Abstract: An apparatus includes a transmission circuit which transmits a data by a differential signal, and a control circuit which halts a portion of the differential signal under a predetermined condition.
Abstract: A self correcting device includes a first flip-flop to receive data and coupled to a clock input; one or more delayed flip-flops used to detect delay variations; a multiplexer coupled to the output of the first flip-flop and the delayed flip-flops, a metastability detector and error check controller to control the multiplexer to select one flip-flop output; and an adaptive voltage swing link coupled to the multiplexer output to generate a voltage swing on the link based on a selected clock skew.
Abstract: A semiconductor integrated circuit includes: a first flip-flop, a combined circuit and a second flip-flop that form a critical path; a first delay circuit and a third flip-flop that are provided in the post-stage of the combined circuit; a second delay circuit and a fourth flip-flop that are provided in the post-stage of the combined circuit; a first comparison circuit that compares the output of the second flip-flop with the output of the third flip-flop; a second comparison circuit that compares the output of the second flip-flop with the output of the fourth flip-flop: and a control circuit that controls a source voltage supplied to the combined circuit in accordance with the outputs of the comparison circuits. A delay time by the first delay circuit is different from a delay time by the second delay circuit.
Abstract: An apparatus includes a first selector which selects a test data during a first operation mode, and selects a first input data during a second operation mode, a first latch circuit which latches an output signal of the first selector according to a first clock signal, a second selector which selects one from a second input data and an output signal of the first latch circuit, and a second latch circuit which latches the second input data sent from the second selector according to a second clock signal during the second operation mode, and passes through the output signal of the first latch circuit sent from the second selector during the first operation mode.
Abstract: The present invention provides a standard cell and a scan flip flop circuit capable of introducing a scan test also to a system LSI having an ACS circuit. One standard cell is configured by: a 3-input selection circuit for selecting one signal from three input signals; and a flip flop circuit. The 3-input selection circuit receives a control signal and a test signal at its control input part and its first input part, respectively. First and second signals are supplied to second and third input parts, and a selection signal is supplied to a selector input part. On the basis of the control signal and the selection signal, any of the signals input to the first to third input parts is output from the output part.
Abstract: A semiconductor device includes an anode electrode in Schottky contact with an n-type drift layer formed in an SiC substrate and a JTE region formed outside the anode electrode. The JTE region is made up of a first p-type zone formed in an upper portion of the drift layer under an edge of the anode electrode and a second p-type zone formed outside the first p-type zone having a lower surface impurity concentration than the first p-type zone. The second p-type zone is provided 15 ?m or more outwardly away from the edge of the anode electrode. The surface impurity concentration of the first p-type zone ranges from 1.8×1013 to 4×1013 cm?2, and that of the second p-type zone ranges from 1×1013 to 2.5×1013 cm?2.
Abstract: A method and device for managing metastable signals. The device includes: a first latch and a second latch, a multiple switching point circuit, connected between an output node of the first latch and an input node of the second latch, wherein the multiple switching point circuit includes at least one pull up transistor and at least one pull down transistor that are selectively activated in response to a feedback signal provided from the second latch and in response to a an output signal of the first latch such as to define at least a low switching point that is lower than a high switching point of the multiple-switching point circuit; wherein a switching point of an inverter within the first latch is between the high and low switching points.
Type:
Application
Filed:
June 20, 2006
Publication date:
July 9, 2009
Applicant:
Freescale Semiconductor, Inc.
Inventors:
Michael Priel, Dan Kuzmin, Amir Zaltzman
Abstract: The scan flipflops on a semiconductor chip are stitched together to form one or more scan chains, located in one or more standard cell placement regions, after the optimal physical location of each scan flip-flop has been determined. As a result, the total length of the scan chain wires is substantially reduced, thereby reducing on-chip wiring congestion, flip-flop load capacitance, and flipflop power dissipation.
