Abstract: The present invention provides a novel wiring method for LR-DIMM of VLP type that conforms to LR-DIMM technology. The LR-DIMM comprises a plurality of DRAMs mounted on a board, two connectors mounted on the board for receiving data, and a buffer device mounted on the board for redriving data applied to the two connectors to supply the data to the plurality of DRAMs. The buffer device is located near the center of the board on which the two connectors are arranged at both ends thereof, and supplies data from each connector to DRAMs arranged on the opposite side to the connector.

Abstract: Electronic apparatus, systems, and methods may operate structures to access a portion of a row of a memory array without accessing the entire row. Additional apparatus, systems, and methods are disclosed.

Abstract: In a semiconductor memory device and an internal data transmission method thereof, the device includes a memory controller, a pair of data lines, and a plurality of memory banks. During an internal data transmission operation, the memory controller externally receives and stores a source address and a target address in response to an externally applied command and outputs an internal control signal and an internal address signal using the source address and the target address. The internal control signal includes an internal write signal and an internal read signal. Transmission data is transmitted on the pair of data lines during the internal data transmission operation. The plurality of memory banks read the transmission data stored in a region corresponding to the source address in response to the internal read signal, transmit the transmission data on the pair of data lines, and write the transmission data transmitted on the pair of data lines in response to the internal write signal.

Abstract: A dynamic random access memory (DRAM) having DRAM cells coupled to wordlines and bitlines. In a self-refresh mode, the cells coupled with the even numbered rows retain main data previously stored therein and the assistant data, which is logically opposite to the main data, is overwritten into the cells coupled with the wordlines of the odd numbered rows. When the DRAM enters the self-refresh mode, a starting refresh address for the self-refresh mode is detected. If the detected starting refresh address does not match with a predetermined correct address set for the self-refresh operation mode, a dummy refresh cycle will be established in an entry-burst self-refresh period. During the dummy refresh cycle, a dummy refresh command is added to increment an internal row address counter that provides row addresses for self-refreshing the cells of the selected wordlines within the cell array.

Abstract: A method for designing a read-only memory (ROM), and related device, includes partitioning a dataset into two or more sub-datasets that each have the same address space, but are of a smaller bit-width than the original dataset. The sub-datasets are row collapsed, and then respective memory cells for the sub-datasets are provided. The output of the memory cells provides the output of the ROM. Each memory cell includes a decoder that maps addresses to word lines based on mapping information obtained during row collapsing, and a logic array driven by the decoder that encodes the data words of the sub-dataset.

Abstract: In one embodiment of the invention, a memory integrated circuit is provided including an address decoder to selectively access memory cells within a memory array; a mode register with bit storage circuits to store an enable bit and at least one sub-channel select bit; and control logic. The control logic is coupled to a plurality of address signal lines, the address decoder, and the mode register. In response to the enable bit and the at least one sub-channel select bit, the control logic selects one or more of the address signal lines to capture independent address information to support independent sub-channel memory accesses into the memory array. The control logic couples the independent address information into the address decoder.

Abstract: A memory device includes: a plurality of word lines and bit lines specifying addresses to be accessed; and a plurality of memory cells of consecutive addresses arranged to correspond to each of the word lines. The plurality of memory cells of the consecutive addresses are accessible in parallel by the plurality of bit lines each corresponding to one of the memory cells. Among the plurality of word lines, a first word line and a second word line that specifies an address next to that of the first word line have an overlapping address range, and a first memory cell connected to the first word line and a second memory cell connected to the second word line are assigned in dual fashion to a same address.

Abstract: A system memory includes a memory hub controller, a memory module accessible by the memory hub controller, and an expansion module having a processor circuit coupled to the memory module and also having access to the memory module. The memory hub controller is coupled to the memory hub through a first portion of a memory bus on which the memory requests from the memory hub controller and memory responses from the memory hub are coupled. A second portion of the memory bus couples the memory hub to the processor circuit and is used to couple memory requests from the processor circuit and memory responses provided by the memory hub to the processor circuit.

