Dummy wafer
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Description
The broken lines shown in the drawings represent portions of the dummy wafer that form no part of the claimed design. Right, left and back views of the dummy wafer shown in
Claims
The ornamental design for a dummy wafer, as shown and described.
Referenced Cited
U.S. Patent Documents
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Patent History
Patent number: D785576
Type: Grant
Filed: Apr 24, 2015
Date of Patent: May 2, 2017
Assignee: Tokyo Electron Limited (Tokyo)
Inventors: Yutaka Motoyama (Iwate), Kohei Fukushima (Iwate)
Primary Examiner: Elizabeth J Oswecki
Application Number: 29/524,898
Type: Grant
Filed: Apr 24, 2015
Date of Patent: May 2, 2017
Assignee: Tokyo Electron Limited (Tokyo)
Inventors: Yutaka Motoyama (Iwate), Kohei Fukushima (Iwate)
Primary Examiner: Elizabeth J Oswecki
Application Number: 29/524,898
Classifications
Current U.S. Class:
Semiconductor, Transistor Or Integrated Circuit (24) (D13/182)