Abstract: An integrated circuit includes at least one latch circuit (300). The latch circuit (300) includes a first stage comprising a latch node (311) positioned between a first pull up device (303) operable to receive a first data signal and a first pull down device (302) operative to receive second data signal. A second stage includes a second pull up device (323) and a second pull down device (322) having the latch node (311) therebetween, wherein at least one gate of the first pull up or first pull down device (302, 303) is directly coupled to a gate of the second pull up or second pull down device (322, 323). An output inverter (330) is coupled to the latch node (311).
Abstract: Embodiments are described including those pertaining to an input buffer having first and second complementary input terminals. One such input buffer has a symmetrical response to a single input signal applied to the first input terminal by mimicking the transition of a signal applied to the second input terminal in the opposite direction. The aforementioned input buffer includes two amplifier circuits structured to be complementary with respect to each other. Each of the amplifier circuits includes a first transistor having a first input node that receives an input signal transitioning across a range of high and low voltage levels, and a second transistor having a second input node that receives a reference signal.
Abstract: A latch circuit includes a feedback circuit having inverter circuits and at least two input terminals and an input circuit for inputting input signals or signals having the same phase as the input signals to the input terminals of the feedback circuit in synchronization with a clock signal. In the feedback circuit section, only when the input signals or the signals having the same phase as the input signals are input to the at least two input terminals at the same time, positive feedback using a predetermined number of amplification stages is applied to the input terminals.
Abstract: A method of determining one or more transistors within a particular circuit to be respectively replaced with a hardened transistor includes: identifying, as not requiring hardening, one or more transistors; identifying, as candidates for hardening, each transistor in the circuit not previously identified as not requiring hardening; and employing the hardened transistor in place of a transistor identified as a candidate for hardening. The circuit is a latch and the transistor is an SOI CMOS FET. The transistor is also an SOI transistor. The series transistor includes first and second series-connected transistors having a shared source/drain region whereby a drain of the first series-connected transistor is merged with a source of the second series-connected transistor.
Type:
Application
Filed:
September 19, 2007
Publication date:
May 28, 2009
Applicant:
INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventors:
Ethan H. Cannon, AJ KleinOsowski, K. Paul Muller, Tak H. Ning, Philip J. Oldiges, Leon J. Sigal, James D. Warnock, Dieter Wendel
Abstract: A latch circuit includes: first nodes which are three or more and to which a voltage in a first signal level is set; second nodes which are three or more and to which a voltage in a second signal level obtained by inverting the first signal level is set; and first node voltage control circuits having the first nodes; and second node voltage control circuits having the second nodes. Each of the first node voltage control circuits is connected with at least two of the three or more second nodes, and controls the voltage of the first node based on the voltages of the at least two second modes. Each of the second node voltage control circuits is connected with at least two of the three or more first nodes and controls the voltage of the second node based on the voltages of the at least two first nodes.
Abstract: Data storage circuits and components of such circuits constructed using nanotube switching elements. The storage circuits may be stand-alone devices or cells incorporated into other devices or circuits. The data storage circuits include or can be used in latches, master-slave flip-flops, digital logic circuits, memory devices and other circuits. In one aspect of the invention, a master-slave flip-flop is constructed using one or more nanotube switching element-based storage devices. The master storage element or the slave storage element or both may be constructed using nanotube switching elements, for example, using two nanotube switching element-based inverters. The storage elements may be volatile or non-volatile. An equilibration device is provided for protecting the stored data from fluctuations on the inputs. Input buffers and output buffers for data storage circuits of the invention may also be constructed using nanotube switching elements.
Abstract: The disclosure includes a latch structure and self-adjusting pulse generator using the latch. In an embodiment, the system includes a first latch and a pulse generator coupled to provide a timing signal to the first latch. The pulse generator includes a second latch that has characteristics matching the first latch.
