Abstract: A flip-flop circuit includes an input portion that receives a first external input signal through a first external input terminal, a storage portion that stores a signal transmitted from the input portion, and an output portion that outputs the signal stored in the storage portion through an external output terminal as a logic operation result with respect to a second external input signal received through a second external input terminal of the input portion. The output portion includes a logic gate directly connected to the external output terminal and an input terminal of the logic gate receives the signal stored in the storage portion.

Abstract: The clock circuit of an integrated circuit operates with variations such as temperature, ground noise, and power noise. Various aspects of an improved clock integrated circuit address one or more of the variations in temperature, ground noise, and power noise.

Abstract: The present invention provides a standard cell and a scan flip flop circuit capable of introducing a scan test also to a system LSI having an ACS circuit. One standard cell is configured by: a 3-input selection circuit for selecting one signal from three input signals; and a flip flop circuit. The 3-input selection circuit receives a control signal and a test signal at its control input part and its first input part, respectively. First and second signals are supplied to second and third input parts, and a selection signal is supplied to a selector input part. On the basis of the control signal and the selection signal, any of the signals input to the first to third input parts is output from the output part.

Abstract: The invention describes self-timed RS-trigger with the enhanced noise immunity. Declared effect is achieved due to that circuit containing storage unit (1), indication unit (2), paraphase data input (3, 4), paraphase data output (5, 6), and indication output (7), is modified by adding two inverters (8, 9) and preindication unit (10). Inverters increase output capability of the trigger's paraphase data output and provide an electric isolation of the outputs of the storage unit from an external environment that leads to increasing immunity of the data stored in the trigger to influence of noises at signal wires. The preindication unit provides the trigger's indicatability.

Abstract: A method of determining one or more transistors within a particular circuit to be respectively replaced with a hardened transistor includes: identifying, as not requiring hardening, one or more transistors; identifying, as candidates for hardening, each transistor in the circuit not previously identified as not requiring hardening; and employing the hardened transistor in place of a transistor identified as a candidate for hardening. The circuit is a latch and the transistor is an SOI CMOS FET. The transistor is also an SOI transistor. The series transistor includes first and second series-connected transistors having a shared source/drain region whereby a drain of the first series-connected transistor is merged with a source of the second series-connected transistor.

Abstract: A signal processing apparatus includes: a latch circuit; a set pulse generation circuit; a reset pulse generation circuit; and a correction set signal forming circuit. The correction set signal forming circuit forms a correction set signal for applying a set instruction continuously during a time period from a time point of a front edge of the set pulse generated from the set pulse generation circuit or a time point delayed from the time point of the front edge to a time point at which the reset pulse is generated. The correction set signal forming circuit supplies the correction set signal to the set input terminal of the latch circuit.

Abstract: A latch circuit for retaining and transmitting an input data value is disclosed, along with a memory, and a method for retaining and transmitting data.

Abstract: This invention provides a method for determining leakage current in a CMOS circuit having several devices. It includes the steps of reading a netlist which describes the circuit and includes information on both these devices in the circuit and how these devices are interconnected. Next, an input signal state data file is generated which provides all of the possible input states for the circuit. A determination is made of which devices in the circuit are in an OFF state for each of the input signal states provided. Then the leakage current for each of these devices in the OFF state is computed for each of the input signal states.

Abstract: A logic circuit with a simple configuration and good current efficiency is provided. The logic circuit includes a two-terminal bistable switching element (1) having characteristics which maintain states, a first switching element (25) one end of which is connected to one terminal of the two-terminal bistable switching element (1), a second switching element (29) one end of which is connected to the other terminal of the two-terminal bistable switching element (1) via a resistance element (27), and first and second pulse input terminals (33, 37) respectively connected to the one terminal and the other terminal of the two-terminal bistable switching element (1). A bias voltage is applied across the other end of the first switching element (25) and the other end of the second switching element (27), and a trigger pulse is input from the first and second pulse input terminals (33, 37).

