Abstract: A circuit arrangement (10) for testing a reset circuit (11) comprises the reset circuit (11) and a changeover switch (14). The reset circuit comprises a voltage input (12) for feeding an input voltage (VDD) and an output (13) for providing a reset signal (POR) as a function of the input voltage (VDD). The changeover switch (14) comprises a first input (15) for feeding a test voltage (VTM), a second input (16) for feeding a supply voltage (VBAT), a control input (17) for changing over between the first and the second input (15, 16) as a function of the test signal (TM), and an output (18) that is coupled to the voltage input (12) of the reset circuit (11).

Abstract: A detector circuit for detecting degradation in the distortion characteristics of a power amplifier based on signals from both ends of a coupled line of a directional coupler. The detector circuit includes a phase shifter/attenuator for phase shifting and attenuating a signal from a coupled terminal of the coupled line, a differential amplifier for outputting difference between an output signal from the phase shifter/attenuator and a signal from the isolated terminal of the coupled line, a wave detector circuit for converting the difference into a DC signal, and a comparing circuit for determining whether the voltage level of the DC signal exceeds a predetermined level. When degradation in the distortion characteristics of the power amplifier arises, the phase shifter/attenuator phase shifts the signal from the coupled terminal and outputs a signal 180° out of phase with the signal from the isolated terminal.

Abstract: Identifying a signal on a printed circuit board (‘PCB’) under test, including a test probe with a radio transmitter and transmitter antenna, the test probe positioned with the transmitter antenna at a test point on the PCB, the test probe transmitting a radio signal; at least two radio receivers, each receiver having a receiver antenna, each receiver antenna positioned at predetermined, separate physical locations with respect to the PCB, the receivers coupled to at least one signal strength meter, each receiver receiving the transmitted radio signal; and a signal-identifying controller connected to the signal strength meter, the signal-identifying controller reading, from the signal strength meter, signal strengths of the transmitted radio signal as received at the radio receivers; determining, in dependence upon the read signal strengths, a test signal identifier; and displaying the test signal identifier.

Abstract: The integrated circuit (10) has an internal power supply domain with a power supply voltage adaptation circuit (14) to adapt the power supply voltage in the power supply domain. Typically, a plurality of such domains is provided wherein the power supply voltage can be adapted independently. During testing an internal power supply voltage is supplied to a temporally integrating analog to digital conversion circuit (16) in the integrating circuit (10). A temporally integrated value of the power supply voltage is measured during a measurement period. Preferably, integrating measurements of a plurality of internal supply voltages are performed in parallel during the same measurement time interval. Preferably a further test is performed by changing over between mutually different supply voltages during a further measurement period. In this way the measured integrated supply voltage can be used to check the speed of the change over between the different voltages.

Abstract: An object is to provide a semiconductor device with a novel structure in which stored data can be held even when power is not supplied, and the number of times of writing is not limited. The semiconductor device is formed using a wide gap semiconductor and includes a potential change circuit which selectively applies a potential either equal to or different from a potential of a bit line to a source line. Thus, power consumption of the semiconductor device can be sufficiently reduced.

Abstract: Tools and methods for creating isolated or localized temperature changes on components in an electric circuit. By isolating temperature changes to individual components or small sets of components, the tools and methods allow greater control over the analysis of interactions within a board. This may allow clearer understanding of the effects of temperature on circuit component behavior. The tools and analysis advances analysis such as failure analysis and design testing.

Abstract: An improved internturn short circuit detection device of transformer via differential voltage comprises a single-phase transformer (TM). The single-phase transformer (TM) comprises a high-voltage coil (K) and a low-voltage coil (N). A voltage transformer (PT) is positioned at the high voltage side of the single-phase transformer (TM). Two branches of a tap (K1) of the high-voltage coil (K) are connected with the input of a first converter (Q?), and a first voltage (U1?) is obtained. The secondary side of the voltage transformer (PT) is connected with the input of a second converter (Q), and a second voltage (U1) is obtained, and the first voltage (U1?) and the second voltage (U1) are compared, and when the voltage difference is above a predetermined primary threshold value, an interturn short circuit failure of the primary side is determined.