Abstract: The present invention relates to controlling the timing of a clock signal in high speed circuits, such as an analogue-digital converter (ADC). In some high speed data transfer techniques, the incoming data is latched using a clock signal. Often, the delay between the incoming data being clocked into the circuit and being ready to use (referred to as the “clock-to-Q period”) is large enough to cause problems. In particular, the clock-to-Q period may be sufficient to result in the original clock signal being inappropriate to clock the latched signal.
Abstract: A high-speed latch is disclosed that can function at high-speed input clocking frequencies. The active loads used within the latch design exhibit an input impedance that is inductive to the rest of the circuit to improve the driving capability of the overall latch in the presence of loading capacitances. The latch circuit, when used in a system or stand alone divider, will consume very low power while reducing the silicon die area. Possible applications include but are not limited to frequency dividing and counting applications. Of particular interest is the use of this high-speed latch in a prescaler divider as a part of a charge pump phase-locked loop design for single chip CMOS multi-band and multi-standard radio frequency transceiver integrated circuits.
Abstract: A low power flip-flop circuit and its operation are described. In one example, the circuit includes a clocked gate for producing an output in response to an input when a clock is received, and a clock control circuit to receive the clock and the input, to determine whether the output will be changed by the input and to provide the clock to the clocked gate if the output will be changed by the input.
Abstract: A time-based controller provides control for a controlled system including a plant having an integration response. The time-based controller includes a comparator that detects a polarity change in a comparison of a sensed signal from the plant and a reference signal while a control signal is in a first state, time calculation logic that, responsive to detection of the change in the comparison, determines a time at which to change a state of a control signal supplied to the plant, and a modulator that, at the determined time, changes the state of the control signal supplied to the plant from the first state to a second state.
Abstract: A latch is provided that includes a first inverter, a second inverter, a first latch circuit and a second latch circuit. The first inverter to receive the first clock signal from an input port and to provide a clock signal. The second inverter to receive the first clock signal from the input port and to provide a clock signal. The first latch circuit is to store data and to receive a clock signal from the second inverter. The second latch circuit is further to store data and to receive a clock signal from the first inverter.
Abstract: A flip-flop circuit of the present invention includes a first switch and a second switch which are connected in series to each other. The first switch includes: two input ports upon which light source light and signal light are incident; two output ports for outputting an optical output; and a thermal lens forming element for forming a thermal lens in a predetermined optical inputting condition. Although the second switch is composed in the same manner as that of the first switch, a relation between the wave-lengths to be utilized is inverted. When a state is changed from OFF to ON, a pulse signal is inputted for setting and one of the rays of output light of the second switch is fed-back to the first switch so as to maintain the state of ON. When the state is changed from ON to OFF, a pulse of additional signal light is inputted. Due to the foregoing, the two states of ON and OFF can be stably maintained.
Type:
Grant
Filed:
February 9, 2007
Date of Patent:
March 31, 2009
Assignees:
Dainichiseika Color & Chemicals Mfg. Co., Ltd., National Institute of Advanced Industrial Science and Technology
Abstract: A pattern sequence and state transition trigger generator provides a trigger when a specified transition from one pattern/state to another pattern/state occurs in a set of input signals. Decoders detect each specified pattern/state from the set of input signals to produce a prior value and a current value representing the transition. The prior value is slightly delayed and combined with the current value to produce an overlap when the specified transition occurs, which in turn generates the trigger.
Type:
Grant
Filed:
August 11, 2005
Date of Patent:
March 24, 2009
Assignee:
Tektronix, Inc
Inventors:
Que Thuy Tran, David L. Kelly, Michael M. Heidling
Abstract: A latch of an integrated circuit is able to retain data at the latch when the integrated circuit is in a low-power mode. The latch retains data at a retention stage in response to assertion of an isolation signal. In response to a reference voltage supplied to the latch being restored to a normal operating voltage, indicating that the integrated circuit has transitioned from the low-power mode to a normal mode, a data restoration circuit provides the retained data at the output of the latch prior to negation of the isolation signal. This reduces the likelihood that a delay in negation of the isolation signal will result in the latch output providing incorrect data, thereby reducing the likelihood of the latch output causing errors in downstream elements of the integrated circuit.