Abstract: An apparatus includes a first selector which selects a test data during a first operation mode, and selects a first input data during a second operation mode, a first latch circuit which latches an output signal of the first selector according to a first clock signal, a second selector which selects one from a second input data and an output signal of the first latch circuit, and a second latch circuit which latches the second input data sent from the second selector according to a second clock signal during the second operation mode, and passes through the output signal of the first latch circuit sent from the second selector during the first operation mode.

Abstract: A sampling circuit for use in a semiconductor device, includes a first sampling unit configured to sample a data signal in synchronism with a reference clock signal and output a first output signal, a second sampling unit configured to sample a delayed data signal in synchronism with the reference clock signal and output a second output signal, and an output unit configured to combine the first and second output signals and output a sampling data signal.

Abstract: A command control circuit of a semiconductor integrated device includes a plurality of latches sequentially connected and receiving a command signal, and a plurality of selection switches configured to pass or to interrupt the command signal inputted to each one of the plurality of latches.

Abstract: Flip-flop circuits including a dynamic input unit and a control clock generator are provided. The dynamic input unit precharges an evaluation node to a power supply voltage in a first phase of a clock signal, selectively discharges the evaluation node based on input data in a second phase of the clock signal, and compensates for voltage drop of the evaluation node in response to a first control clock signal. The control clock generator generates the first control clock signal and a second control clock signal based on at least the clock signal.

Abstract: A latch circuit includes a feed-forward circuit, a keeper circuit, and a feed-back circuit. The feed-forward circuit includes a first-inverting-stage with a first input and a first output, wherein the first-inverting-stage comprises a first clocked device, and a second-inverting-stage with a second input and a second output, wherein the second-inverting-stage comprises a second clocked device, and a keeper circuit. The first output is operatively connected to the second input. The keeper circuit is operatively connected to the first output, and the keeper circuit is driven from the second output. The feed-back circuit includes a third-inverting-stage with a third input and a third output, wherein the third input is operatively connected to the second output, and a fourth-inverting-stage with a fourth input and a fourth output. The fourth input is operatively connected to the third output. The fourth output is connected to the third input to form a storage node.

Abstract: Example embodiments relate to an electronic circuit, for example, a flip-flop circuit, a pipeline circuit including the flip-flop circuit and a method for operating the flip-flop circuit. A flip-flop circuit may include a precharge transistor configured to precharge an internal node to a first power supply voltage in response to a clock signal, a first pull-down unit configured to pull down a voltage of the internal node to a second power supply voltage, a pull-up transistor configured to pull up a voltage of an output node to the first power supply voltage in response to the voltage of the internal node, and a second pull-down unit configured to pull down the voltage of the output node to the second power supply voltage. The pipeline circuit may include a pulse generating circuit, a first flip-flop group, a combination logic circuit, and a second flip-flop group.

Abstract: A system includes an input device, an output device, a mechanical chassis, a printed circuit board, and a semiconductor device. The semiconductor device includes a mechanical package, and a semiconductor die. The semiconductor die includes a semiconductor layer, a plurality of metal layers, a clock distribution network that distributes a clock signal within the die, and an economy precision pulse generating circuit. The economy precision pulse generating circuit includes a pre-charge circuit, a gate-to-the-partial-jam-latch-keeper circuit, a partial-jam-latch-keeper circuit, and a pull-down-against-the-up-keeper circuit. A source clock signal is derived from the clock signal. The source clock signal is provided to a first input of a logical AND circuit, the pre-charge circuit, and the gate-to-the-partial-jam-latch-keeper circuit. A common storage node is connected to a second input of the logical AND circuit. The logical AND circuit outputs an output pulse.

Abstract: A clock signal is received at a clock node of a latch module, and a data signal is received at a data node of the latch module. The data signal including information to be latched at a first latch of the latch module and at a second latch of the latch module. A first representation of the data signal to a first data node of the first latch is delayed relative to a second representation of the data signal to a corresponding first data node of the second latch to obtain a first timing requirement between the data signal and the clock signal relative to the first latch that is substantially different than a second timing requirement. An error signal is generated in response to different data being latched at the first latch than at the second latch.