Abstract: A semiconductor memory device includes a row control circuit block and a column control circuit block each performing an access control over a memory cell array, a data I/O circuit block transmitting and receiving data to and from the memory cell array, and a control circuit changing at least a part of the row control circuit block, the column control circuit block, and the data I/O circuit block from a standby state into an active state in response to a setting of a predetermined mode signal to a mode register. According to the present invention, even if it is necessary to turn predetermined circuit blocks into the active state by an operation other than a read or write operation, there is no need to always set these circuit blocks into the active state.

Abstract: A variable resistive memory device includes memory sectors, memory cells in each of the memory sectors, sub-wordlines including a first in signal communication with at least a first pair of the memory cells in a first sector and a second in signal communication with at least a second pair of the memory cells in a second sector, local bitlines where each is in signal communication a memory cell, a local bitline selecting signal generator in signal communication with local bitline selecting signal paths, a first local bitline selecting signal path in signal communication with a first pair of the local bitlines, and a second local bitline selecting signal path in signal communication with a second pair of the plurality of local bitlines, where a first of the first pair of local bitlines is in signal communication with a first of the first pair of the memory cells in the first sector and a second of the first pair of local bitlines is in signal communication with a second of the second pair of the memory cells in

Abstract: A memory device includes a configurable array of memory cells. A number of array banks is configured based upon data stored in a mode register or decoded by logic circuitry. The memory device remains a full capacity memory, regardless of the number of array banks. Memory address decoding circuitry is adjusted to route address signals to or from a bank address decoder based upon the number of array banks selected.

Abstract: The present invention provides a circuit for controlling a column-command address corresponding to a specific column of a DRAM array. The circuit includes a control unit and a FIFO register. The control unit determines a period number, and synchronously produces an input pointer and an output pointer, wherein the output pointer is lagged behind the input pointer by the period number. The FIFO register utilizes the input pointer to store the column-command address, and utilizes the output pointer to output the column-command address.

Abstract: A semiconductor memory, such as an SRAM, is described that accommodates smaller read/write accesses in one mode of operation and larger read/write accesses in a second mode of operation, wherein power is conserved during the smaller accesses. Methods of using such a semiconductor memory are also described.

Abstract: An exemplary aspect of an embodiment of the present invention is a semiconductor device including a plurality of test elements formed in an array on a semiconductor substrate, an address signal generating portion that generates an address signal corresponding to each of the test elements, and a digital-to-analog converter that converts the address signal into an analog signal and outputs the converted analog signal. The present invention enables to recognize which DUT is being measured.

Abstract: Disclosed is a logic circuit includes a first NAND gate that receives a first pulse signal and a first selection signal, a first inverter gate that inverts an output signal of the first NAND gate to output a resulting signal, a second NAND gate that receives a second pulse signal and the first selection signal, a second inverter gate that inverts an output signal of the second NAND gate, a first PMOS transistor with a drain terminal connected to an output of the first NAND gate, a gate terminal connected to an output of the second NAND gate and a source terminal connected to a power supply voltage, and a first NMOS transistor with a drain terminal connected to an output of the first inverter gate, a gate terminal connected to an output of the second inverter gate and a source terminal connected to a ground potential.

Abstract: A phase change memory capable of highly reliable operations is provided. A semiconductor device has a memory array having a structure in which memory cells are stacked including memory layers using a chalcogenide material and diodes, and initialization conditions and write conditions are changed according to the layer in which a selected memory cell is positioned. The initialization conditions and write conditions (herein, reset conditions) are changed according to the operation by selecting a current mirror circuit according to the operation and by a control mechanism of a reset current in a voltage select circuit and the current mirror circuit.