Abstract: A detector circuit for detecting degradation in the distortion characteristics of a power amplifier based on signals from both ends of a coupled line of a directional coupler. The detector circuit includes a phase shifter/attenuator for phase shifting and attenuating a signal from a coupled terminal of the coupled line, a differential amplifier for outputting difference between an output signal from the phase shifter/attenuator and a signal from the isolated terminal of the coupled line, a wave detector circuit for converting the difference into a DC signal, and a comparing circuit for determining whether the voltage level of the DC signal exceeds a predetermined level. When degradation in the distortion characteristics of the power amplifier arises, the phase shifter/attenuator phase shifts the signal from the coupled terminal and outputs a signal 180° out of phase with the signal from the isolated terminal.

Abstract: Aspects of the present disclosure provide for a cable tester that tests a cable to determine the cable length. The cable tester can include a clock generator that generates a clock that has clock period that is a multiple of the data symbol period and a signal generator that injects the training signal, which can be synchronous with the clock, into the cable. The cable tester can also include a receiver that samples the returned signal from the cable and adaptively filters the returned signal based on the training signal and a controller that determines the cable length from the adaptive filter tap coefficients.

Abstract: A semiconductor device (1) includes a semiconductor wafer (11) on which a plurality of semiconductor chip forming regions (1A) is formed, a circuit section (12) which is provided within each of the semiconductor chip forming regions (1A) of the semiconductor wafer (11), a control circuit section (14), provided within each of the semiconductor chip forming regions (1A) and connected to the circuit section (12), that controls electric power supplied to the circuit section (12), a power supply line (18) connected to the plurality of control circuit section (14), and a reference power line (17) connected to the plurality of control circuit section (14). In each of the control circuit sections (14), a voltage of electric power supplied from the power supply line (18) is controlled on the basis of a reference voltage from the reference power line (17).

Abstract: A method and apparatus are provided for detecting a fault condition on a power system. By rectifying power system phase voltages to produce a rectified waveform, and filtering the rectified waveform or a representation of the rectified waveform through a finite gain synchronous band pass filter to generate a synchronous band pass filter output waveform that indicates the magnitude of a predefined harmonic frequency component, a fault condition on a power system can be identified.

Abstract: Calibration of a non-contact current sensor provides improved accuracy for measuring current conducted through a conductor such as an AC branch circuit wire. In a calibration mode, a predetermined current is injected through a voltage sensing conductor integrated in the non-contact current sensor. The magnitude of the magnetic field is measured using a sensing element of the non-contact current sensor. Then, when operating in measurement mode, a current conducted in a wire passing through the non-contact current sensor is determined by correcting the output of the non-contact current sensor using the result of the measurement made in the calibration mode. The voltage sensing conductor is used to provide an indication of the magnitude and/or the phase of the electrostatic potential on the wire. The calibration current may be a DC current, and calibration may be performed while the conductor is carrying an AC current.

Abstract: An appliance and a method are intended to monitor a phase line of a section of an electrical energy grid line. The appliance comprises a device for monitoring a parameter of a phase line. The parameter is representative of routine operating conditions of the phase line and has a known propagation speed. The appliance also comprises a device for generating an event detection signal each time the parameter has a value that exceeds a threshold, and for storing a reception time when the detection signal is generated. The appliance also has a device for sending a signal representative of a geographic location of the end of the section and a device for performing a geographic location of the event once two consecutive detection signals are generated from the signal representative of the geographic location, and reception times associated with the two detection signals.

Abstract: Fault detection of electric consumers in motor vehicles including at least one electric consumer switchably arranged between a first electric potential and a second electric potential. The electric consumer is switchably connected both to the first and to the second potential. A first switch is arranged between the first potential and the consumer and a second switch is arranged between the second potential and the consumer. The first and the second switch must be closed at the same time in order to operate the consumer. Fault detection is carried out when the device consuming the electricity is visibly off, in that a third electric potential is tapped at a voltage divider arranged parallel to the second switch. Fault detection is carried out by monitoring the third electric potential and the positions of the first and second switches.

Abstract: An object of the present invention is to provide a method and apparatus for measuring a potential on a surface of a sample using a charged particle beam while restraining a change in the potential on the sample induced by the charged particle beam application, or detecting a compensation value for a change in a condition for the apparatus caused by the sample being electrically charged. In order to achieve the above object, the present invention provides a method and apparatus for applying a voltage to a sample so that a charged particle beam does not reach the sample (hereinafter, this may be referred to as “mirror state”) in a state in which the charged particle beam is applied toward the sample, and detecting information relating to a potential on the sample using signals obtained by that voltage application.

