Abstract: A method and device for simulating a semiconductor IC is provided, which comprises generating a high level description of the IC, generating a low level description of the IC comprising a plurality of instances describing the operation of the IC, conducting a low level function analysis of the IC based on metrics values associated with the instances, and performing a design optimization scheme. The scheme comprises mapping the metric values of instances describing functional units different from standard cells, to standard cells logically connected to said instances, by dividing each of the instance metrics values between a group of standard cells logically connected to the corresponding instance and adding each resulting portion of said instance metric value to the metric value of each of the group of standard cells, respectively.

Abstract: Solving a multidimensional multicriteria optimization problem is difficult because the correlations and dependencies between solutions, target functions, and variation variables can be detected only with difficulty. In order to facilitate this, it is proposed that a model space (1) and a variation space (2) are displayed simultaneously and in an interactively linked fashion.

Abstract: A method for performing redundancy identification in an integrated circuit design. An optimized gate in a logic circuit is identified. A first netlist with a representation of the logic circuit is generated. An error is induced on the optimized gate. A second netlist is generated from a copy of the first netlist incorporating changes based on the error. Fan-out boundaries of the logic circuit are propagated for the first and second netlists. A redundancy report representing optimization steps performed to obtain the original logic circuit is analyzed to identify which steps are adequate to cause unobservability of the optimized gate. This is done by representing the optimization steps as constraints over the first and second netlists. Responsive to the error becoming undetectable under the constraints derived from the redundancy report, a minimal set of reductions is identified from the first netlist as the reason for unobservability of the optimized gate.

Abstract: Hardened programmable logic devices are provided with programmable circuitry. The programmable circuitry may be hardwired to implement a custom logic circuit. Generic fabrication masks may be used to form the programmable circuitry and may be used in manufacturing a product family of hardened programmable logic devices, each of which may implement a different custom logic circuit. Custom fabrication masks may be used to hardwire the programmable circuitry to implement a specific custom logic circuit. The programmable circuitry may be hardwired in such a way that signal timing characteristics of a hardened programmable logic device that implements a custom logic circuit may match the signal timing characteristics of a programmable logic device that implements the same custom logic circuit using configuration data.

Abstract: An approach is provided in which a hybrid mixed signal equivalence checking system partitions a mixed signal reference model and a mixed signal model under verification into analog sections and digital sections. The hybrid mixed signal equivalence checking system simulates the analog sections from the two different models to determine analog equivalence. As such, the hybrid mixed signal equivalence checking system verifies digital equivalence between the digital reference section and the digital section model under verification in response to evaluating one or more difference functions that represent at least a portion of the first digital section and the second digital section. As a result, the hybrid mixed signal equivalence checking system verifies equivalence between the mixed signal reference model and the mixed signal model under verification based upon the verified analog equivalence and the verified digital equivalence.

Abstract: For linear array hierarchy navigation, a method encodes a logic design as a linear array with a plurality of logic states. The method displays combination maps of a plurality of fields at two or more successive display levels having a top display level and at least one lower display level. In addition, the method receives a selection of a first field of the plurality of fields. The method displays the first field and one or more successive combination maps for the first field. Each of the one or more successive combination maps is displayed with a field identifier of a predecessor field. In addition, the method displays relationship arrows linking the first field and each successive field of the first field.

Abstract: A method and circuit for implementing enhanced performance dynamic evaluation, and a design structure on which the subject circuit resides are provided. The dynamic evaluation circuit includes a combined precharge and keeper device connected to a precharge node. The dynamic evaluation circuit includes control logic providing a control input to the combined precharge and keeper device. The combined precharge and keeper device responsive to the control input holds the precharge node precharged when the precharge node is not discharged early in an evaluate cycle.

Abstract: A system, method, and computer program product for containing analog verification IP for circuit simulation. Embodiments introduce analog verification units (“vunits”), and corresponding analog verification files to contain them. Vunits allow circuit design verification requirement specification via text file. No editing of netlist files containing design IP is required to implement static and dynamic circuit checks, PSL assertions, clock statements, or legacy assertions. Vunits reference a top-level circuit or subcircuits (by name or by specific instance), and the simulator automatically binds vunit contents appropriately during circuit hierarchy expansion. Vunits may be re-used for other design cells, and may be easily processed by text-based design tools. Vunits may be provided via vunit_include statements in a control netlist file, command line arguments, or by directly placing a vunit block into a netlist.