Abstract: A latch circuit comprising, a differential input with a non-inverting input (D+) and an inverting input (D?). The latch further comprises a differential output with a non-inverting output (Q+) and an inverting output (Q?). One of the outputs (Q?) is coupled to one of the inputs input (D+) having an opposite polarity. The latch further comprises a control input for receiving a control signal (VcM) for determining a threshold for an input signal (In) such that if the input signal is at larger than the threshold the non-inverting output is in a HIGH logic state and in a LOW state if the input signal is smaller than the threshold.
Type:
Grant
Filed:
January 25, 2005
Date of Patent:
March 10, 2009
Assignee:
NXP B.V.
Inventors:
Mihai Adrian Tiberiu Sanduleanu, Eduard Ferdinand Stikvoort, Idrissa Cissé
Abstract: A dynamic flip-flop circuit which outputs an output signal on which a digital data signal is reflected based on a clock, includes: a first control stage configured to output a signal having a level inverted from that of the digital data signal within a period within which the clock has a second level; a second control stage configured to output a signal of a first level within the period within which the clock has the second level and a signal of a level within another period within which the clock has the first level; a third control stage configured to output an output signal of the first level within a period within which the signal outputted from the second control stage has the second level; and a phase adjustment circuit configured to adjust the phase to produce a second clock and supply the second clock to the third control stage.
Abstract: In a low power consumption mode in which prior data is retained upon power shutdown, the return speed thereof is increased. While use of an existent data retaining flip-flop may be considered, this is not preferred since it increases area overhead such as enlargement of the size of a cell. A power line for data retention for power shutdown is formed with wirings finer than a usual main power line. Preferably, power lines for a data retention circuit are considered as signal lines and wired by automatic placing and mounting. For this purpose, terminals for the power line for data retention are previously designed by providing the terminals therefore for the cell in the same manner as in the existent signal lines. Additional layout for power lines is no longer necessary for the cell, which enables a decrease in the area and design by an existent placing and routing tool.
Abstract: A latch includes a data input terminal for receiving a data signal; a data output terminal for outputting the data signal; a first control terminal for receiving a control signal to set or reset the data signal derived from the data output terminal; a sleep signal input terminal for receiving a sleep signal to determine a sleep mode; a first logic circuit having input terminals coupled to the data input terminal, the first control terminal and the sleep signal input terminal and an output terminal coupled to the data output terminal; and a second logic circuit having input terminals coupled to the data output terminal, the first control terminal and the sleep signal input terminal and an output terminal coupled to the data input terminal; wherein the first logic circuit or the second logic circuit ignores the first control signal in response to the sleep signal when the latch is operated in the sleep mode.
Abstract: A semiconductor integrated circuit device includes a comparator for making a comparison between a logical value of an input signal and a logical value of an output signal and outputting a combination signal having a combination of the logical values; and a flip-flop circuit configured to maintain a state of the output signal with electric power for maintaining the state less than electric power for state transition of the output signal in the case where the combination of the logical values of the combination signal is a predetermined combination, and wherein the comparator outputs the combination signal having the predetermined combination to an input terminal portion in the case of determining that the input signal does not vary the state of the output signal based on a result of the comparison between the logical value of the input signal and the logical value of the output signal.
Abstract: An integrated circuit (22) having a serial interface (25) with improved access times is disclosed. The serial interface (25) includes a serial output port arranged as a shift register of flip-flop stages (321 through 32n) and a last output latch stage (320). The last output latch stage (320) includes an integral output buffer (33), and as such is constructed differently from the other output flip-flops (321 through 32n), which include master and slave latches. No external output buffer is then required; this last output latch stage (320) directly drives the output terminal and the external serial data line (SDATA).