Abstract: A concentrator photovoltaic measuring device includes a platform, an enclosing mask, a converging lens, a concentration unit, a first temperature regulation unit, a second temperature regulation unit, a temperature detection unit, a data transmission unit, and an electricity transmission unit. With its temperature regulation function, the concentrator photovoltaic measuring device simulates the effect of seasonal temperature variation on the energy conversion efficiency of a solar cell, so as to be effective in measuring the energy conversion efficiency of the solar cell in real environment and environment having a specific variable. Also, the concentrator photovoltaic measuring device accommodates a single solar cell, so as to be capable of measuring the single solar cell.

Abstract: The present invention relates to an apparatus for evaluating an internal short circuit of a battery. An object of the invention is to provide an apparatus capable of evaluating whether or not an internal short circuit has occurred in an electrode group in consideration of pressure applied to the electrode group. An internal short circuit evaluation apparatus according to one embodiment of the invention includes at least a pressure member capable of operating independently and applying pressure to at least a predetermined position of the surface of the electrode group, and a short-circuiting member that is pressed into the predetermined position. An internal short circuit evaluation apparatus according to another embodiment of the invention includes a pressure member having an integrated short-circuiting member.

Abstract: A method of estimating the output light flux of a light emitting diode, comprises applying a drive current waveform to the LED over a period of time comprising a testing period. The forward voltage across the LED is monitored during the testing period, and the output light flux is estimated as a function of changes in the forward voltage.

Abstract: It is aimed to provide a probe card test system and a relay driving test method for probe cards which can automatically and continuously perform tests without bringing needle tips into contact with a number of relays mounted on a probe card and by using a device. In a probe card test system for testing a probe card using a tester, the probe card includes a substrate having a first probe and a first relay connected to the first probe, a relay controller for the first relay and a first measurement channel for connecting the first relay and the first probe to the tester are further provided on the substrate. The tester includes a DC power supply, a control board for controlling the relay controller for the first relay, and a first measurement circuit connected to the first measurement channel, the DC power supply and a voltmeter. The first measurement circuit includes a first resistor having a predetermined time constant and a first changeover switch to be connected to the first measurement channel.

Abstract: Some embodiments provide a system that tests a computing system. During operation, the system monitors a temperature of a component in the computing system while running a series of calibrated workloads on the component. Next, the system analyzes a fluctuation of the temperature resulting from the calibrated workloads to determine a thermal performance of the component. The system then uses the determined thermal performance to improve the reliability of the computing system.

Abstract: A device for detecting a fault of at least one street lamp of a plurality of street lamps which are connectable in common to an AC power supply is proposed. The proposed device allows detecting whether a fault has occurred based on obtaining measures representative of the total active and reactive power supplied by the AC power supply to the plurality of street lamps, and detecting variations in these measures. Optionally, also the type of fault can be determined based on detected variations in the power measures.

Abstract: The invention provides a method for evaluating the safety of a battery under an internal short-circuit condition. The battery includes: an electrode group including a positive electrode, a negative electrode, and an insulating layer for electrically insulating the electrodes, which are wound or laminated; an electrolyte; a housing for housing the electrode group and the electrolyte; and a current-collecting terminal for electrically connecting the electrode group and the housing. The method of the invention includes: placing a foreign object at a location inside the electrode group of the battery where the positive electrode and the negative electrode face each other; and pressing the location by the pressure applied by a pressing tool to locally crush the insulating layer between the positive and negative electrodes, thereby causing an internal short-circuit.

Abstract: An adaptor failure tolerance test device includes a first connection module, a second connection module, a teaming control module, and a connection control module. The first connection module includes eight first interfaces configured for connecting to a plurality of respective adaptors of a network server. The second connection module includes eight second interfaces configured for connecting to a switch. The teaming control module includes eight first switches, each of which is connected to a corresponding first interface. The connection control module includes eight second switches and a control unit. Each of the second switches is interposed between a corresponding first switch and a corresponding second interface. The control unit is configured for detecting which first switches are turned on and turning on the second switches corresponding to the first switches which are turned on for a predetermined time period.