Abstract: An on-chip logic cell timing characterization circuit is provided. Also provided are a method of conducting setup/hold characterization on a sequential cell and a method of characterizing propagation delay on a logic cell. A sequential cell on which setup/hold time is to be characterized is formed in duplicate with one close to the other. A first clock signal is sampled at a transition of a second clock signal on one sequential cell, and a setup time is determined by a state transition in the output signal of the first sequential. The second clock signal is sampled at a transition of the first clock signal on the other sequential cell, and a hold time is determined by a state transition in the output signal of the second sequential cell.

Abstract: An apparatus for an event tolerant circuit including a latch. The event tolerant circuit may maintain correct data values even after the occurrence of an event such as a soft error. The event tolerant circuit may introduce a delay in a feedback loop, thereby passing the glitch value to an element in the feedback loop at different times, thus preventing the propagation of the glitch through the event tolerant circuit.

Abstract: A flop circuit comprises a precharge circuit for precharging a first node in response to an occurrence of a first phase of a timing signal, and a discharge circuit for conditionally discharging the first node in response to an occurrence of a second phase of the timing signal depending upon a data input signal. The flop circuit further comprises a voltage retention circuit, such as a latch, configured to store a retained logic value that depends upon a logic value present at the first node during at least a portion of the second phase of the timing signal, and an output circuit configured to generate an output signal that depends upon the data input signal. The output circuit may be configured to drive the output signal in a first logic state when the first node is discharged regardless of the retained logic value, and may be configured to drive the output signal in a logic state that depends upon the retained logic value when the first node is charged.

Abstract: In a logical element (100), supporting portions (105, 106), and a beam (107) supported by them at two ends are formed. The beam (107) has a back side surface spaced apart from the top side surface of a substrate (101), creating a space between the facing surfaces of the beam (107) and substrate (101). An excitation electrode (108) is formed on one supporting portion (105), whereas an oscillation detecting electrode (110) is formed on the other supporting portion (106).

Abstract: A 1/n-rate decision feedback equalizer (DFE) and method include a plurality of branches. Each branch includes a summer circuit configured to add a feedback signal to a received input, and a latch configured to receive an output of the summer circuit in accordance with a clock signal. A feedback circuit includes a multiplexer configured to receive as input, an output of each branch, the multiplexer having a clocked select input and configured to multiplex the output of each branch to assemble a full rate bit sequence, and a filter configured to provide cancellation of intersymbol interference (ISI) from the received input to be provided to the summer circuit of each branch.

Abstract: A shift register capable of supplying only a necessary clock signal to a necessary unit register with simple constitution. A semiconductor device is provided with a shift register in which a plurality of stages of unit registers is connected, in which the unit register comprises a flip-flop circuit, a first switch and a second switch, a first clock signal line is electrically connected to the flip-flop circuit through the first switch, a second clock signal line is electrically connected to the flip-flop circuit through the second switch, the first switch is controlled to be on/off by an output signal from the flip-flop circuit, and the second switch is controlled to be on/off by an input signal to the flip-flop circuit.

Abstract: A system for storing state values during standby mode operation comprises a master flip flop that receives and stores state information during active mode operation and an associated slave flip flop that receives and stores state information during active mode and standby mode operation. The system further comprises a standby mode control circuit to control the state of the master and slave flip flops during active and standby mode operation based on at least two control signals. A first transfer gate determines the current flow to and from the master flip flop based on the output of the standby mode control circuit. Similarly, a second transfer gate determines current flow to and from the slave flip flop based on the output of the standby mode control circuit. A first power supply powers the master flip flop during active mode operation.

Abstract: The disclosed invention is intended to decrease the power consumption of a pulse latch circuit. A pulse latch circuit that operates in sync with a pulsed clock signal, including a first operation mode in which shifting test pattern scan data is performed and a second operation mode in which shifting the test pattern scan data is not performed, comprises the following circuits: a first latch circuit that is able to latch input data in sync with the clock signal; a second latch circuit that is connected to the first latch circuit and is able to latch the test pattern scan data to be shifted in sync with the clock signal; and a control circuit that stops supply of the clock signal to the second latch circuit during the second operation mode. By thus stopping the supply of the clock signal to the second latch circuit, decrease the power consumption is achieved.