Abstract: A low power consumption in a semiconductor integrated circuit device can be achieved by reducing a glitch power in a flip-flop. In a pulse-generator-incorporated auto-clock-gating flip-flop in which data latch is performed by using a pulsed clock, input data is latched based on an output of a dynamic XOR circuit, which is a comparator circuit, during a period when the pulsed clock is at a high level, and the dynamic XOR circuit is cut off during a period when the pulsed clock is at a low level.
Abstract: A circuit for balancing delays through true and complement phases of complementary drivers includes: a first driver; a second driver; a first delay device coupled to an input of the first driver and having an input coupled to an input signal node; a second delay device coupled to an input of the second driver and having an input coupled to the input signal node through a first inverter, wherein the first and second delay devices are clocked such that an input signal reaches the first driver simultaneously with an inverted input signal reaching the second driver.
Abstract: A dynamic latch includes a first stage for receiving an input data value and for providing true and complement logic values representing the input data value; a second stage for receiving the true and complement logic values into first and second dynamic node, when a control signal is active; and a holding that outputs the true and complement logic values while the control signal is active. The second stage may provide a feedback signal to the first stage to block propagation of changes in the input data value after the true and complement logic values have been received. The feedback signal may be derived, for example, from logic values on the dynamic nodes. A holding circuit may be provided.
Abstract: A circuit for data alignment includes a first latch unit and a second latch unit. The first latch unit latches serial input data by using a plurality of first clocks with different phases and the same frequency to output latched data. The second latch unit latches the data from the first latch unit by using a plurality of second clocks with a lower frequency than the first clocks and more diverse phases to thereby output parallel data.
Abstract: Signal delivery delay margin of a bypass flip-flop circuit is stabilized during high-frequency operation. An input controller for logically operating a bypass signal and a clock produces first and second output signals having different states depending on whether or not the bypass signal is activated. A latch circuit latches input data based on the first and second output signals. A latch controller logically operates the bypass signal and input data to generate a third output signal having a different state depending on whether or not the bypass signal is activated. An output controller is switched in response to the states of the first and second output signals for logically combining an output signal selected from the latch circuit and the third output signal to provide the output signal.
Abstract: A shift register capable of supplying only a necessary clock signal to a necessary unit register with simple constitution. A semiconductor device is provided with a shift register in which a plurality of stages of unit registers is connected, in which the unit register comprises a flip-flop circuit, a first switch and a second switch, a first clock signal line is electrically connected to the flip-flop circuit through the first switch, a second clock signal line is electrically connected to the flip-flop circuit through the second switch, the first switch is controlled to be on/off by an output signal from the flip-flop circuit, and the second switch is controlled to be on/off by an input signal to the flip-flop circuit.
Type:
Grant
Filed:
April 29, 2005
Date of Patent:
September 23, 2008
Assignee:
Semiconductor Energy Laboratory Co., Ltd.
Abstract: A plurality of flip-flop circuits, having different circuit configurations, which perform an identical digital signal processing are mixed on a single semiconductor substrate. A first flip-flop circuit among the plurality of flip-flop circuits receives a clock signal supplied from outside the flip-flop circuits, through at least two stage inverters, and operates with clock signals outputted from the inverters. A second flip-flop circuit receives the clock signal supplied from outside the flip-flop circuits through at least one inverter having a less number of stages than the number of stages of the inverter contained in the first flip-flop circuit, and operates with at least one of the clock signal and a clock signal outputted from the inverter.
Abstract: A circuit includes an input terminal, an output terminal and a latch. The input terminal receives an input signal. The latch is programmable with a value. The latch communicates the input signal to the output terminal in response to the circuit not being in a sleep mode and in response to the circuit being in the sleep mode, furnishes a second signal to the output terminal indicative of the value.
Type:
Grant
Filed:
October 21, 2004
Date of Patent:
August 26, 2008
Assignee:
Intel Corporation
Inventors:
Zahid Ahsanullah, Michael Longwell, James R. Feddeler
Abstract: A latch has a first mode in which the latch functions as a dynamic latch and a second mode in which the latch functions as a static latch. The latch has a feedback circuit that in turn has two parallel switchable loads. The first load is responsive to a data input signal of the latch in the first mode and disabled in the second mode. The second load is responsive to a clock signal in the second mode and disabled in the first mode. The switchable loads being in parallel provides for the ability to select the feedback that is better for the particular mode of operation. The first and second switchable loads can be optimized for the particular mode of operation that will use it.