Abstract: A stacked semiconductor device includes a first semiconductor device equipped with a first semiconductor chip 14 having a transistor circuit and protection diodes, and a second semiconductor device equipped with a second semiconductor chip 24 having a transistor circuit and protection diodes, and stacked on the first semiconductor device via a connection portion, wherein a power supply line connected to the first and second semiconductor chips is used in common, and a forward ON voltage of the protection diodes of the first semiconductor chip is set higher than a forward ON voltage of the protection diodes of the second semiconductor chip 24. When a connection test is executed, the forward ON voltage of the protection diodes of the first semiconductor chip or the second semiconductor chip is detected and then normal/open is judged.

Abstract: Alignment data from an exposure tool suitable for exposing a plurality of semiconductor wafers are provided, the alignment data including alignment values applied by the exposure tool to respective ones of the plurality of semiconductor wafers at a plurality of measured positions.

Abstract: Systems and methods for radiation-tolerant overcurrent detection are disclosed. In some embodiments, an integrated circuit may include a plurality of overcurrent detectors, each of the plurality of overcurrent detectors configured to detect a candidate overcurrent event. The integrated circuit may also include a voting circuit coupled to the overcurrent detectors, the voting circuit configured to indicate an overcurrent in response to receiving a selected number of candidate overcurrent events from the overcurrent detectors. At least one of the overcurrent detectors may be subject to detecting the candidate overcurrent in error, at least in part, due to exposure to ionizing radiation.

Abstract: A method for testing a power converter having at least one power transistor is disclosed. The method may include receiving a power transistor test request, and resetting a fault flag. The method may also include applying a gate driver signal to each power transistor, receiving a feedback signal from each power transistor, and determining a difference between the gate driver signal and the feedback signal associated with a respective power transistor. The method may further include identifying a fault if the difference exceeds a threshold profile, and setting a fault flag when a fault is identified.

Abstract: An SCR module tester facilitates rapid testing of SCR modules by a series of tests that are tailored to detect faults without applying full power to the modules. The SCR tester includes a quick clamp connector that is able to securely and easily clamp SCR modules for both the F/A-18 A/D GCU and F/A-18-E/F GCU facilitating the rapid testing of SCR modules.

Abstract: Method for nondestructive and noncontact detection of faults in a test piece, with a transmitter coil arrangement with at least one transmitter coil that transmits periodic electromagnetical AC fields to a test piece, a receiver coil arrangement with at least one receiver coil for detecting a periodic electrical signal having a carrier oscillation whose amplitude and/or phase is modulated by a fault in the test piece. A signal processing unit produces a useful signal from the receiver coil signal, and an evaluation unit evaluates the useful signal to detect a fault in the test piece. A self-test unit undertakes systematic quantitative checking of signal processing functions of the signal processing unit and/or of the transmitter coil arrangement and/or of the receiver coil arrangement and/or upon external request undertakes calibration of the signal processing unit using a calibration standard which replaces the transmitter coil arrangement and/or of the receiver coil arrangement.

Abstract: A test apparatus and corresponding method for simulating an internal cell short and initiating thermal runaway in a battery cell is disclosed whereby the cell is internally heated through rapid charge and discharge cycles at high currents. The magnitude of the selected current may be modulated to simulate a cell short with the desired power profile without unrealistically heating neighboring cells or interfering with the thermal environment of the cell within the module.

Abstract: An electrical test device including at least one transducer to detect a status of a circuit under test, and at least one indicator located remotely from the at least one transducer to display the status of the circuit under test.

Abstract: An electronic trip device is described that includes a test signal generator coupled to at least one of a line conductor and a neutral conductor and configured to create a test signal. The electronic trip device also includes a leakage current detection circuit configured to compare a current in the line conductor and a current in the neutral conductor, the leakage current detection circuit configured to output an error signal if the test signal is not detected.

Abstract: A system for performing efficient continuous grading flow for test coverage analysis. The system provides for continuous test coverage grading. The continuous grading flow analyzes individual tests upon completion without requiring an entire set of tests to finish. As a result, the grading process at the end of the regression run is no longer necessary, disk space and memory requirements are dramatically reduced, and partial results are produced as the grading of individual tests complete, allowing engineers to track progress and make real-time decisions based on the intermediate results. The resource requirements of our continuous flow scale linearly with the number of tests rather than exponentially as with traditional approaches.