Abstract: A clocked D-type Flip-Flop circuit has a transmission gate to admit an input data and to provide an intermediate output to a clock-controlled inverter based on the clock signals. The clock-controlled inverter is used as a latch for latching the output signal from the transmission gate and releases the latched signal by the same clock signals to an output inverter. The output of the output inverter is the Q terminal of the Flip-Flop circuit. Another output inverter is used to invert the signal from the Q terminal into a complementary output signal. In one of the embodiments of the present invention, another transmission gate is used to condition the complementary output signal.

Abstract: A state machine for generating signals configured for generating different signals according to the current state of the machine. The state machine is configured to change state both as a function of an internal timer and as a function of signals representative of events external to the state machine.

Abstract: The present invention includes a family of level converting flip-flops that accepts data and clock inputs at a lower voltage level while producing data outputs at a higher voltage level. These flip-flops enable fine-grained dual supply voltage techniques such as low-swing clocking (distributing the clock signal at a lower voltage level) and clustered voltage scaling (CVS). The level conversion is accomplished in a very efficient manner by sharing the positive feedbacks inside a flip-flop for both storage and level conversion. Additionally, the presented flip-flops are contention-free and non-ratioed, thus having reduced timing and power overheads due to the level conversion function.

Abstract: An input circuit comprises a buffer enable signal generating circuit for generating a buffer enable signal having an predetermined enable period in response to an external command, and a buffer circuit for buffering and outputting the external command and an external address signal in response to the buffer enable signal.

Abstract: A double-triggered logic circuit is a composite circuitry consisting of a plurality of PMOS, NMOS, inverters and a signal line. It includes an AND logic circuit and a XNOR logic circuit to generate an adjustable pulse mode to solve the problem of threshold voltage loss.

Abstract: An apparatus is disclosed that includes first and second circuits coupled together via a bus, an input pin configured to receive an analog input signal, a digital-to-analog (DAC) convertor configured to convert a multibit reference signal into an analog reference signal, a comparator circuit coupled to the bus, an output of the DAC and to the input pin. The comparator circuit is configured to receive the analog reference signal from the DAC and the analog input signal, and configured to generate a first digital signal set to a first state if the analog reference signal is greater in magnitude than the analog input signal, or set to a second state if analog reference signal is lower in magnitude than the analog input signal. The comparator circuit is also configured to transmit the first digital signal to the first circuit via the bus. The first circuit in turn is configured to receive the first digital signal.

Abstract: A latch of an integrated circuit is able to retain data at the latch when the integrated circuit is in a low-power mode. The latch retains data at a retention stage in response to assertion of an isolation signal. In response to a reference voltage supplied to the latch being restored to a normal operating voltage, indicating that the integrated circuit has transitioned from the low-power mode to a normal mode, a data restoration circuit provides the retained data at the output of the latch prior to negation of the isolation signal. This reduces the likelihood that a delay in negation of the isolation signal will result in the latch output providing incorrect data, thereby reducing the likelihood of the latch output causing errors in downstream elements of the integrated circuit.

Abstract: Various systems and methods for comparing signals are disclosed herein. For example, some embodiments of the present invention provide comparator circuits with a preamplifier circuit, a latch circuit and a current re-use circuit. The current re-use circuit applies a current to the preamplifier circuit during a transparent phase, and applies a similar current to the latch circuit during a latch phase.

Abstract: A frequency divider includes a first latch and a second latch. The first latch is configured to receive a clock signal. The first latch is cross-coupled to the second latch. The second latch includes a circuit configured as a low-pass filter. The second latch further includes a differential pair of transistors. Each of the transistors include a drain, a source and a gate. The gates of the at least two transistors configured to receive a signal generated by the first latch. Additionally, the gates of the at least two other transistors are coupled to a control signal for determining a low-pass characteristic of the second latch.