Abstract: This disclosure can provide methods, apparatus, and systems for dividing an input clock or master clock by an integer or non-integer divisor and generating one or more balanced, 50% duty cycle, divided that are phase-aligned to the input clock. The non-integer divisors can include half-integers, N/2, e.g. the division can be denoted 2:N. The value of N for each phase-aligned, balanced, divided clock can be distinct. The method can include generating an input clock signal having an input clock frequency, generating a secondary clock signal that transitions between a first state and a second state based on the input clock signal, generating a delayed secondary clock signal that is time delayed relative to the secondary clock signal, and generating the output clock signal that has a frequency that is a non-integer division of the input clock frequency.
Abstract: The disclosed invention is intended to decrease the power consumption of a pulse latch circuit. A pulse latch circuit that operates in sync with a pulsed clock signal, including a first operation mode in which shifting test pattern scan data is performed and a second operation mode in which shifting the test pattern scan data is not performed, comprises the following circuits: a first latch circuit that is able to latch input data in sync with the clock signal; a second latch circuit that is connected to the first latch circuit and is able to latch the test pattern scan data to be shifted in sync with the clock signal; and a control circuit that stops supply of the clock signal to the second latch circuit during the second operation mode. By thus stopping the supply of the clock signal to the second latch circuit, decrease the power consumption is achieved.
Abstract: Data storage circuits and components of such circuits constructed using nanotube switching elements. The storage circuits may be stand-alone devices or cells incorporated into other devices or circuits. The data storage circuits include or can be used in latches, master-slave flip-flops, digital logic circuits, memory devices and other circuits. In one aspect of the invention, a master-slave flip-flop is constructed using one or more nanotube switching element-based storage devices. The master storage element or the slave storage element or both may be constructed using nanotube switching elements, for example, using two nanotube switching element-based inverters. The storage elements may be volatile or non-volatile. An equilibration device is provided for protecting the stored data from fluctuations on the inputs. Input buffers and output buffers for data storage circuits of the invention may also be constructed using nanotube switching elements.
Abstract: Various systems and methods for comparing signals are disclosed herein. For example, some embodiments of the present invention provide comparator circuits with a preamplifier circuit, a latch circuit and a current re-use circuit. The current re-use circuit applies a current to the preamplifier circuit during a transparent phase, and applies a similar current to the latch circuit during a latch phase.
Abstract: An output circuit of a semiconductor memory device includes a first data path, a second data path and a third data path. The first data path transfers a sense output signal, and latches the sense output signal to output the sense output signal to a first node. The second data path transfers the sense output signal, and latches the sense output signal to output the sense output signal to the first node. The third data path latches a signal of the first node, and transfers the signal of the first node to generate output data. Accordingly, the semiconductor memory device including the output circuit can operate at a relatively higher frequency using a pseudo-pipeline structured circuit, which combines a wave pipeline structure with a full pipeline structure.
Type:
Grant
Filed:
September 12, 2006
Date of Patent:
June 17, 2008
Assignee:
Samsung Electronics Co., Ltd.
Inventors:
Kyoung-Ho Kim, Seong-Jin Jang, Joung-Yeal Kim
Abstract: A latch includes: an amplifying circuit, for receiving a first bias current in a first state for amplifying an input signal to generate an amplified signal; a latching unit, for latching the amplified signal and receiving a second bias current in a second state to output the amplified signal; and a biasing circuit, for providing a biasing current to the amplifying circuit, and providing the second biasing current to the latching unit. The biasing circuit includes: a first biasing module for providing a third biasing circuit to the amplifying circuit in the first state; and a second biasing module, for providing a fourth biasing current to the amplified circuit; wherein the first biasing circuit is equal to a sum of the third biasing current and the fourth biasing current.
