending information about the desired selection of data from a control unit to the transmission unit. Finally, the exemplary method comprises enabling a user to make a selection relating to types of data to be transmitted.
    Type: Grant
    Filed: March 19, 2008
    Date of Patent: February 5, 2013
    Assignee: Deutsche Post AG
    Inventor: Brian Johnson
  • Publication number: 20130030750
    Abstract: Disclosed are a robot cleaner and a self testing method thereof. The robot cleaner performs a self test when being initially operated or when required by a user. This may prevent malfunctions or breakdowns of the robot cleaner. Furthermore, the robot cleaner senses a state of an operation sensing unit provided at a body, based on a sensing signal of the operation sensing unit. This may prevent accidents or errors which may occur as the robot cleaner operates.
    Type: Application
    Filed: June 28, 2012
    Publication date: January 31, 2013
    Inventors: Siyong Kim, Yongju Kim, Jihoon Sung, Hyungtae Yun
  • Patent number: 8359179
    Abstract: The present invention relates to an equipment, device (10; 110) and apparatus for applying electrical stimuli to a system and acquiring a system response. According to the present invention there is provided a test equipment such as a portable test device (10; 110) for testing a system, the equipment comprising: signal generation means, signal receiving means, and signal processing means, wherein, in use, the signal generation means generates a signal to be applied to a system to be tested and the signal receiving means receives a response signal of the system, and the generated and response signals undergo processing by the signal processing means so as to provide a measure of a characteristic of the system, wherein further the generated signal comprises a plurality of periodic signals each of different frequency and phase and which are applied to the system simultaneously. The equipment finds particular use in the field of dentistry, but also finds other uses, e.g.
    Type: Grant
    Filed: February 8, 2003
    Date of Patent: January 22, 2013
    Assignee: 3D Diagnostic Imaging PLC
    Inventors: Peter George Bruce, Alasdair McCall Christie, Christopher Longbottom, Nigel Berry Pitts
  • Publication number: 20130013244
    Abstract: Various embodiments provide a pattern-based test prioritization system. Individual patterns are defined and are assigned a weight. The patterns represent the relative importance of particular test variation states. A collection of potential test variations is evaluated against the patterns, and a prioritized test variation order is produced. This prioritized test variation order can then be processed to ascertain a subset of prioritized test variations to undergo testing.
    Type: Application
    Filed: July 8, 2011
    Publication date: January 10, 2013
    Applicant: Microsoft Corporation
    Inventors: William J. Kristiansen, Richard L. Plotke
  • Publication number: 20130013245
    Abstract: The present invention discloses a method for obtaining a distribution of charges along a channel of a MOS transistor, which is used for obtaining distributions of interface states charges and charges of a gate dielectric layer in the MOS transistor. The method includes: adding a MOS transistor into a test circuit; measuring two charge pumping current curves when a source terminal is open-circuited or when a drain terminal is open-circuited before and after a stress is applied by using a charge pumping current test method, where one of the two charge pumping current curves is an original curve and the other one is an post-stress curve; finding a point B corresponding to a point A on the original curve on the post-stress curve, and estimating amount of locally-generated interface states charges and charges of the gate dielectric layer by a variation of the charge pumping current and a variation in a voltage at a local point.
    Type: Application
    Filed: October 28, 2011
    Publication date: January 10, 2013
    Applicant: PEKING UNIVERSITY
    Inventors: Ru Huang, Dong Yang, Fei Tan, Xia An, Xing Zhang
  • Publication number: 20130006567
    Abstract: A method for scheduling a use of test resources comprises obtaining an assignment of a test resource to each test group of a test flow. The test flow comprises an initial execution order. The method comprises checking for a resource conflict between an assignment of a test resource to a given test group in a test flow and an assignment of other test resources to other test groups and test flows. The other test groups are scheduled for a temporally overlapping execution with the given test group. The method comprises manipulating the test flow execution order of the test groups. The resource conflict is eliminated by performing a swap between a test group associated with the resource conflict in a test flow with a higher priority compared to a time-interval-insertion in combination with a movement, and moving the test group associated with the resource conflict to an inserted time interval.