Abstract: A sensor arrangement and method that may be used with a variety of different energy storage devices, including battery packs found in hybrid vehicles, battery electric vehicles, and other types of vehicles. An exemplary sensor arrangement includes a number of sensor units, a controller, and several connections, wherein two or more sensor units are coupled to each node of the battery pack and are coupled to the controller over different connections. An exemplary method is divided into two aspects: an error detection aspect and an error resolution aspect. Because the sensor arrangement provides multiple sensor readings for each node being evaluated, the method can enable the sensor arrangement to continue operating accurately and with redundancy even if it experiences a loss of one or more sensor units.

Abstract: Embodiments relate to fault detection comparator circuitry and methods that can operate in conjunction with a power-on-reset (POR) scheme to put a chip into a reliable power-down mode upon fault detection to avoid disrupting the communication bus link such that other connected chips and the host can continue to operate. Power-on of the affected chip can then be carried out when the connection with that chip is restored.

Abstract: A motor control circuit 1 for controlling driving of a plurality of motors is provided with a plurality of motor driver circuits 7 and 8 for controlling driving of the plurality of motors 3 and 4, a plurality of excess current detection circuits 39 and 40 each for detecting an excess current flowing through corresponding one of the plurality of motors 3 and 4 to determine which motor driver circuit among the plurality of motor driver circuits 7 and 7 caused the excess current. The motor control circuit further includes a nonvolatile memory 46 configured to receive detection results from the plurality of excess current detection circuits 39 and 40 and store information on which motor driver circuit among the plurality of motor driver circuits 7 and 8 caused the excess current.

Abstract: A circuit for alarming abnormal state of a computer fan includes a detection circuit coupled to the computer fan, a controller coupled to the detection circuit and the computer fan, an alarm unit coupled to the controller. The detection circuit detects a power source and a speed control signal received by the computer fan, the controller determines the work state of the computer fan according to the power source, the speed control signal, and a speed signal received from the computer fan and raises an alarm through the alarm unit if the computer fan is not working normally.

Abstract: An inspecting method using an electro-optical detecting device is disclosed. The electro-optical detecting device includes: an upper substrate and a lower substrate; a nematic liquid crystal layer interposed between the upper substrate and the lower substrate; a transparent electrode interposed between the nematic liquid crystal layer and the upper substrate, the transparent electrode connected to a device under test (DUT) via a power supply; a polarizing plate located over the nematic liquid crystal layer; and a reflecting plate located under the nematic liquid crystal layer.

Abstract: A discharge amount measuring device includes a power source, first and second sensors, a calibration wire, and a measuring portion. The power source applies a voltage to a coil of a rotational electric machine. The first sensor detects a current flowing through the coil. The calibration wire has an end connected to the coil. The second sensor detects a current flowing through the calibration wire. The measuring portion forms a calibration line based on a first waveform detected by the first sensor and a second waveform detected by the second sensor. The measuring portion calculates a discharge amount based on the calibration line.

Abstract: In a method for testing functionality of a field device or a field device for sending a control signal to a final controlling device of an industrial processing plant, the final controlling device is operated by a secondary power. With the method, a current/secondary power converter is provided for generating a predetermined secondary power safety control signal to bring the final controlling device into a predetermined safe position. An electronic safety circuit is provided connected to the current/secondary power converter which, depending on an electrical control signal received by the field device, is switched from a passive state into an active state in which the electronic safety circuit causes the current/secondary power converter to output the secondary output power safety control signal. The safety circuit automatically adopts the active state if the electrical control signal falls below or exceeds at least one of a current and a voltage threshold value specific to the safety circuit.

Abstract: A torque limit section that applies limit to a torque instruction value of an electric motor such that a switching elements temperature is restricted to no more than an element upper limiting temperature includes a torque restriction section that finds a torque restriction value for restricting the torque of the electric motor in accordance with the said switching elements temperature; a torque restriction mitigation section that finds a torque restriction mitigation value for mitigating the torque limit value in accordance with the integrated value of the deviation of the element upper limiting temperature and the switching elements temperature; a first subtractor that finds a torque restriction value by subtracting the torque restriction mitigation value from the torque limit value; and a second subtractor that finds a limited torque instruction value obtained by subtracting the torque limit value from the torque instruction value and outputs this to the gate generating section.

Abstract: In an abnormality diagnosing system for first and second current sensors for measuring a current, an obtaining unit obtains at least one pair of measured values of the first and second current sensors. The at least one pair of measured values is measured by the first and second current sensors at a substantially same timing. A diagnosing unit diagnoses whether there is an abnormality in at least one of the first and second current sensors based on a function defining a relationship between the at least one pair of measured values of the first and second current sensors.