Abstract: A ROM comprises several bit output lines and X address decode lines, and stores a data set. Each address decode line stores a unique data word. Addresses in the data set that have the same data word are mapped by the decoder to the same address decode line. Each address decode line is electrically connected to a bit output line as determined by the data set. An initial design of the ROM uses N connecting devices to respectively electrically connect N of the address decode lines to a bit output line. If N exceeds X/2, then an optimization process is performed. The optimization process involves electrically disconnecting each address decode line that was connected to the bit output line, and electrically connecting each address decode line that was not connected to the bit output line. The output of the bit output line is then run through a logical inverter to provide the correct output data bit.

Abstract: The present invention presents techniques for the linking of physical blocks of a non-volatile memory into composite logical structures or “metablocks”. After determining an initial linking of good physical blocks into metablocks, a record of the linking is maintained in the non-volatile memory where it can be readily accessed when needed. In one set of embodiments, the initially linking is deterministically formed according to an algorithm and can be optimized according to the pattern of any bad blocks in the memory. As additional bad blocks arise, the linking is updated using by replacing the bad blocks in a linking with good blocks, preferably in the same sub-array of the memory as the block that they are replacing.

Abstract: An integrated circuit includes memory segments, each having at least one memory cell configurable in first and second states to store data, and a controller that controls programming and erasing of the memory segments. The controller maps external memory addresses of write data to internal memory addresses of erased memory segments with no memory cells in the first state such that erased memory segments are programmed with write data. When a write access occurs for an external memory address previously mapped to an internal memory address of a programmed memory segment with at least one memory cell in the first state, the controller remaps the external memory address to another internal memory address of an erased memory segment. The controller identifies programmed memory segments to be erased and controls selective erasure of the identified programmed memory segments, such as programmed memory segments no longer mapped to an external memory address.

Abstract: A memory apparatus includes at least two memory devices, each memory device including at least one memory bank. A method of operating the memory apparatus includes receiving a row activation command generated by a memory controller, wherein the row activation command includes a bank address. The method also includes activating a word line in a bank of one of the memory devices based on the row activation command, wherein the bank address is used to select the memory device.

Abstract: Embodiments of the invention are generally directed to systems, methods, and apparatuses for a common memory device for variable device width and scalable pre-fetch and page size. In some embodiments, a common memory device (such as a DRAM) can operate in any of a number of modes including, for example, a x4 mode, a x8 mode, and a x16 mode. The page size provided by the DRAM may vary depending on the mode of the DRAM. In some embodiments, the amount of data pre-fetched by the DRAM also varies depending on the mode of the DRAM.

Abstract: A memory device includes: a memory cell array which stores two-dimensionally arranged data in a plurality of memory unit regions selected by an address; an internal address control unit which generates an internal address which selects a memory unit region according to an external address; and a decoder which decodes the internal address and selects a memory unit region. The plurality of memory unit regions store data arranged in a first direction from among two-dimensionally arranged data according to a least-significant bit group of the internal address and store data arranged in a second direction from among the two-dimensionally arranged data according to a most-significant bit group of the address. The internal address control unit successively generates an internal address corresponding to the scan direction according to a scan direction control signal which controls a plurality of scan directions including at least an oblique direction of the two-dimensionally arranged data.

Abstract: A memory integrated circuit has control circuitry that accesses memory cells of the memory integrated circuit. The control circuitry is responsive to commands including a first command and a second command. The first command specifies a high order set of address bits. The second command specifies a low order set of address bits. The high order set of address bits and the low order set of address bits constitute a complete access address of the memory integrated circuit. The first command and the second command have different in command codes.

Abstract: The number of fusible links and other circuit components required to provide memory cell redundancy are reduced by sharing physical memory locations among address banks that store memory addresses. Non-trial and error algorithms and techniques determine the number of addresses and the number of identical least significant bit (LSB) values that can share the same physical memory location. By sharing physical locations for identical LSB values, circuit hardware on a memory device (including fusible links and compare circuitry) is reduced. Thus, less die area is needed to provide the same degree of redundancy.

Abstract: A semiconductor memory storage device is disclosed.