Abstract: A method for bypassing a defective through silicon via x in a group of n adjacent through silicon vias, includes receiving a plurality of relief signals to identify the defective through silicon via x, activating x?1 switch circuits to connect x?1 data circuits to through silicon vias 1 to x?1 in the group of n adjacent through silicon vias, activating n-x switch circuits to connect n-x data circuits to through silicon vias x+1 to n in the group of n adjacent through silicon vias, and activating a switch circuit to connect a data circuit to an auxiliary through silicon via which is adjacent through silicon via n in the group of n adjacent through silicon vias.

Abstract: A method of configuring a programmable integrated circuit device with a user logic design includes analyzing the user logic design to identify unidirectional logic paths within the user logic design and cyclic logic paths within the user logic design, assigning the cyclic logic paths to logic in a first portion of the programmable integrated circuit device that operates at a first data rate, assigning the unidirectional logic paths to logic in a second portion of the programmable integrated circuit device that operates at a second data rate lower than the first data rate, and pipelining the unidirectional data paths in the second portion of the programmable integrated circuit device to compensate for the lower second data rate. A programmable integrated circuit device adapted to carry out such method may have logic regions operating at different rates, including logic regions with programmably selectable data rates.

Abstract: Methods are provided to facilitate automated creation and management of design rule checking or DRC waiver descriptions. Embodiments include receiving a plurality of first checksums corresponding to respective first geometric element violations waived in association with a block of an integrated circuit design, the first checksums being based on a first version of at least one design verification rule and/or of the block, receiving a second checksum corresponding to a second geometric element violation associated with the block, the second checksum being based on a second version of the design verification rule and/or of the block, determining whether the second checksum corresponds to at least one of the first checksums, and, if the second checksum does not correspond to at least one first checksum, generating a waiver request for the second geometric element error.

Abstract: The present invention is directed towards designing integrated circuit and provides systems and methods for lithography-aware floorplanning. According to one embodiment of the invention, a method for circuit floorplanning is provided. The method comprises generating a floorplan through a floorplanner, performing a lithography-analysis within the floorplanner on at least a portion of the floorplan, and generating one or more violations that result from the lithography-analysis. Some embodiment, in addition to viewing a floorplan, further comprise of modifying the floorplan. Furthermore, some embodiments provide a method that further comprises fixing the violations that result from the lithography analysis.

Abstract: Techniques for performing race logic synthesis on an integrated circuit (IC) are described herein. According to one aspect of the invention, ESL (electronic system level) and any HDL (hardware description language) design source files of an IC design are compiled into a design database. Race logic analysis is performed on the IC design to detect race logic, including race logic for IPC (inter-process communication) and IPS (inter-process synchronization) objects in the IC design, by a third-party tool and/or by the same host EDA (electronic design automation) tool that will be performing race logic synthesis on the IC design, if the latter has built-in race logic audit functions. Based on the race logic audit results, race logic synthesis is performed on the design database, and getting rid of all identified race logic in the IC design, including IPC- and IPS-related race logic.

Abstract: An electronic design automation system combines features of discrete EDA/CAD systems and manufacturing systems into a monolithic system to enable a layperson to efficiently design, construct and have manufactured a specific class of custom electronic device, namely a computer processing unit with embedded software. A Graphical User Interface (GUI) is provided as the front-end to a Computer Aided Design (CAD) server that generates sophisticated control and manufacturing instructions that are delivered to a fabrication supply chain, which produces a specified device that is then transported via managed logistics into inventory and ordering systems at vendors for delivery to a designated customer.

Abstract: A circuit designer may use computer-aided design (CAD) tools to implement an integrated circuit design. The CAD tools may include auto-pipelining capabilities to improve the performance of the integrated circuit design. Auto-pipelining may modify the number of pipeline registers in a path within a given range. A description of the integrated circuit design may include different implementation alternatives of a path each having a different number of pipeline registers, and the CAD tools may select one of these implementation alternatives. The CAD tools may further evaluate the performance of a particular implementation alternative and iteratively select a different implementation alternative until a given objective is met. The CAD tool may update a test environment according to the selected implementation alternative once the objective is met and validate the selected implementation alternative using the updated test environment.

Abstract: A processing part inputs a behavior description code in which a write access array to be accessed to write and a read access array to be accessed to read are used. The processing part analyzes the behavior description code, and determines an order of using each write access address and an order of using each read access address when the behavior description code is executed. Further, the processing part performs either one of a write access order changing process to change the order of using the write access addresses when the behavior description code is executed based on the order of using the read access addresses and a read access order changing process to change the order of using the read access addresses when the behavior description code is executed based on the order of using the write access addresses.