    Type: Application
    Filed: December 15, 2009
    Publication date: January 3, 2013
    Inventor: Wolfgang Horn
  • Publication number: 20130006568
    Abstract: A method of operating a test in a test environment comprises running the test, detecting the generation of events during the test and for each detected event, populating one or more result buckets according to one or more validation routines. Each validation routine defines a result to add to a result bucket according to a characteristic of the detected event. Once the test is completed, or during the running of the test, one or more test scenarios are run against the result buckets, with each test scenario returning an outcome according to one or more algorithms processing the results in the result buckets. In a preferred embodiment, the populating of the one or more result buckets is according to validation routines that populate a matrix of result buckets, each result bucket being populated during a specific time period.
    Type: Application
    Filed: June 1, 2011
    Publication date: January 3, 2013
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Michael Baylis, David M. Key, William L. Yates
  • Publication number: 20120330593
    Abstract: Processing test results from a plurality of individual semiconductor testers by analyzing each test result at an adaptive test engine. A centralized system jointly analyzes all the test results from the plurality of individual semiconductor testers. The adaptive test engine or the centralized system identifies, based on the analysis of each test result or the joint analysis of all the test results, one or more of: a test environmental issue, a tester variability issue, a tester calibration issue, a product variability issue, and a manufacturing process variability issue. The adaptive test engine or the centralized system determines whether one or more of the plurality of individual semiconductor testers causes one or more of the identified issues or whether semiconductor products tested by the plurality of individual semiconductor testers causes one or more of the identified issues.
    Type: Application
    Filed: September 5, 2012
    Publication date: December 27, 2012
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Mark C. Johnson, Deepak S. Turaga, Olivier Verscheure
  • Publication number: 20120323518
    Abstract: Methods, systems and apparatus are provided for ranking tests of interest. A set of failure modes of interest and a set of tests of interest are determined A differentiation factor is then computed for each of the tests of interest, and each of the tests of interest can then be ranked based on their respective differentiation factors.
    Type: Application
    Filed: June 15, 2011
    Publication date: December 20, 2012
    Applicant: HONEYWELL INTERNATIONAL INC.
    Inventors: Kelly Jean Lechtenberg, Qingqiu Ginger Shao
  • Patent number: 8330448
    Abstract: A system for testing a conversion efficiency of a power supply unit includes a power meter, a plurality of switches, a multimeter, a microcontroller unit (MCU), a computer, and a signal conversion circuit for communicatively connecting the MCU to the computer. The power meter is capable of measuring an input power supplied to the power supply unit. The switches are powered on/off according to a sequence predetermined by the computer. The multimeter is configured to measure an output power of the power supply. The computer is capable of reading data measured from the power meter and the multimeter and calculating a conversion efficiency of the power supply unit.
    Type: Grant
    Filed: April 22, 2010
    Date of Patent: December 11, 2012
    Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventor: Ling-Yu Xie
  • Patent number: 8332505
    Abstract: The present disclosure provides testing of a storage system. The test may compare the storage array controller LUNs which may be configured to be accessible by a host with the LUNs which are currently available to prevent a zero path scenario from occurring. The test may verify at least one path exists for each LUN to a storage controller of a storage array before injecting an error into another storage controller of the storage array. The present disclosure also provides verification of the configuration of a storage system. The configuration verification may verify that the storage array controller LUNs which are configured to be accessible by a host are actually accessible by the host. If the configuration verification is unable to verify the configuration of storage system, the configuration verification may display an error.
    Type: Grant
    Filed: March 4, 2008
    Date of Patent: December 11, 2012
    Assignee: LSI Corporation
    Inventors: Steven G. Hagerott, Robert R. Stankey, Jr., Glenn Tefft, Mark Ziegler
  • Patent number: 8326553
    Abstract: A method (300) for fault detection in a system under control includes monitoring a command value and a wraparound signal (301) by a fault detection module (203); determining a standard deviation of the command value (302) by the fault detection module; determining a standard deviation of the wraparound signal (303) by the fault detection module; determining a ratio of the standard deviation of the command value to the standard deviation of the wraparound signal (304) by the fault detection module; and determining the presence or absence of a fault in the system under control by the fault detection module based on the ratio (305) by the fault detection module. A fault detection module (203) and a computer program product comprising a computer readable storage medium containing computer code that, when executed by a computer, implements a method (300) for fault detection are also provided.