Abstract: There are provided are a plurality of memory mats, a sub-word driver that accesses a normal memory cell irrespective of whether a row address to which access is requested is a defective address, a sub-word driver that accesses a redundant memory cell belonging to a memory mat different from the normal memory cell indicated by the row address, when the row address is a defective address. According to the present invention, the normal memory cell and a redundant memory cell belong to memory mats different to each other, and thus the normal memory cell can be accessed concurrently with determining operation of the repair determining circuit.

Abstract: A semiconductor memory device capable of determining an operation mode by using states of data pins, and an operation mode determining method for the same are disclosed. The semiconductor memory device includes at least one MRS input pad, at least one data input pad, and an operation mode determining circuit. The operation mode determining circuit generates an operation mode determining signal, when an MRS command input through the MRS input pad corresponds to a predetermined MRS command and data signals input through the data input pad or pads include a predetermined combination. Accordingly, the efficiency in the manufacturing and producing processes may be improved by determining the operation mode of the semiconductor memory device in a module assembly process.

Abstract: A decoder, a memory system, and a physical position converting method thereof may detect whether an address count of an input address is equal to or greater than a predetermined value. A physical position of a semiconductor memory device corresponding to the input address may be converted if the address count is equal to or greater than the predetermined value.

Abstract: A semiconductor device includes plural core chips and an interface chip that controls the plural core chips. Each of the plural core chips includes a layer address generating circuit that generates a second chip address by incrementing a value of a first chip address and a layer address comparing circuit that compares a third chip address supplied from the interface chip and the second chip address, and activates a chip selection signal when the third chip address and the second chip address are matched with each other. When a non-used chip signal is in an inactivated state, the layer address generating circuit supplies the second chip address to another core chip, and when the non-used chip signal is in an activated state, the layer address generating circuit supplies the first chip address to another core chip without a change.

Abstract: A data storage system includes a plurality of memory devices for storing data. The plurality of memory devices is classified into a plurality of groups of memory devices. A control circuit is adapted to provide concurrent memory access operations to the plurality of memory devices. Each of a plurality of data channels is configured to provide a data path between the control circuit and one of the groups of memory devices. A plurality of switches is configured to connect and disconnect one of the memory devices in a select one of the groups of memory devices to one of the plurality of data channels and concurrently connect and disconnect another of the memory devices in the select group of memory devices to a different one of the plurality of data channels.

Abstract: A NAND interface having a reduced pin count configuration, in which all command and address functions and operations of the NAND are provided serially on a single serial command and address pin adapted to receive all commands and addresses, and data communication is performed on a number of data communication pins.

Abstract: To provided a relief-address generating circuit that generates relief address information based on plural data bits supplied in time sequence via a first terminal from outside and a programming circuit that writes into any one of fuse sets the relief address information generated by the relief-address generating circuit. With this configuration, repetition of a programming operation by the total number of the fuse sets at the maximum completes a series of write processing on relief address information. Therefore, it is possible to reduce the time required for a series of write processing on relief address information.

Abstract: A method of performing a write-through operation with a memory circuit having a write enable line, a write address line, a data in line, a read address line, a data out line, a bit array, a comparator, and a mux. A write address is received on the write address line, a read address is received on the read address line, data is received on the data in line. The comparator determines as a first condition whether the write address is identical to the read address, and determines as a second condition whether the write enable line is enabled. When both the first condition and the second condition are met, the comparator signals the mux to directly output the data receiving on the data in line on the data out line without writing the data to the bit array. In this manner, the memory circuit checks to determine whether a write-through operation is called for.

Abstract: A semiconductor storage device, in which successive reading and successive writing of data having a predetermined length from and to a memory cell specified by a certain address are performed, includes a plurality of memory cells, address input terminals through which the address is input, data output terminals through which read data having the predetermined length is output, and data input terminals through which write data having the predetermine length is input. Part of the address input terminals are also used as the data output terminals. In this way, the operation of successive reading and successive writing performed in succession at the same address can be made faster without increasing the number of terminals.