Abstract: A non-volatile memory device capable of reading and writing a large number of memory cells with multiple read/write circuits in parallel has an architecture that reduces redundancy in the multiple read/write circuits to a minimum. The multiple read/write circuits are organized into a bank of similar stacks of components. In one aspect, each stack of components has individual components factorizing out their common subcomponents that do not require parallel usage and sharing them as a common component serially. Other aspects, include serial bus communication between the different components, compact I/O enabled data latches associated with the multiple read/write circuits, and an architecture that allows reading and programming of a contiguous row of memory cells or a segment thereof. The various aspects combined to achieve high performance, high accuracy and high compactness.

Abstract: Systems and methods of using hardware to simulate software, specifically the semantic operations defined in HDL simulation languages. Traditional software HDL simulation kernel operations of advancing time, activating threads in response to notified events, and scheduling those threads of execution are handled via a simulation controller. The simulation controller is comprised of a timing wheel, an event-processor, a thread/process dispatch engine, a token processor, and a resource-allocator. These components work together with a control logic component to perform the semantic operations of an HDL software kernel.

Abstract: A design apparatus generates an optimal design condition by design space exploration. The apparatus including a source code parsing (301) which parses source code and generates a parse tree, a cluster generation task (302) which generates clusters based on the parse tree, each of the clusters including a group of source codes which can operate independently, a log file task (303) which generates a log file based on a structure of the cluster, and a comparison task (304) which compares a first log file of a previous cluster with a second log file of a current cluster and re-uses previous exploration result based on a comparison result, the first log file being obtained from a previous design space exploration, the second log file being generated from a current operation.

Abstract: Methods and systems for determining a numerical delay model based on one or more discretized delay models are described. A discretized delay model is a delay model in which the delay behavior is represented using a set of discrete data points of delay behavior. A numerical delay model is a delay model that can be used by a numerical solver to optimize a cost function. In general, computing delay using a numerical delay model is significantly faster than computing delay using discretized delay models. This performance improvement is important when optimizing a design for various metrics like timing, area and leakage power, because repeated delay computations are required in circuit optimization approaches.

Abstract: An integrated circuit design optimization procedure to modify a cell feature, such as gate length, models changes in delay as a result of the modification. In the delay change calculation, a characteristic of an event in cell switching behavior, such as the output short-circuit voltage VSC, is determined for the modified cell, where changes in the determined characteristic correlate with changes in delay of the cell due to the modification. Next, a value for delay of the modified cell is determined as a function of the determined characteristic of the event. The procedure can be applied after placement and routing. A timing-constrained, leakage power reduction is described using the delay change model.

Abstract: A chip generator according to an embodiment of the present invention codifies designer knowledge and design trade-offs into a template that can be used to create many different chips. Like reconfigurable designs, an embodiment of the present invention fixes the top level system architecture, amortizes software and validation and design costs, and enables a rich system simulation environment for application developers. Meanwhile, below the top level, the developer can “program” the individual inner components of the architecture. Unlike reconfigurable chips, a chip generator according to an embodiment of the present invention, compiles the program to create a customized chip. This compilation process occurs at elaboration time—long before silicon is fabricated. The result is a framework that enables more customization of the generated chip at the architectural level because additional components and logic can be added if the customization process requires it.

Abstract: A method of preparing a programmable integrated circuit device for configuration using a high-level language includes compiling a plurality of virtual programmable devices from descriptions in said high-level language. The compiling includes compiling configurations of configurable routing resources from programmable resources of said programmable integrated circuit device, and compiling configurations of a plurality of complex function blocks from programmable resources of said programmable integrated circuit device. A machine-readable data storage medium may be encoded with a library of such compiled configurations. A virtual programmable device may include a stall signal network and routing switches of the virtual programmable device may include stall signal inputs and outputs.

Abstract: A system, method, and computer program product for automatically approximating conventional Monte Carlo statistical device model evaluation for circuit simulation with drastic speed improvements, while preserving significant accuracy. Embodiments enable quick inspection of the effects of process mismatch variations on single devices and even large circuits compared to standard computationally prohibitive Monte Carlo analysis. Statistical device model variation is calculated as if all such variation is due to changes in threshold voltage, even though other physical phenomena are known to contribute. Threshold voltage variation is modeled as a function of statistical variation, device size, and working bias condition. Circuit simulation is faster when the full internal device model parameter set is not rebuilt for every Monte Carlo analysis iteration. Embodiments are compatible with both conventional SPICE and newer Fast SPICE simulations.