Abstract: An apparatus and method for protecting against electrocution hazards that arise when an appliance is electrically connected to a miswired single-phase AC electrical source which includes an energized ground lead are described. The apparatus includes one or more sensors that detect electrical energy in the ground lead combined with a miswiring condition in the hot and common leads. A tester embodiment is also illustrated. The method includes the steps of detecting if the putative ground of the electrical source is energized and whether the hot and common leads are reversed.

Abstract: In a device having capacitive loads in which a plurality of capacitive loads are connected in parallel, power is supplied from an AC power source to a load group comprising the plurality of capacitive loads, the load group is divided into a plurality of small load groups, and a current detecting sensor for detecting a current which flows in at least one small load group at a side which is closer to the load side than a branch point at which the load group is divided into the plurality of small load groups and a current abnormality detecting part for determining an abnormality of a load by a current detecting signal which is detected by the current detecting sensor are equipped.

Abstract: A curved spring structure includes a base (anchor) section extending parallel to a planar substrate surface, a cantilever section extending away from the substrate surface, and an optional elongated section extending from the base section along the substrate surface under the cantilevered section. The cantilever section includes a body portion integrally attached at a lower end to the anchor section and extending at an acute angle relative to the planar surface, and a curved portion integrally attached to an upper end of the body portion and including a downturned tip. A middle section of the curved portion is disposed a first distance away from the planar surface of the substrate, and the downturned tip is disposed a second distance away from the planar surface of the substrate, the first distance being greater than the second distance.

Abstract: Certain embodiments of the invention may include systems, methods for providing determining electrical faults. According to an example embodiment of the invention, a method is provide for determining electrical faults. One method can include providing switch circuitry including at least one first switch detector resistor in parallel communication with at least one switch; providing terminal board circuitry including at least one terminal board resistor in parallel communication with the switch circuitry and in communication with a power source; receiving a power source reference; comparing a field voltage value to a generated reference voltage value, generating a comparison value output based at least in part on the comparison of the field voltage value and the generated reference voltage; and determining one of a plurality of field conditions based at least in part on the comparison value output.

Abstract: A system separating defective dies from a wafer comprises a film frame platform and a pick-and-place device. The film frame platform comprises a support table assembly configured for supporting a film frame assembly and a platform surface configured to receive the placement of bins thereupon. The pick-and-place device is configured for moving in a linear manner between the support table assembly and the platform surface.

Abstract: Provided is a system, a tool and a method for communicating with a faulted circuit indicator (FCI), the faulted circuit indicator including a detection circuit for monitoring an electrical conductor of a power system. The system includes a display and a first light emitting diode associated with the display. The first light emitting diode generates an optical FCI status signal in response to an occurrence of a fault in the electrical conductor. The system also includes a first microcontroller operatively coupled to the display and the detection circuit, and a handheld user command tool adapted to optically signal the display. The handheld user command tool may be also adapted to generate an optical serial communication. The optical serial communication may provide data and/or commands for operation of the faulted circuit indicator. The display may be integrated into the FCI. The FCI may be an overhead FCI.

Abstract: The ultra-high frequency partial discharge array sensor apparatus for a high-voltage power apparatus includes: a sensing unit which detects an electromagnetic wave partial discharge signal generated due to an internal defect of a high-voltage power apparatus and includes a plurality of sensors installed to detect information related to the position where the defect occurs; an anti-surge filter unit which prevents a surge input from the sensing unit; a signal delay time adjusting unit which equally adjusts delay times of signals input from the anti-surge filter unit; a signal switching unit which selectively transmits or blocks signals input from the signal delay time adjusting unit; a connector unit which connects a signal transmitted from the signal switching unit to the outside; and a sensor body which has a receiving space.

Abstract: Test system and method for analog-to-digital converter (ADC) based on a loopback architecture are provided to test an M-bit ADC. In the invention, an N-bit digital-to-analog converter (DAC) converts a digital input to a basic test signal, a segmentation circuit scales the basic test signal and superposes it with segmentation DC levels for providing corresponding segmented test signals, such that the ADC converts the segmented test signals to reflect result of testing. With the invention, practical loopback architecture of low-cost can be adopted for testing.