Abstract: Methods and memory devices for repairing memory cells are discloses, such as a memory device that includes a main array having a plurality of sections of memory cells. One such main array includes a plurality of sets of input/output lines, each of which may be coupled to a respective plurality of memory cells in each section. One such memory device also includes a redundant section of memory cells, corresponding in number to the number of memory cells in each of the sections of the main array. An addressing circuit may contain a record of, for example, sections that have been determined to be defective. The addressing circuit may receive an address and compare the received address with the record of defective sections. In the event of a match, the addressing circuit may redirect an access to memory cells corresponding to the received address to memory cells in the redundant section.

Abstract: A system memory includes a memory hub controller, a memory module accessible by the memory hub controller, and an expansion module having a processor circuit coupled to the memory module and also having access to the memory module. The memory hub controller is coupled to the memory hub through a first portion of a memory bus on which the memory requests from the memory hub controller and memory responses from the memory hub are coupled. A second portion of the memory bus couples the memory hub to the processor circuit and is used to couple memory requests from the processor circuit and memory responses provided by the memory hub to the processor circuit.

Abstract: A memory manager for a system, a system that includes the memory manager and a method of using thereof are provided. The memory manager manages memory allocations in at least a memory. The memory manger comprises, a first unit configured for receiving a plurality of requests from one or more components of one or more applications of a system. The memory manager also includes a second unit configured for optimizing memory allocations for the plurality of requests.

Abstract: Verifying operation of a data processing system. A first sequence of addressing ranges is generated for multiple requesters. Each addressing range includes a start and an end address and a respective identifying number. A second sequence of verification ranges is generated corresponding the addressing ranges of the first sequence. Each verification range includes a start and an end address and specifies at least one allowed value including each respective identifying number of all of the addressing ranges that overlap the verification range. A respective accessing activity executing on each requestor accesses each addressing range in the first sequence. The accesses include writing the respective identifying number of the addressing range to at least one address of the addressing range. A verification activity executing on a requestor reads a value from each address of each verification range of the second sequence and outputs an error message in response to the value not matching the allowed value.

Abstract: In one embodiment, a memory system is disclosed. The memory system has at least one memory chip having an address and data interface coupled to an internal address and data bus, and a memory controller and interface chip also having a an address and data interface coupled to the address and data interface of the at least one memory chip via an internal address and data bus. The at least one memory chip, the memory controller and interface chip and the internal address and data bus are disposed within a common chip package. The memory controller and interface chip has an external interface configured to be coupled to a standard memory bus via external contacts of the common chip package.

Abstract: When a free physical block where data is to be written is searched for, a search process for searching for a pair of free physical blocks is first executed using a free physical block search table. Detection of a free non-pair good block is executed only when a pair of free physical block is not detected in the search process using the free physical block search table. When there is a free physical block, two-plane write is executed. When there is no pair of free physical blocks, data is written in an adequately combined non-pair good blocks.

Abstract: A graphics processing unit can queue a large number of texture requests to balance out the variability of texture requests without the need for a large texture request buffer. A dedicated texture request buffer queues the relatively small texture commands and parameters. Additionally, for each queued texture command, an associated set of texture arguments, which are typically much larger than the texture command, are stored in a general purpose register. The texture unit retrieves texture commands from the texture request buffer and then fetches the associated texture arguments from the appropriate general purpose register. The texture arguments may be stored in the general purpose register designated as the destination of the final texture value computed by the texture unit. Because the destination register must be allocated for the final texture value as texture commands are queued, storing the texture arguments in this register does not consume any additional registers.