Abstract: In one embodiment of the invention, a physical layout wire-load algorithm is used to generate a wire-load model based on physical data including aspect ratio and wire definitions defined in a physical library. The physical layout estimator is utilized to dynamically produce the physical layout wire-load model and to calculate net length and delay for each optimization iteration.

Abstract: A method and apparatus are disclosed for use in improving the gate oxide reliability of semiconductor-on-insulator (SOI) metal-oxide-silicon field effect transistor (MOSFET) devices using accumulated charge control (ACC) techniques. The method and apparatus are adapted to remove, reduce, or otherwise control accumulated charge in SOI MOSFETs, thereby yielding improvements in FET performance characteristics. In one embodiment, a circuit comprises a MOSFET, operating in an accumulated charge regime, and means for controlling the accumulated charge, operatively coupled to the SOI MOSFET. A first determination is made of the effects of an uncontrolled accumulated charge on time dependent dielectric breakdown (TDDB) of the gate oxide of the SOI MOSFET. A second determination is made of the effects of a controlled accumulated charge on TDDB of the gate oxide of the SOI MOSFET.

Abstract: A method for visually verifying an implementation of a design is described. The method includes integrating logical design data, physical design data, and physical implementation data into a common data format and graphically displaying the commonly formatted data to provide a visualization of the design, the visualization including a spatial context component associated with the physical implementation data.

Abstract: A method of reliability evaluation and system fail warning using on chip parametric monitors. The method includes determining impact of parametric variation on reliability by identifying key parametric questions to be answered by stress, identifying parametric macros for each parameter, and identifying layout sensitive areas of evaluation. The process can also include a set of parametric macros in one of a test site or a product to be stressed, testing the set of parametric macros prior to start of stress and at each stress read out, and setting life time parameter profile for technology.

Abstract: In accordance with the present invention there are provided herein asynchronous reconfigurable logic fabrics for integrated circuits and methods for designing asynchronous circuits to be implemented in the asynchronous reconfigurable logic fabrics.

Abstract: A hardware model database is identified which stores a graph-based common representation of a hardware design that includes hardware module nodes each representative of a unique module of the hardware design and associated with one or more instances of the unique module. Additionally, a signal dump resulting from a simulation of a logic code model of the hardware design is identified. Each instance of each unique module is identified using the hardware model database, and for each assertion condition included therein, a corresponding value for the assertion condition is determined from the signal dump. Further, a construct of the hardware design corresponding to each instance of each unique module is conditionally displayed by a debugger application, based on the determined values of the corresponding assertion conditions included in the instance of the unique module.

Abstract: A semiconductor die is described. This semiconductor die includes a driver, and a spatial alignment transducer that is electrically coupled to the driver and which is proximate to a surface of the semiconductor die. The driver establishes a spatially varying electric charge distribution in at least one direction in the spatial alignment transducer, thereby facilitating determination of a spatial alignment in more than one direction between the semiconductor die and another semiconductor die. In particular, a spatial alignment sensor proximate to the surface of the other semiconductor die may detect an electrical field (or an associated electrostatic potential) associated with the spatially varying electric charge distribution. This detected electric field may allow the vertical spacing between the surfaces of the semiconductor dies and/or an angular alignment of the semiconductor dies to be determined.

Abstract: Device structures with a reduced junction area in an SOI process, methods of making the device structures, and design structures for a lateral diode. The device structure includes one or more dielectric regions, such as STI regions, positioned in the device region and intersecting the p-n junction between an anode and cathode. The dielectric regions, which may be formed using shallow trench isolation techniques, function to reduce the width of a p-n junction with respect to the width area of the cathode at a location spaced laterally from the p-n junction and the anode. The width difference and presence of the dielectric regions creates an asymmetrical diode structure. The volume of the device region occupied by the dielectric regions is minimized to preserve the volume of the cathode and anode.

Abstract: The integrated circuit comprises an analog block and a digital block in and/or on the same substrate. At least part of a first integrated-circuit portion (BA2) corresponding to the analog block is produced in a native technology and a second integrated-circuit portion (BN2) corresponding to said digital block, is produced in a shrunk technological version associated with said native technology.