Abstract: A lookup table (LUT) is programmable to function as a flip-flop. The LUT includes a plurality of memory cells, a plurality of transmission gates, and first and second logic gates. The transmission gates are coupled between the memory cells and an output terminal of the LUT to form a multiplexer circuit selecting one of a plurality of values stored in the memory cells and providing the selected value to the output terminal. First and second logic gates are included in two of the paths through the multiplexer, also providing first and second feedback paths within the LUT. These feedback paths enable the programmable implementation of first and second latches that form the flip-flop. Another subset of the memory cells can be optionally used to implement a function that drives the data input of the flip-flop.
Abstract: Provided are a pass gate circuit and a method of controlling the same for improving meta-stability when transferring signals. The gate circuit includes a signal transfer unit transferring an input signal in response to a transfer control signal, and a control signal generating unit generating a safety window having a predetermined width in response to detection of a transition of the input signal, generating an internal control signal for maintaining the signal transfer state of the signal transfer unit, and outputting the internal control signal to the signal transfer unit as the transfer control signal.
Abstract: The inventive technique can dynamically adjust the current being applied within the components of a prescaler or divider. This dynamic scaling of the current can improve the speed of the divider by a factor of two or reduce the average current in half when compared to the conventional prescaler. Inverters are used to directly adjust the dynamic value of the currents. The removal of the conventional NMOS device within the conventional circuit eliminates one gate delay in the CML prescaler. Second, the inventive prescaler circuits operate under a current injection/extraction technique. A group of small matched inverters can be used to drive each current switching circuit independently within the entire prescaler as compared to a large buffer driving the entire conventional prescaler. Finally, dynamic current scaling offers the designer additional flexibility in the design trade off between the maximum current applied to the load and achieving the maximum performance.
Abstract: A pair of transistors receive the input of signals of input data and the inverted input data. An activation circuit, which is provided between the pair of transistors and fixed potential, activates the pair of transistors in a conduction state. A clock control circuit receives a clock signal and sets the activation circuit to a conduction state for a predetermined period starting from an edge timing of the clock signal. The activation circuit includes a first activation transistor and a second activation transistor which are connected in cascade with each other. The clock control circuit turns on both the first activation transistor and the second transistor for the predetermined period starting from the edge timing of the clock signal, and turns off at least one of the first activation transistor and the second activation transistor for a period other than the predetermined period.
Abstract: A method and apparatus are provided for performing on-board, in-circuit, and/or wafer level scan-based testing of integrated circuits. With the apparatus and method, one or more sequential storage elements, e.g., flip/flops, are coupled to combinational logic and are configured to have an additional port for receiving a scan mode signal. The scan mode signal sets the sequential storage element into one of two modes of operation: static mode in which the sequential storage element's output does not change on a falling edge of a scan enable signal or a transitional mode in which the sequential storage element's output is permitted to change on the falling edge. With sequential storage elements configured in this manner, a configuration scan is performed to set certain ones of the sequential storage elements into a static mode and other sequential storage elements into a transitional mode. A test pattern is then applied to the sequential storage elements and a pattern capture cycle is commenced.
Type:
Grant
Filed:
August 5, 2004
Date of Patent:
February 5, 2008
Assignee:
Seagate Technology LLC
Inventors:
Robert William Warren, Jr., Paul Joseph Huelskamp, Bradley Allen MacMonagle
Abstract: An enveloping curves generator is disclosed that guarantees that one curve will envelop or overlap another when both are traversing from one logic level to another, and where the other overlaps the first when both traversing the other direction. In one case, a steering FET controlled by an input signal drives a first output high via a circuit. That first output going high, after a delay, drives a second output high. When the input goes low, a second steering FET controlled by the input signal drives the second output low. That second output going low, after a delay, drives the first output low. No latching is provided in the present invention.