Abstract: Integrated circuits with memory elements are provided. The memory elements may be arranged in an array. Data lines may be used to load data into the memory elements and may be used to read data from the memory elements. The memory elements may be used to store configuration data on a programmable logic device integrated circuit. Each memory element may have an output that supplies a programmable transistor gate with a static control signal. Data reading circuitry may be coupled to each data line to read data from an addressed memory element on that data line. The data reading circuitry for each data line may include a precharge transistor and an output latch. The output latch may contain cross-coupled inverters. An inwardly-directed inverter in the output latch may have a pull-up transistor that is connected in series with a current source.

Abstract: An apparatus and method for controlling write access to a group of storage elements is provided. Each storage element within the group is identified by an n-bit address, and the total number of storage elements in the group is less than 2n. Write enable circuitry is responsive to an access request specifying an n-bit address to issue a write control signal to the storage element addressed by the access request in the event that the access request is a write access request. The write control signal causes a write to that addressed storage element to occur. The write enable circuitry comprises selective address modification circuitry for outputting as an internal address the unmodified n-bit address if the access request is a write access request, and for outputting as the internal address an n-bit unused address if the access request is not a write access request.

Abstract: Memory devices comprise a plurality of memory cells, each memory cell including a memory element and a selection device. A plurality of first (e.g., row) address lines can be adjacent (e.g., under) a first side of at least some cells of the plurality. A plurality of second (e.g., column) address lines extend across the plurality of row address lines, each column address line being adjacent (e.g., over) a second, opposing side of at least some of the cells. Control circuitry can be configured to selectively apply a read voltage or a write voltage substantially simultaneously to the address lines. Systems including such memory devices and methods of accessing a plurality of cells at least substantially simultaneously are also disclosed.

Abstract: The invention provides methods and apparatus. A NAND flash memory device receives command and address signals at a first frequency and a data signal at a second frequency that is greater than the first frequency.

Abstract: A voltage supply device comprises: a charge pump configured to boost a power voltage and to supply the boosted power voltage to a output line; and a voltage control circuit configured to maintain a voltage level of the output line at a target voltage level; wherein the voltage control circuit comprises a reach-through element including a first region and a second region provided in a well, the reach-through element configured to control the voltage level of the output line, using a reach-through function between the first region and the second region.

Abstract: The semiconductor integrated circuit device includes: a first latch which can hold an output signal of the X decoder and transfer the signal to the word driver in a post stage subsequent to the X decoder; a second latch which can hold an output signal of the Y decoder and transfer the signal to the column multiplexer in the post stage subsequent to the Y decoder; and a third latch which can hold an output signal of the sense amplifier and transfer the signal to the output buffer in the post stage subsequent to the sense amplifier. The structure makes it possible to pipeline-control a series of processes for reading data stored in the non-volatile semiconductor memory, and enables low-latency access even with access requests from CPUs conflicting.

Abstract: The addressing circuit of a semiconductor memory device includes a plurality of register units coupled to an input unit and a plurality of memory cell arrays, wherein the plurality of register units are configured to store inputted data in response to register control signals, and a control unit configured to generate the register control signals, using defect information of respective memory cell arrays, to control whether or not the register units store the inputted.

Abstract: A low-current consumption semiconductor memory device includes a plurality of cell blocks, in which each cell block includes a plurality of cell mats; a plurality of input/output line switches which transmit the plurality of cell blocks to input/output lines; and an input/output line control circuit which receives a block address indicating arbitrary blocks among the plurality of cell blocks and an active command to control a drive of an input/output line switch according to an input level of the block address.

Abstract: A semiconductor memory such as a dynamic RAM having memory mats each divided into a plurality of units or sub-memory mats. Each sub-memory mat comprises: a memory array having sub-word lines and sub-bit lines intersecting orthogonally and dynamic memory cells located in lattice fashion at the intersection points between the intersecting sub-word and sub-bit lines; a sub-word line driver including unit sub-word line driving circuits corresponding to the sub-word lines; a sense amplifier including unit amplifier circuits and column selection switches corresponding to the sub-bit lines; and sub-common I/O lines to which designated sub-bit lines are connected selectively via the column selection switches. The sub-memory mats are arranged in lattice fashion.