Abstract: The subject system and method are generally directed to the user-friendly insertion of at least one device, and optionally chains of devices, into at least one pre-existing chain of interconnected devices within a graphical representation of a circuit design such as a circuit layout, circuit mask, or a schematic. The system and method provide for discerning the intended insertion points and performing remedial transformations of the devices within the chains to ensure compliance with both structural and operational requirements of the circuit design.

Abstract: An automated method of modifying a semiconductor chip design includes creating a timing analysis of said semiconductor chip design, identifying a plurality of gates in said semiconductor chip design which have either too fast a rising edge or falling edge, for each gate in said plurality of gates adding a stacked transistor to provide delay to the rising or falling edge of the gate. A design structure tangibly embodied in a machine readable medium for designing, manufacturing, or testing an integrated circuit, the design structure includes a CMOS device having a first transistor with a first input, a pair of stacked transistors having a second input, and an output.

Abstract: The interactive grouping tool offers the flexibility to simplify the schematic diagram of an integrated circuit (IC) design by grouping circuit elements that are not specified to be of interest into entities of any size. Circuit elements of various types and functionalities, including ports and pins, can be combined together into the same entity without modifying the underlying design logic and connectivity. By grouping and hiding the unnecessary details, the tool reduces clutter in a schematic diagram and greatly eases the process of traversing, debugging, and analyzing the schematic diagram. Users can choose to dynamically group the circuit elements on the schematic diagram without going through any compilation or synthesis process. Users can also choose to revert any of the entities back to the original schematic diagram with the ungrouping operation. For specific or batch manipulation of the schematic diagram, the tool provides a scripting interface for users to enter commands.

Abstract: A method of configuring a programmable integrated circuit device with a user logic design includes analyzing the user logic design to identify unidirectional logic paths within the user logic design and cyclic logic paths within the user logic design, assigning the cyclic logic paths to logic in a first portion of the programmable integrated circuit device that operates at a first data rate, assigning the unidirectional logic paths to logic in a second portion of the programmable integrated circuit device that operates at a second data rate lower than the first data rate, and pipelining the unidirectional data paths in the second portion of the programmable integrated circuit device to compensate for the lower second data rate. A programmable integrated circuit device adapted to carry out such method may have logic regions operating at different rates, including logic regions with programmably selectable data rates.

Abstract: In one aspect, a method of testing an IC is provided. In one embodiment, the method includes: programming a resistive element in the IC at an intermediate ON state, where in addition to the intermediate ON state, the resistive element has another ON state, further where at the intermediate ON state, the resistive element has a resistance that is at least 10 times greater than a resistance of the resistive element at the another ON state; and applying test data to the resistive element.

Abstract: A computer system is provided that enables a designer of a circuit design to fracture and reconstitute a larger design for both computer modeling of the functionality and the physical implementation or rendering of the circuit design. More particularly, the designer may refine or re-work a sub-module of the larger sub-circuit without having to create a corresponding sub-module in the physical implementation. This capability thus avoids the significant complexity required for sub-module refinement in the current state of the art, and provides the designer with a much simpler flow.

Abstract: Embodiments that design integrated circuits using a 1×N compiler in a closed-loop 1×N methodology are disclosed. Some embodiments create a physical design representation based on a behavioral representation of a design for an integrated circuit. The behavioral representation may comprise RTL HDL with one or more 1×N building blocks. The embodiments may alter elements of the 1×N building block by using logic design tools, synthesis tools, physical design tools, and timing analysis tools. Further embodiments comprise an apparatus having a first generator to generate a behavioral representation of a design for an integrated circuit, a second generator to generate a logical representation of the design, and a third generator to generate a physical design representation of the design, wherein the representation generators may create updated versions of the representations which reflect alterations made to 1×N building block elements.

Abstract: A method of sensitizing a sequential circuit is described. This sensitizing generates stimuli to drive any circuit output to a predetermined value or transition. The method includes creating a directed graph of the sequential circuit. Nodes of the graphs can be topologically sorted. In one embodiment, feedback loops in the directed graph can be removed before topologically sorting the nodes. Final vectors for the sequential circuit can be generated based on the sorted nodes. Notably, the final vectors are expressed only by primary inputs to the sequential circuit. Using only primary inputs in the final vectors accurately replicates the sequential circuit under test, thereby ensuring accurate timing, power, and noise arcs are measured.