    Type: Grant
    Filed: January 5, 2010
    Date of Patent: December 4, 2012
    Assignee: Hamilton Sundstrand Corporation
    Inventors: Christopher Noll, Steven A. Avritch
  • Patent number: 8320403
    Abstract: A sensor array, comprising: a plurality of sensors electrically connected in series or in parallel, each of the plurality of sensors operable to generate an individual electrical signal; a multiplexing scheme generator operable to generate a multiplexing scheme; a modulation system connected to the multiplexing scheme generator and operable to selectively reverse the polarity of each of the plurality of sensors for each of a plurality of samples; a readout device operable to sequentially read a plurality of output signals of the plurality of electrically connected sensors, wherein the number of samples is greater than or equal to the number of sensors and wherein one or more electrical signals of the plurality of sensors are readout as one electrical signal; and a demultiplexer operable to receive the output electrical signals and to determine the individual electrical signals of each of the plurality of sensors based on the multiplexing scheme.
    Type: Grant
    Filed: June 29, 2010
    Date of Patent: November 27, 2012
    Assignee: Excelitas Canada, Inc.
    Inventor: Sheldon James Hood
  • Patent number: 8311776
    Abstract: The Data Throughput Tester (“DTT”) provides efficient and reliable methods to characterize the performance capabilities of electronic data systems. Embodiments of the DTT may allow test organizations to find the throughput limitations of a data system under test to the nearest whole packet in both an efficient and reliable manner. Embodiments of the DTT may allow determination of the throughput of a data system under test under the requirement that data output obtained from the data system is identical to the data input provided to the data system. Further embodiments of the DTT may allow determination of the throughput of a data system under test under the condition that specific performance characteristics of the data system under test satisfy pre-defined benchmark parameters.
    Type: Grant
    Filed: December 1, 2009
    Date of Patent: November 13, 2012
    Assignee: Verizon Patent and Licensing Inc.
    Inventor: Robert Blackledge
  • Publication number: 20120283980
    Abstract: A management system connected with a clinical testing apparatus is disclosed. The system acquires, from the clinical testing apparatus, a parameter that varies according to deterioration of the unit at a plurality of points of time, stores the parameters and/or analysis results that are obtained by analyzing the parameters, and provides a screen data for showing the stored parameters and/or the stored analysis results in a time-series format. A method for managing a clinical testing apparatus and a clinical testing system for the method are also disclosed.
    Type: Application
    Filed: April 30, 2012
    Publication date: November 8, 2012
    Inventors: Yusuke Suga, Naoki Shindo, Atsumasa Sone, Hiroyuki Koyama, Shunsuke Ariyoshi
  • Patent number: 8305107
    Abstract: A system for testing a power supply unit includes a test sub-system and a test control sub-system connected to the test sub-system and the power supply unit. The test sub-system perform tests and record the results. The test control sub-system is capable of selecting test items to test the power supply unit and setting an execution sequence of the test items. The test items includes a standby test item for testing the power supply unit at a standby state, a normal test item for testing the power supply unit at a normal state, and an over temperature protection test item for testing the power supply unit at an over heated state. The test control sub-system is further capable of automatically switching the standby test item to the normal test item, and switching the normal test item to the over temperature protection test item.
    Type: Grant
    Filed: September 11, 2009
    Date of Patent: November 6, 2012
    Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventors: Ling-Yu Xie, Sheng-Chung Huang, Kun-Lung Wu
  • Patent number: 8294483
    Abstract: A testing system includes a tester probe and a plurality of integrated circuits. Tests are broadcast to the plurality of integrated circuits using carrierless ultra wideband (UWB) radio frequency (RF). All of the plurality of integrated circuits receive, at the same time, test input signals by way of carrierless UWB RF and all of the plurality of integrated circuits run tests and provide results based on the test input signals. Thus, the plurality of integrated circuits are tested simultaneously which significantly reduces test time. Also the tests are not inhibited by physical contact with the integrated circuits.
    Type: Grant
    Filed: May 30, 2008
    Date of Patent: October 23, 2012
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Lucio F. C. Pessoa, Perry H. Pelley, III
  • Patent number: 8289038
    Abstract: To analyze an electric component in depth, provision is made to submit the aforementioned component to focused laser radiation. It is shown that by modifying the altitude of the focus in the component, some internal parts of the aforementioned component can be characterized more easily.
    Type: Grant
    Filed: April 18, 2007
    Date of Patent: October 16, 2012
    Assignee: European Aeronautic Defence and Space Compai
    Inventors: Florent Miller, Nadine Buard, Imad Lahoud, Thierry Carriere, Patrick Heins
  • Patent number: 8285509
    Abstract: A method of testing an electronic device is disclosed. The electronic device includes an embedded controller. The method includes storing a type information of the embedded controller and transmitting the type information to an application module through a data module. The application module analyzes the type information to obtain a command. The application module sends the command to the embedded controller. The embedded controller returns a testing result to the application module. The application module generates a testing report after the application module compares the testing result with a predetermined result.