Abstract: A method and Dual Interlocked Storage Cell (DICE) latch for implementing enhanced testability, and a design structure on which the subject DICE latch circuit resides are provided. DICE latch includes an L1 latch and an L2 latch are coupled to the L1 latch. Each L1 latch and each L2 latch includes redundant latch structures. A separate output is provided with the redundant L2 latch. The DICE latch includes a Redundant Test Latch Enable (RTLE) input. Each L1 latch and each L2 latch includes a path selector control in the redundant latch structures controlled by the RTLE input providing each of the redundant latch structures in a scan path during a test mode.

Abstract: A method and a Dual Interlocked Storage Cell (DICE) latch implementing enhanced testability includes an L1 latch and an L2 latch coupled to the L1 latch. Each L1 latch and each L2 latch includes redundant latch structures. A separate output is provided with the redundant L2 latch. The DICE latch includes a Redundant Test Latch Enable (RTLE) input. Each L1 latch and each L2 latch includes a path selector control in the redundant latch structures controlled by the RTLE input providing each of the redundant latch structures in a scan path during a test mode.

Abstract: An arbiter module receives two or more closely occurring asynchronous requests and provides an output with a low metastability failure probability. The arbiter module includes a request resolving module that receives multiple asynchronous requests for providing a final output. The request resolving module includes one or more arbiter stages cascaded with each other and operatively coupled with logic units.

Abstract: A latch circuit (1) comprising a first input device (10a) in a first branch (4a) and a second input device (10b) in a second branch (4b). The latch circuit comprises a first estimator unit (40a) adapted to generate a first estimate of a current generated by the first input device (10a) and a second estimator unit (40b) adapted to generate a second estimate of a current generated by the second input device (10b). The latch circuit further comprises a control-voltage unit (50) operatively connected to the first and the second estimator unit (40a, 40b). The control-voltage unit is adapted to generate a control voltage based on a sum of the first estimate and the second estimate. Further, the latch circuit (1) comprises a first and a second voltage-controlled current unit (30a, 30b) adapted to generate currents at least based on the control voltage. The first voltage-controlled current unit (30a) is operatively connected to the first branch (4a).

Abstract: A latch is provided that includes a first inverter, a second inverter, a first latch circuit and a second latch circuit. The first inverter to receive the first clock signal from an input port and to provide a clock signal. The second inverter to receive the first clock signal from the input port and to provide a clock signal. The first latch circuit is to store data and to receive a clock signal from the second inverter. The second latch circuit is further to store data and to receive a clock signal from the first inverter.

Abstract: Some embodiments include a device having storage node and a latch circuit coupled to the storage node to latch data provided to the storage node during one of a first mode and a second mode of the device. The latch circuit includes a first transistor, a second transistor, and a third transistor coupled between a first voltage node and a second voltage node. The third transistor is configured to selectively turn on and off in the first and second modes. Other embodiments are described.

Abstract: A flip-flop circuit arrangement having a total of four differential amplifiers (1, 2, 3, 4), which are connected to one another to produce a D flip-flop, is specified. According to the suggested principle, the two shared emitter nodes (E1, E2) of the differential amplifiers (1, 2, 3, 4) are connected via a switch pair (S1, S2) to supply potential and are activated by a differential input clock signal at a control input (CN, CP). The present flip-flop circuit is operable using especially low supply voltage (VCC) and is preferably suitable for constructing frequency dividers or shift registers.

Abstract: A frequency synthesis phase-locked loop architecture using a regenerative sampling latch is described. The frequency divider typically employed in the feedback path of a frequency synthesis phase-locked loop is replaced by a regenerative sampling latch with a binary output. The regenerative sampling latch subsamples the frequency synthesizer output to produce a low-frequency aliased signal that can be processed further or directly used to lock the phase-locked loop. This architecture is referred to as an alias-locked loop. The relaxed constraints on the regenerative sampling latch make it possible to create high-speed frequency synthesizer phase-locked loops without the suffering the limitations imposed by traditional dividers connected directly to the oscillator output.