Abstract: A delay parameter extracting apparatus includes a schematic composing unit, a layout composing unit, a verification unit, and a parameter extracting unit. The schematic composing unit is configured to: facilitate design of a schematic circuit; and generate a first net list based on the design of the schematic circuit. The layout composing unit is configured to: facilitate design of a layout based on the schematic circuit; and generate a second net list based on the design of the layout. The verification unit is configured to verify the layout by comparing the first net list to the second net list. The parameter extracting unit is configured to: extract capacitance (C) values from the layout; and extract delay parameters based on the C values with respect to respective nets according to types of delay parameters associated with the respective nets.

Abstract: Software method to identify presence of multiple digital drivers disposed in a manner that creates multiple conflicting current paths in complex electronic circuit designs. Digital drivers are analyzed by expanding backwards to build a logical tree representation of the previous predecessor circuit portions that drive the digital driver's state. The previous level of predecessor circuit node states earlier in the circuit are checked to see if they simultaneously create pull up paths to power nets and pull down paths to ground nets, thus logically determining if a contention configuration is possible. This back-trace analysis is then repeated for the next previous level of predecessor circuit portions, further seeking logical contention issues within the expanding logic tree. This is continued until either no predecessor circuit portion that causes contention is found, or until a portion that does cause logical contention is found, in which case the contention digital drivers are reported.

Abstract: A tool for rewriting hardware design hardware design language (HDL) code is arranged for receiving HDL code (2) expressing a hardware design of a digital circuit. The tool comprises means (4) for generating a representation (6) of the syntax of the received HDL code, the representation containing a plurality of nodes. The tool further comprises means (3) for determining modifications to the representation of the syntax whereby at least one node is added to or removed from the representation and computation means (9) for generating a modified version (10) of the received HDL code using the received HDL code and modifications to the received HDL code, the modifications determined from the modified representation of the syntax.

Abstract: Disclosed is an improved method, system, and computer program product to perform automated generation and/or modification of control scripts for EDA tools. A script generator/modifier mechanism is used to access an optimization database to identify potential content of the control script. This potential content is then analyzed to identify the appropriate content to insert into the control script, to accomplish the intended goal of the user in operating the EDA tool. The script generator/modifier mechanism may itself be implemented in a script format.

Abstract: The present disclosure relates to a computer-implemented method for electronic design verification. The method may include providing, using one or more processors, an electronic design having at least one floating point variable associated therewith. The method may further include converting the at least one floating point variable of the electronic design to a fixed point variable to generate a fixed point implementation of the electronic design. The method may also include processing, using a formal engine, the fixed point implementation of the electronic design.

Abstract: A first MOS transistor has a channel length. Based on a parameter associated with the first MOS transistor, the first MOS transistor is selected to be simulated as at least a first transistor and a second transistor in series. The circuit is simulated with the first transistor and the second transistor in place of the first MOS transistor. Based on the results of the simulation, device degradations are calculated for the first transistor the second transistor. A degraded netlist is created. In the degraded netlist, the first transistor is degraded by a device degradation for the first transistor. The second transistor is degraded by a device degradation for the second transistor. The circuit is re-simulated with the first degraded transistor and the second degraded transistor in place of the first MOS transistor.

Abstract: An adaptive template system for an automated PCB manufacturing release package system includes a PCB database including PCB CAD data associated with a CAD file of PCB design. A shape engine is configured to read the PCB CAD data and display simultaneous views of a given PCB from the PCB database including different views of the PCB and configured to create reconfigurable objects displayed simultaneously in the form of different views of the PCB such that any change in the design of the PCB is reflected in the different views. One or more selectable adaptive templates, and an adaptive template object in the shape engine are configured to: read a selected adaptive template, generate a view of the adaptive template which provides for input of user-entered data, and retain the user-entered data in the adaptive template.

Abstract: A circuit verification method for a logic circuit is presented. The method includes developing a first hardware description language (HDL) code representative of the logic circuit and, for an embedded portion of the logic circuit, developing a second HDL code representative of the embedded portion. The second HDL code includes a process of forcing inputs of the embedded portion to one or more known values. The method further includes operating a processing device in conjunction with the first and second HDL codes and verifying operation of the embedded portion in response to forcing the inputs to the logic circuit.

Abstract: Impedance control, and the uniformity of electrical and mechanical characteristics in electronic packaging are becoming more important as chip and bus speeds increase and manufacturing processes evolve. Current state of the art design and manufacture processes inherently introduce physical dielectric thickness variations into PCB cross sections. These thickness variations between the ground reference plane(s) and the signal layer(s) inject undesirable characteristic impedance variations and undesirable mechanical variations in thickness and surface topology. Therefore a multilayer electronic structure and a method of manufacture is presented.