    Type: Grant
    Filed: March 2, 2010
    Date of Patent: October 9, 2012
    Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventor: Qing-Hua Liu
  • Patent number: 8285510
    Abstract: Objects such as manufactured goods or articles, works of art, media such as identity documents, legal documents, financial instruments, transaction cards, other documents, and/or biological tissue are sampled via sequential illumination in various bands of the electromagnetic spectrum, a test response to the illumination is analyzed with respect to reference responses of reference objects. The sequence may be varied. The sequence may define an activation order, a drive level and/or temperature for operating one or more sources. Illumination may be in visible, infrared, ultraviolet, or other portions of the electromagnetic spectrum. Elements of the evaluation system may be remote from one another, for example coupled by a network.
    Type: Grant
    Filed: June 16, 2011
    Date of Patent: October 9, 2012
    Assignee: Visualant, Inc.
    Inventors: Brian T. Schowengerdt, Thomas A. Furness, III, Nicholas E. Walker
  • Patent number: 8285502
    Abstract: An inductor current estimator for a switching power supply includes a first sensing and averaging component that generates an average of a switch voltage and a second sensing and averaging component that generates an average of an output voltage of the switching power supply. A first subtraction component receives the average of the switch voltage and the average of the output voltage. A first multiplying component receives an output of the first subtraction component and multiplies the output of the first subtraction component by a first model parameter. A second multiplying component multiplies an input to the second multiplying component by a second model parameter. An adding component adds an output of the first multiplying component and an output of the second multiplying component. A delay component receives an output of the adding component and provides an output to an input of the second multiplying component.
    Type: Grant
    Filed: November 20, 2009
    Date of Patent: October 9, 2012
    Assignee: L&L Engineering, LLC
    Inventors: Stewart Kenly, Paul W. Latham, II
  • Patent number: 8271231
    Abstract: A configuration method for a computer device comprises generating a load condition on at least one serial bus link using a plurality of differential voltage levels, determining a minimum voltage differential value for producing an eye compliance diagram at a receiver of the at least one serial bus link, and configuring a driver associated with the at least one serial bus link to drive an operational differential voltage level on the at least one serial bus link within a predetermined range of the minimum voltage differential.
    Type: Grant
    Filed: October 26, 2005
    Date of Patent: September 18, 2012
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Monji G. Jabori, Qijun Chen, Rahul V. Lakdawala
  • Publication number: 20120232824
    Abstract: In one embodiment, a modular dissolution-testing apparatus has a base unit adapted to hold and control operation of between one and eight dissolution-testing modules. The base unit has a programmable controller and a color touch screen for user interface with the controller and the modules. Each module includes a vessel for holding a solution of a dosage form dissolving in a solvent, an agitator apparatus for stifling the solution, and a motor to power—via a multi-motion assembly and a stifling shaft—stifling by, lifting of, and lowering of, the apparatus. Each module has a vessel heater and a temperature sensor, both communicatively connected to the controller for heating and regulating the temperature of the vessel contents. Each module is independently controllable by the controller, where control includes manually (by a user) or programmatically setting stifling speed, lifting and lowering apparatus, and starting and stopping stirring and heating.
    Type: Application
    Filed: March 9, 2012
    Publication date: September 13, 2012
    Applicant: DISTEK, INC.
    Inventors: Jeffrey Brinker, Wenyu Wang
  • Publication number: 20120226462
    Abstract: Systems and methods are described for testing customer premise equipment in an offline fashion. According to certain embodiments, a testing system including one or more computing devices can identify a test scenario that includes information associated with one or more commands and expected results associated with the commands. Such commands can be executed by customer premise equipment. One or more respective images associated with the execution of a command can be captured, and information associated with the command, the associated expected result, and one or more respective images can be displayed for evaluation by a user to determine whether the command is operating properly in the customer premise equipment that executed the command. Certain embodiments describe a confidence level which can correspond to a number of images to be captured in order to decrease the possibility that content was not captured for evaluation.
    Type: Application
    Filed: February 29, 2012
    Publication date: September 6, 2012
    Applicant: COX COMMUNICATIONS, INC.