Abstract: By adjusting a register's capturing clock edge timing so that the register captures data when the data returns to a correct state, the register may be protected against DSET upsets. If a data glitch occurs near the clock edge, the valid time at the register output is increased (CLK to Q). This valid time increase occurs when the presence of a DSET transient is detected near the clock edge.

Abstract: A circuit has a plurality of functional circuits (100a-f), each with multiphase control inputs. A control circuit drives the inputs for each phase in parallel. The control circuit (120a-c) comprises a chain of one-shot circuits (120a-c), each comprising a bi-stable circuit (121). The bi-stable circuit (121) of a first one-shot circuit in the chain has a set input coupled to the basic control signal input (126), the bi-stable circuits (121) of a remaining or each remaining one-shot circuit (120a-c) in the chain have a set input output of its predecessor in the chain. Each bi-stable circuit (121) has an output coupled to a respective one of the multiphase control outputs (14a-c) and a reset input coupled to the respective one of the multiphase control outputs (14a-c). Loading of the multiphase control outputs (14a-c) by the functional circuits results in a delay of the reset.

Abstract: A multichip transceiver operates as part of a multiple-input multiple-output communication system. First receiver circuitry on a first integrated circuit processes radio-frequency (RF) signals received from a first signal source, and second receiver circuitry on a second integrated circuit processes RF signals received from a second signal source. Clock-signal generating circuitry provides clock signals through phase-matched paths to the first and second receiver circuitry.

Abstract: A system and method for reducing power consumption within a flip-flop circuit on a semiconductor chip. A gated input clock signal is received by a slave latch. The gated input clock is derived from an ungated input clock signal and a clock gating condition. The clock gating condition determines when an input data signal of the flip-flop and the stored internal state of the slave latch have the same logic value, such as only a logic low value. If they have the same value, toggling of the ungated input clock signal is not received by the slave latch, signal switching of internal nodes of the slave latch is reduced, and power consumption is reduced.

Abstract: Configurable time-borrowing flip-flops may be based on configurable pulse generation circuitry and pulse latches. The circuitry may use a self-timed architecture that controls the width of clock pulses that are generated so that the pulse latches that are controlled by the clock pulses exhibit a reduced risk of race through conditions. Latch circuitry may be provided that is based on a pulse latch and an additional latch connected in series with the pulse latch. In situations in which there is a potential for race through conditions on an integrated circuit, the additional latch may be switched into use to convert the latch circuitry into an edge-triggered flip flop. Clock trees may be provide with configurable shorting structures that help to reduce clock skew. Low-contention clock drivers may drive signals onto the clock tree paths.

Abstract: A latch circuit includes: four or more gates; three input terminals and one or two output terminals which are connected to at least one of the four or more gates; a feedback circuit in which respective input terminals of the four or more gates are connected to output terminals of at least another two of the four gates; and a data inverting gate which, when all data input into the three input terminals is the same, outputs inverted data of the data from the output terminals, and when all the data input into the three input terminals is not the same, retains previous data.

Abstract: A flip-flop for transmitting a scan input and data for scan-testing a semiconductor circuit is provided. The flip-flop includes a first pulse signal generator which generates a first pulse signal in response to a scan enable signal and an inversed scan input signal. A second pulse signal generator generates a second pulse signal in response to the scan enable signal and a scan input signal. A signal transmitter receives a data signal and transmits the data signal to a first node in response to either one of the first and second pulse signals. A signal latch unit receives the data signal transmitted to the first node, and latches and outputs the data signal in response to another one of the first and second pulse signals.

Abstract: A flip-flop is provided for minimizing an input-output (D-Q) delay. The flip-flop includes a pull-up unit that receives a signal from a first node, is connected between a power voltage source and a second node, and pulls-up a voltage of the second node. A pull-down unit receives the signal from the first node, is connected between a ground voltage source and the second node, and pulls-down the voltage of the second node. A latch unit is connected to the second node and latches and outputs a signal transferred to the second node. The pull-up unit pulls-up the second node in response to one of a clock signal and a pulse signal, and the pull-down unit pulls-down the second node in response to the other one of the clock signal and the pulse signal.