Scanning-probe Techniques Or Apparatus; Applications Of Scanning-probe Techniques, E.g., Scanning Probe Microscopy [spm] Patents (Class 850)
- Non-SPM analyzing devices, e.g., Scanning Electron Microscope [SEM], spectrometer or optical microscope (EPO) (Class 850/9)
- Display or data processing devices (EPO) (Class 850/10)
- Means for establishing or regulating a desired environmental condition within a sample chamber (EPO) (Class 850/12)
- Means for protecting or isolating the interior of a sample chamber from external environmental conditions or influences, e.g., vibrations or electromagnetic fields (EPO) (Class 850/17)
- Sample handling device or method(EPO) (Class 850/18)
- Multiple-type SPM, i.e., involving two or more SPM techniques (EPO) (Class 850/22)
- Scanning Tunnelling Microscopy [STM] or apparatus therefor, e.g., STM probes (EPO) (Class 850/26)
- Scanning Near-Field Optical Microscopy [SNOM] or apparatus therefor, e.g., SNOM probes (EPO) (Class 850/30)
- Atomic Force Microscopy [AFM] or apparatus therefor, e.g., AFM probes(EPO) (Class 850/33)
- Scanning Ion-Conductance Microscopy [SICM] or apparatus therefor, e.g., SICM probes(EPO) (Class 850/43)
- Scanning Capacitance Microscopy [SCM] or apparatus therefor, e.g., SCM probes (EPO) (Class 850/44)
- Magnetic Force Microscopy [MFM] or apparatus therefor, e.g., MFM probes (EPO) (Class 850/46)
- Scanning Thermal Microscopy [SThM] or apparatus therefor, e.g., SThM probes (EPO) (Class 850/50)
- Scanning Electro-Chemical Microscopy [SECM] or apparatus therefor, e.g., SECM probes (EPO) (Class 850/51)