    Inventor: Michael David Rucker
  • Publication number: 20120226951
    Abstract: Provided is a test apparatus comprising a plurality of pattern output sections. In a high-speed mode, each pattern output section outputs, as pattern data corresponding to at least one of a plurality of partial periods, the pattern data corresponding to an input pattern input to the pattern output section and the pattern data corresponding to input patterns input to other pattern output sections.
    Type: Application
    Filed: February 24, 2012
    Publication date: September 6, 2012
    Applicant: ADVANTEST CORPORATION
    Inventor: Toshiyuki NEGISHI
  • Patent number: 8260557
    Abstract: A system for determining occurrence factors of particles includes a user interface device, and an apparatus for detecting the occurrence factors of particles. The apparatus for detecting the occurrence factors of particles includes a storage unit that stores a program for executing a calculation method for calculating a likelihood of each of the occurrence factors of particles in the form of a score; and a calculation unit for calculating the score for each of the occurrence factors of particles based on particle distributions at least on a surface of a substrate using the stored program. The user interface device displays the calculated score for each of the occurrence factors of particles.
    Type: Grant
    Filed: March 5, 2009
    Date of Patent: September 4, 2012
    Assignee: Tokyo Electron Limited
    Inventor: Tsuyoshi Moriya
  • Patent number: 8260783
    Abstract: A method and system may receive time-series data of each of a plurality of real-time data streams from one or more sensors and create an electronic file based on the plurality of real-time data streams. The plurality of real-time data streams comprises a primary data stream, a low limit data stream, a high limit data stream, and a target value data stream. The electronic file includes a data portion and a metadata portion. The metadata portion of the electronic file comprises, for each of the plurality of data streams, one or more data stream identifiers, a time range, a source type, and a data type, and the data portion comprises the time-series data of each of the plurality of real-time data streams.
    Type: Grant
    Filed: February 25, 2008
    Date of Patent: September 4, 2012
    Assignee: Siemens Aktiengesellschaft
    Inventor: Christopher Patrick Milam
  • Publication number: 20120217989
    Abstract: Exemplary method, computer-accessible medium, and test configuration can be provided for testing at least one flip-flop. For example, the exemplary test configuration can include at least one scan-out channel having a plurality of regions and a plurality of compactors associated with the plurality of regions.
    Type: Application
    Filed: February 8, 2012
    Publication date: August 30, 2012
    Applicant: New York University
    Inventor: Ozgur Sinanoglu
  • Publication number: 20120221279
    Abstract: An automatic test system and method for a distributed comprehensive service are disclosed. The system has a client (101), a scheduling server (102) and testing subsystems (103) which are in a distributed deployment and used to test tested systems (104) that are also in a distributed deployment. The scheduling server (102) receives and analyzes test tasks sent from the client (101), schedules test items according to the logical relationship and distributes them to the corresponding testing subsystems (103). The test subsystems (103) analyze and execute the test items to test the tested systems (104), collect test item execution reports and send the execution reports to the scheduling server (102). The scheduling server (102) generates a test task report and sends to the client (101) for examination. The system supports complicated multi-service test scenarios and multi-test task execution.
    Type: Application
    Filed: June 29, 2010
    Publication date: August 30, 2012
    Applicant: ZTE CORPORATION
    Inventor: Hongqiang Zhang
  • Patent number: 8255182
    Abstract: Techniques for controlling collection of diagnostic data in a monitored system. A set of flood control rules are configured for the monitored system for controlling the gathering of diagnostic data in the monitored system. The set of flood control rules may include one or more default flood control rules. The set of flood control rules are user-configurable enabling the user of the monitored system to set policies for dynamically controlling gathering of diagnostic data for the monitored system. In one embodiment, diagnostic data gathering is controlled based upon a number of previous occurrences of a condition in some predefined or user-configured time frame that triggers diagnostic data gathering and/or a number of previous executions of an action performed in some predefined or user-configured time frame responsive to the condition in the monitored system.
    Type: Grant
    Filed: October 15, 2008
    Date of Patent: August 28, 2012
    Assignee: Oracle International Corporation
    Inventors: Yair Sarig, Benoit Dageville, Marcus Fallen, Ajith Kumar Mysorenagarajarao, Karl Dias, Mark Ramacher, Gary Ngai
  • Publication number: 20120215478
    Abstract: A test structure for testing electrical properties of a material comprises a first loop and a second loop, which are connected to form a closed test loop. A signal generator, for generating a test signal, is coupled to the first loop and the second loop. A signal propagation switching logic is coupled to the first loop and to the second loop for alternatingly flipping the test signal between the first and second loops, such that the test signal moves uninterrupted through the closed test loop. A probe logic detects any degradation of the test signal as the test signal travels along the closed test loop.
    Type: Application
    Filed: April 26, 2012
    Publication date: August 23, 2012
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: VINH B. LU, BHYRAV M. MUTNURY, TERENCE RODRIGUES
  • Publication number: 20120209556
    Abstract: In a low power scan-based testing process, the loading of a test pattern may involve only a portion of the scan chains and the capturing of test response data for the test pattern may involve another portion of the scan chains. The two portions of the scan chains may be determined based on test patterns applied before and after the current test pattern. Clock gating circuitry may be used to select the two portions of the scan chains.
    Type: Application
    Filed: February 2, 2012
    Publication date: August 16, 2012
    Inventors: JANUSZ RAJSKI, Elham K. Moghaddam
  • Patent number: 8244538
    Abstract: A system evaluates a hands free communication system. The system automatically selects a consonant-vowel-consonant (CVC), vowel-consonant-vowel (VCV), or other combination of sounds from an intelligent database. The selection is transmitted with another communication stream that temporally overlaps the selection. The quality of the communication system is evaluated through an automatic speech recognition engine. The evaluation occurs at a location remote from the transmitted selection.
    Type: Grant
    Filed: April 29, 2009
    Date of Patent: August 14, 2012
    Assignee: QNX Software Systems Limited
    Inventors: Shreyas Paranjpe, Mark Fallat
  • Patent number: 8244382
    Abstract: An apparatus for monitoring a schedule for testing a fuel cell in a station. Because of the apparatus, the station can test a low-temperature fuel cell or a high-temperature fuel cell. The apparatus enables a user to test the fuel cell through the station manually or enables the station to test the fuel cell automatically.
    Type: Grant
    Filed: January 11, 2010
    Date of Patent: August 14, 2012
    Assignee: Atomic Energy Council—Institute of Nuclear Research
    Inventors: Hung-Yu Wang, Wen-Tang Hong, Yu-Ching Tsai, Tzu-Hsiang Yen, Wei-Ping Huang, Cheng-Nan Huang
  • Publication number: 20120203491
    Abstract: An approach is provided for context-aware control of sensors and sensor data. A sensor manager determines context information based, at least in part, on one or more sensors. The sensor manager also determines resource consumption information associated with a one or more other sensors, one or more functions of the one or more other sensors, or a combination thereof. The sensor manager then processes and/or facilitates a processing of the context information and the resource consumption information to determine at least one operational state associated with the one or more other sensors, the one or more functions of the one or more other sensors, or a combination thereof.
    Type: Application
    Filed: February 3, 2011
    Publication date: August 9, 2012
    Applicant: Nokia Corporation
    Inventors: Feng-Tso Sun, Cynthia Kuo, Raja Bose
  • Publication number: 20120203492
    Abstract: A method may include receiving a first set of parameters associated with a test environment, the test environment including a test system for testing a network, receiving a test objective, conducting a first test case based on the received first set of parameters and the test objective, automatically determining, by the test system, whether the test objective has been satisfied based on a first test result associated with the first test case, and automatically adapting, by the test system, a second test case based on the first test result when it is determined that the test objective has not been satisfied.
    Type: Application
    Filed: April 17, 2012
    Publication date: August 9, 2012
    Applicant: VERIZON PATENT AND LICENSING, INC.
    Inventor: Hassan M. Omar
  • Patent number: 8239157
    Abstract: A method and apparatus is disclosed that guides a user through a sequence of steps that will allow the user to complete a predefined task using the flow meter. The steps include: selecting a predefined task, displaying a sequence of steps that directs the user through a process for using the Coriolis flow meter to complete the predefined task, and operating the Coriolis flow meter in response to the sequence of steps to complete the predefined task.
    Type: Grant
    Filed: February 24, 2011
    Date of Patent: August 7, 2012
    Assignee: Micro Motion, Inc.
    Inventors: Craig B McAnally, Andrew T Patten, Charles P Stack, Jeffrey S Walker, Neal B Gronlie
  • Patent number: 8239904
    Abstract: There is disclosed a method, device, and system for verifying a video path between a source device and a destination device. The destination device may receive a video signal including at least one video test pattern from the source device via a network. The destination device may automatically judge that a video path exists if the received video signal meets at least one predetermined criteria.
    Type: Grant
    Filed: October 29, 2009
    Date of Patent: August 7, 2012
    Assignee: Ixia
    Inventors: Lucian Leventu, Razvan Stan
  • Patent number: 8239152
    Abstract: An information processing apparatus processes information generated by an exposure apparatus. The information processing apparatus includes a collecting unit and a converting unit. The collecting unit collects first apparatus information obtained by the exposure apparatus via an operation of the exposure apparatus with respect to each of a plurality of first regions which form a first array defined on a substrate. The converting unit converts at least part of the first apparatus information collected by the collecting unit into second apparatus information with respect to each of a plurality of second regions which form a second array.
    Type: Grant
    Filed: February 25, 2008
    Date of Patent: August 7, 2012
    Assignee: Canon Kabushiki Kaisha
    Inventor: Daisuke Itai
  • Patent number: 8228072
    Abstract: A test and measurement instrument including a plurality of channels, each channel configured to receive a corresponding input signal. Each channel includes a comparator configured to compare the input signal to a threshold for the channel; an edge detector configured to detect an edge of an output signal of the comparator; and a threshold controller configured to adjust the threshold for the channel in response to the edge detector.
    Type: Grant
    Filed: April 23, 2009
    Date of Patent: July 24, 2012
    Assignee: Tektronix, Inc.
    Inventor: Michael S. Hagen
  • Publication number: 20120185200
    Abstract: A method of optimizing measurement paths analyzes one or more measurement points for each of the measurement elements of a product and generates relation arrays, each of the relation arrays storing the name and the one or more measurement points of one measurement element. The method selects a measurement point which is the nearest to the origin of an coordinate system of the product, computes distances between the measurement points from the selected measurement point using the relation arrays, and orders the measurement points according to the computed distances to generate a first ordered array. The method generates an optimal measurement path according to the first ordered array.
    Type: Application
    Filed: November 2, 2011
    Publication date: July 19, 2012
    Applicants: HON HAI PRECISION INDUSTRY CO., LTD., HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.
    Inventors: CHIH-KUANG CHANG, XIN-YUAN WU, GEN YANG
  • Patent number: 8219573
    Abstract: A method of the present invention includes: inputting a state transition diagram that represents first transitions between a plurality of states; inputting a mapping function that maps a given state to a value within a certain range; mapping each of the states with the mapping function to obtain mapping values, and perform grouping of the states into a plurality of groups based on the mapping values; for each of pairs of two groups obtained by combining two of the groups, setting a second transition from one group of the two groups to the other group when there is at least one first transition between therein; generating a representative transition path which is a sequence of the second transitions by tracing sequentially the second transitions; converting the representative transition path to a transition path in the state transition diagram; outputting the transition path as the test case.
    Type: Grant
    Filed: March 4, 2009
    Date of Patent: July 10, 2012
    Assignee: Kabushiki Kaisha Toshiba
    Inventor: Hiromasa Shin
  • Patent number: 8214171
    Abstract: A semiconductor memory device having a test mode circuit is presented which includes: a mode setting unit, in response to an external command and a first address signal for a mode set, providing a mode register set signal corresponding to predetermined mode setting; and a test mode circuit, in response to the mode register set signal and a second address signal for test enable control in an initial operation, performing test mode enable; the test mode circuit, in response to the mode register set signal and a third address signal for test item selection in the test mode enable state, outputting a test mode item signal; and the test mode circuit, in a subsequent operation, receiving the fed-back test mode item signal to maintain the test mode enable state.
    Type: Grant
    Filed: August 26, 2008
    Date of Patent: July 3, 2012
    Assignee: Hynix Semiconductor Inc.
    Inventor: Jae Hoon Cha
  • Patent number: 8214168
    Abstract: A sensor probe provides a pair of unique signal paths through a test material, wherein one configuration of the probe provides identical external portions of the signal paths such that a selected parameter of a measuring signal passing along at least two of the unique signal paths is measured. From these measurements, a method is provided for calculating at least one parameter of the test material, wherein the parameter can include an intrinsic parameter as well as a condition of state.
    Type: Grant
    Filed: September 7, 2004
    Date of Patent: July 3, 2012
    Assignee: Transonic Systems, Inc.
    Inventor: Yuri Shkarlet